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Reel/Frame:017537/0032   Pages: 16
Recorded: 04/27/2006
Conveyance: CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE NAME CORRECTION: MOLECULAR IMAGINING CORP., A WHOLLEY OWNED SUBSIDIARY OF AGILENT TECHNOLOGIES, INC. PREVIOUSLY RECORDED ON REEL 017527 FRAME 0255. ASSIGNOR(S) HEREBY CONFIRMS THE ORIGINAL ASSIGNEE NAME LISTED AS AGILENT TECHNOLOGIES, INC..
Total properties: 32
1
Patent #:
Issue Dt:
09/19/1989
Application #:
07108156
Filing Dt:
10/13/1987
Title:
CELL AND SUBSTRATE FOR ELECTROCHEMICAL STM STUDIES
2
Patent #:
Issue Dt:
10/13/1992
Application #:
07736095
Filing Dt:
07/26/1991
Title:
POTENTIOSTATIC PREPARATION OF MOLECULAR ADSORBATES FOR SCANNING PROBE MICROSCOPY
3
Patent #:
Issue Dt:
08/15/1995
Application #:
08190948
Filing Dt:
02/03/1994
Title:
NOVEL STATIONARY-SAMPLE STAGE ATOMIC FORCE MICROSCOPE WITH BEAM-TRACKING LENS AND S-SHAPED SCANNER
4
Patent #:
Issue Dt:
05/14/1996
Application #:
08246035
Filing Dt:
05/19/1994
Title:
CONTROLLED FORCE MICROSCOPE FOR OPERATION IN LIQUIDS
5
Patent #:
Issue Dt:
08/27/1996
Application #:
08321649
Filing Dt:
10/11/1994
Title:
POTENTIOSTATIC PREPARATION OF MOLECULAR ADSORBATES FOR SCANNING PROBE MICROSCOPY
6
Patent #:
Issue Dt:
05/12/1998
Application #:
08388068
Filing Dt:
02/10/1995
Title:
SCANNING PROBE MICROSCOPE FOR USE IN FLUIDS
7
Patent #:
Issue Dt:
02/27/1996
Application #:
08399968
Filing Dt:
03/07/1995
Title:
ELECTROCHEMICAL IDENTIFICATION OF MOLECULES IN A SCANNING PROBE MIROSCOPE
8
Patent #:
Issue Dt:
03/19/1996
Application #:
08399969
Filing Dt:
03/07/1995
Title:
STRESS CELL FOR A SCANNING PROBE MICROSCOPE
9
Patent #:
Issue Dt:
05/07/1996
Application #:
08403238
Filing Dt:
03/10/1995
Title:
MAGNETIC MODULATION OF FORCE SENSOR FOR AC DETECTION IN AN ATOMIC FORCE MICROSCOPE
10
Patent #:
Issue Dt:
12/24/1996
Application #:
08427353
Filing Dt:
02/15/1995
Title:
ATOMIC FORCE MICROSCOPE EMPLOYING BEAM TRACKING
11
Patent #:
Issue Dt:
04/15/1997
Application #:
08485497
Filing Dt:
06/07/1995
Title:
MICROSCOPE FOR FORCE AND TUNNELING MICROSCOPY IN LIQUIDS
12
Patent #:
Issue Dt:
05/20/1997
Application #:
08524054
Filing Dt:
09/06/1995
Title:
TIP ETCHING SYSTEM AND METHOD FOR ETCHING PLATINUM-CONTAINING WIRE
13
Patent #:
Issue Dt:
08/05/1997
Application #:
08551836
Filing Dt:
11/07/1995
Title:
VARIABLE TEMPERATURE SCANNING PROBE MICROSCOPE BASED ON A PELTIER DEVICE
14
Patent #:
Issue Dt:
03/18/1997
Application #:
08553111
Filing Dt:
11/07/1995
Title:
FORMATION OF A MAGNETIC FILM ON AN ATOMIC FORCE MICROSCOPE CANTILEVER
15
Patent #:
Issue Dt:
10/07/1997
Application #:
08653200
Filing Dt:
05/24/1996
Title:
SCANNING PROBE MICROSCOPE
16
Patent #:
Issue Dt:
02/02/1999
Application #:
08710191
Filing Dt:
09/12/1996
Title:
CANTILEVERS FOR A MAGNETICALLY DRIVEN ATOMIC FORCE MICROSCOPE
17
Patent #:
Issue Dt:
06/09/1998
Application #:
08717767
Filing Dt:
09/23/1996
Title:
ATOMIC FORCE MICROSCOPE EMPLOYING BEAM-TRACKING
18
Patent #:
Issue Dt:
05/19/1998
Application #:
08722344
Filing Dt:
09/27/1996
Title:
MAGNETICALLY-OSCILLATED PROBE MICROSCOPE FOR OPERATION IN LIQUIDS
19
Patent #:
Issue Dt:
10/13/1998
Application #:
08729395
Filing Dt:
10/11/1996
Title:
HEATED STAGE FOR ASCANNING PROBE MICROSCOPE
20
Patent #:
Issue Dt:
01/25/2000
Application #:
08760757
Filing Dt:
12/05/1996
Title:
TIPS AND SUBSTRATES FOR SCANNING PROBE MICROSCOPY
21
Patent #:
Issue Dt:
09/08/1998
Application #:
08805030
Filing Dt:
02/21/1997
Title:
HYBRID CONTROL SYSTEM FOR SCANNING PROBE MICROSCOPES
22
Patent #:
Issue Dt:
06/02/1998
Application #:
08874440
Filing Dt:
06/16/1997
Title:
SCANNING PROBE MICROSCOPE
23
Patent #:
Issue Dt:
11/16/1999
Application #:
08905815
Filing Dt:
08/04/1997
Title:
MICROSCOPE FOR COMPLIANCE MEASUREMENT
24
Patent #:
Issue Dt:
09/19/2000
Application #:
09082095
Filing Dt:
05/20/1998
Title:
FORCE SENSING PROBE FOR SCANNING PROBE MICROSCOPY
25
Patent #:
Issue Dt:
04/18/2000
Application #:
09100049
Filing Dt:
06/19/1998
Title:
CONDUCTING SCANNING PROBE MICROSCOPE WITH ENVIRONMENTAL CONTROL
26
Patent #:
Issue Dt:
10/24/2000
Application #:
09228226
Filing Dt:
01/11/1999
Title:
MAGNETIC MODULATION OF FORCE SENSOR FOR AC DETECTION IN AN ATOMIC FORCE MICROSCOPE
27
Patent #:
Issue Dt:
06/12/2001
Application #:
09273634
Filing Dt:
03/23/1999
Title:
VIBRATING TIP CONDUCTING PROBE MICROSCOPE
28
Patent #:
Issue Dt:
05/11/2004
Application #:
09882465
Filing Dt:
06/14/2001
Title:
SCANNING PROBE MICROSCOPE AND SOLENOID DRIVEN CANTILEVER ASSEMBLY
29
Patent #:
Issue Dt:
06/15/2004
Application #:
10205778
Filing Dt:
07/26/2002
Title:
PENDULUM SCANNER FOR SCANNING PROBE MICROSCOPE
30
Patent #:
Issue Dt:
10/11/2005
Application #:
10697841
Filing Dt:
10/30/2003
Publication #:
Pub Dt:
07/08/2004
Title:
TOPOGRAPHY AND RECOGNITION IMAGING ATOMIC FORCE MICROSCOPE AND METHOD OF OPERATION
31
Patent #:
Issue Dt:
03/30/2010
Application #:
10725769
Filing Dt:
12/02/2003
Publication #:
Pub Dt:
07/08/2004
Title:
FAST SCANNING STAGE FOR A SCANNING PROBE MICROSCOPE
32
Patent #:
Issue Dt:
12/26/2006
Application #:
11152827
Filing Dt:
06/14/2005
Publication #:
Pub Dt:
01/26/2006
Title:
TOPOGRAPHY AND RECOGNITION IMAGING ATOMIC FORCE MICROSCOPE AND METHOD OF OPERATION
Assignor
1
Exec Dt:
01/04/2006
Assignee
1
815 S. W. 14TH STREET
INTELLECTUAL PROPERTY ADMINISTRATION, DM286 POST J5
LOVELAND, COLORADO 80537-0599
Correspondence name and address
AGILENT TECHNOLOGIES, INC.
815 SW 14TH STREET
ATTN: SUE HEBERT DM 525
LOVELAND, CO 80537

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