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Patent Assignment Details
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Reel/Frame:009678/0010   Pages: 10
Recorded: 01/04/1999
Conveyance: SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 26
1
Patent #:
Issue Dt:
07/07/1981
Application #:
06117046
Filing Dt:
01/31/1980
Title:
MULTIFACETED MIRROR AND ASSEMBLY FIXTURE AND METHOD OF MAKING SUCH MIRROR
2
Patent #:
Issue Dt:
04/20/1982
Application #:
06155203
Filing Dt:
06/02/1980
Title:
PHASE MODULATION OF GRAZING INCIDENCE INTERFEROMETER
3
Patent #:
Issue Dt:
03/13/1984
Application #:
06287269
Filing Dt:
07/27/1981
Title:
INTERFEROMETER USING TRANSVERSE DEVIATION OF TEST BEAM
4
Patent #:
Issue Dt:
09/11/1984
Application #:
06384154
Filing Dt:
06/01/1982
Title:
KINEMATIC DEVICE FOR DRAWERS, TRAYS AND OTHER PARTS THAT CAN BE EXTRACTED FROM CABINETS AND OTHER FURNITURE
5
Patent #:
Issue Dt:
10/13/1992
Application #:
07632108
Filing Dt:
12/20/1990
Title:
LARGE APERTURE REFLECTIVE INTERFEROMETER FOR MEASURING CONVEX SPHERICAL SURFACES
6
Patent #:
Issue Dt:
06/15/1993
Application #:
07880080
Filing Dt:
05/05/1992
Title:
X-RAY PROJECTION LITHOGRAPHY CAMERA
7
Patent #:
Issue Dt:
01/25/1994
Application #:
07940537
Filing Dt:
09/04/1992
Title:
PHOTOLITHOGRAPHIC REDUCTION IMAGING OF EXTENDED FIELD
8
Patent #:
Issue Dt:
09/20/1994
Application #:
08036454
Filing Dt:
03/24/1993
Title:
METHOD OF MEASURING ARTIFACT TAPER
9
Patent #:
Issue Dt:
10/04/1994
Application #:
08065116
Filing Dt:
05/20/1993
Title:
LENS SYSTEM FOR X-RAY PROJECTION LITHOGRAPHY CAMERA
10
Patent #:
Issue Dt:
06/27/1995
Application #:
08079976
Filing Dt:
06/18/1993
Title:
DECOUPLED MOUNT FOR OPTICAL ELEMENT AND STACKED ANNULI ASSEMBLY
11
Patent #:
Issue Dt:
05/16/1995
Application #:
08138243
Filing Dt:
10/15/1993
Title:
METHOD OF TESTING ASPHERICAL OPTICAL SURFACES WITH AN INTERFEROMETER
12
Patent #:
Issue Dt:
09/19/1995
Application #:
08342787
Filing Dt:
11/21/1994
Title:
VARIABLE ANNULAR ILLUMINATOR FOR PHOTOLITHOGRAPHIC PROJECTION IMAGER
13
Patent #:
Issue Dt:
07/02/1996
Application #:
08404923
Filing Dt:
03/16/1995
Title:
TESTING OF RECESSED SURFACES AT GRAZING INCIDENCE
14
Patent #:
Issue Dt:
08/05/1997
Application #:
08483737
Filing Dt:
06/07/1995
Title:
INTERFEROMETRIC MEASUREMENT OF SURFACES WITH DIFFRACTIVE OPTICS AT GRAZING INCIDENCE
15
Patent #:
Issue Dt:
07/22/1997
Application #:
08514614
Filing Dt:
08/14/1995
Title:
IMAGING SYSTEM FOR DEEP ULTRAVIOLET LITHOGRAPHY
16
Patent #:
Issue Dt:
02/17/1998
Application #:
08631071
Filing Dt:
04/12/1996
Title:
DIFFRACTION MANAGEMENT FOR GRAZING INCIDENCE INTERFEROMETER
17
Patent #:
Issue Dt:
11/04/1997
Application #:
08634218
Filing Dt:
04/18/1996
Title:
OBJECT FIXTURING IN INTERFEROMETER
18
Patent #:
Issue Dt:
03/03/1998
Application #:
08671488
Filing Dt:
06/27/1996
Title:
FRINGE PATTERN DISCRIMINATOR FOR INTERFEROMETER USING DIFFRACTION GRATINGS
19
Patent #:
Issue Dt:
03/03/1998
Application #:
08687435
Filing Dt:
08/12/1996
Title:
ANTIPARASITIC AGENTS
20
Patent #:
Issue Dt:
03/30/1999
Application #:
08733705
Filing Dt:
10/17/1996
Title:
INTERFEROMETRIC MEASUREMENT OF TORIC SURFACES AT GRAZING INCIDENCE
21
Patent #:
Issue Dt:
05/26/1998
Application #:
08734402
Filing Dt:
10/16/1996
Title:
INTERFEROMETER WITH CATADIOPTRIC IMAGING SYSTEM HAVING EXPANDED RANGE OF NUMERICAL APERTURE
22
Patent #:
Issue Dt:
07/07/1998
Application #:
08818913
Filing Dt:
03/17/1997
Title:
INTERFEROMETRIC MEASUREMENT OF ABSOLUTE DIMENSIONS OF CYLINDRICAL SURFACES AT GRAZING INCIDENCE
23
Patent #:
Issue Dt:
06/01/1999
Application #:
08866540
Filing Dt:
05/30/1997
Title:
INTERFEROMETER FOR MEASURING THICKNESS VARIATIONS OF SEMICONDUCTOR WAFERS
24
Patent #:
Issue Dt:
06/01/1999
Application #:
08885419
Filing Dt:
06/30/1997
Title:
INTERFEROMETRIC MEASUREMENT OF SURFACES WITH DIFFRACTIVE OPTICS AND PLANAR WAVEFRONT IMAGING
25
Patent #:
Issue Dt:
11/09/1999
Application #:
08941120
Filing Dt:
09/30/1997
Title:
RASTER-SCAN PHOTOLITHOGRAPHIC REDUCTION SYSTEM
26
Patent #:
Issue Dt:
07/13/1999
Application #:
08975145
Filing Dt:
11/20/1997
Title:
GRAZING INCIDENCE INTERFEROMETRY FOR MEASURING TRANSPARENT PLANE PARALLEL PLATES
Assignor
1
Exec Dt:
12/29/1998
Assignee
1
153 EAST 53RD STREET, 56TH FLOOR
NEW YORK, NEW YORK 10043
Correspondence name and address
PHILLIPS, LYTLE, HITCHCOCK, ET AL
THOMAS R. BURNS, ESQUIRE
1400 FIRST FEDERAL PLAZA
ROCHESTER, NY 14614

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