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Patent Assignment Details

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Reel/Frame:	017527/0255			Pages:	14
		Recorded:	04/26/2006
Conveyance:	CORRECTIVE ASSIGNMENT TO CORRECT THE THE STATE IN THE ADDRESS OF THE NEW ASSIGNEE SHOULD BE COLORADO PREVIOUSLY RECORDED ON REEL 017519 FRAME 0904. ASSIGNOR(S) HEREBY CONFIRMS THE ON THE ORIGINAL THE STATE IN THE ADDRESS WAS LISTED AS OHIO.

Total properties: 32

Patent #:	4868396	Issue Dt:	09/19/1989	Application #:	07108156	Filing Dt:	10/13/1987
Title:	CELL AND SUBSTRATE FOR ELECTROCHEMICAL STM STUDIES

Patent #:	5155361	Issue Dt:	10/13/1992	Application #:	07736095	Filing Dt:	07/26/1991
Title:	POTENTIOSTATIC PREPARATION OF MOLECULAR ADSORBATES FOR SCANNING PROBE MICROSCOPY

Patent #:	5440920	Issue Dt:	08/15/1995	Application #:	08190948	Filing Dt:	02/03/1994
Title:	NOVEL STATIONARY-SAMPLE STAGE ATOMIC FORCE MICROSCOPE WITH BEAM-TRACKING LENS AND S-SHAPED SCANNER

Patent #:	5515719	Issue Dt:	05/14/1996	Application #:	08246035	Filing Dt:	05/19/1994
Title:	CONTROLLED FORCE MICROSCOPE FOR OPERATION IN LIQUIDS

Patent #:	RE35317	Issue Dt:	08/27/1996	Application #:	08321649	Filing Dt:	10/11/1994
Title:	POTENTIOSTATIC PREPARATION OF MOLECULAR ADSORBATES FOR SCANNING PROBE MICROSCOPY

Patent #:	5750989	Issue Dt:	05/12/1998	Application #:	08388068	Filing Dt:	02/10/1995
Title:	SCANNING PROBE MICROSCOPE FOR USE IN FLUIDS

Patent #:	5495109	Issue Dt:	02/27/1996	Application #:	08399968	Filing Dt:	03/07/1995
Title:	ELECTROCHEMICAL IDENTIFICATION OF MOLECULES IN A SCANNING PROBE MIROSCOPE

Patent #:	5500535	Issue Dt:	03/19/1996	Application #:	08399969	Filing Dt:	03/07/1995
Title:	STRESS CELL FOR A SCANNING PROBE MICROSCOPE

Patent #:	5513518	Issue Dt:	05/07/1996	Application #:	08403238	Filing Dt:	03/10/1995
Title:	MAGNETIC MODULATION OF FORCE SENSOR FOR AC DETECTION IN AN ATOMIC FORCE MICROSCOPE

Patent #:	5587523	Issue Dt:	12/24/1996	Application #:	08427353	Filing Dt:	02/15/1995
Title:	ATOMIC FORCE MICROSCOPE EMPLOYING BEAM TRACKING

Patent #:	5621210	Issue Dt:	04/15/1997	Application #:	08485497	Filing Dt:	06/07/1995
Title:	MICROSCOPE FOR FORCE AND TUNNELING MICROSCOPY IN LIQUIDS

Patent #:	5630932	Issue Dt:	05/20/1997	Application #:	08524054	Filing Dt:	09/06/1995
Title:	TIP ETCHING SYSTEM AND METHOD FOR ETCHING PLATINUM-CONTAINING WIRE

Patent #:	5654546	Issue Dt:	08/05/1997	Application #:	08551836	Filing Dt:	11/07/1995
Title:	VARIABLE TEMPERATURE SCANNING PROBE MICROSCOPE BASED ON A PELTIER DEVICE

Patent #:	5612491	Issue Dt:	03/18/1997	Application #:	08553111	Filing Dt:	11/07/1995
Title:	FORMATION OF A MAGNETIC FILM ON AN ATOMIC FORCE MICROSCOPE CANTILEVER

Patent #:	5675154	Issue Dt:	10/07/1997	Application #:	08653200	Filing Dt:	05/24/1996
Title:	SCANNING PROBE MICROSCOPE

Patent #:	5866805	Issue Dt:	02/02/1999	Application #:	08710191	Filing Dt:	09/12/1996
Title:	CANTILEVERS FOR A MAGNETICALLY DRIVEN ATOMIC FORCE MICROSCOPE

Patent #:	5763767	Issue Dt:	06/09/1998	Application #:	08717767	Filing Dt:	09/23/1996
Title:	ATOMIC FORCE MICROSCOPE EMPLOYING BEAM-TRACKING

Patent #:	5753814	Issue Dt:	05/19/1998	Application #:	08722344	Filing Dt:	09/27/1996
Title:	MAGNETICALLY-OSCILLATED PROBE MICROSCOPE FOR OPERATION IN LIQUIDS

Patent #:	5821545	Issue Dt:	10/13/1998	Application #:	08729395	Filing Dt:	10/11/1996
Title:	HEATED STAGE FOR ASCANNING PROBE MICROSCOPE

Patent #:	6017590	Issue Dt:	01/25/2000	Application #:	08760757	Filing Dt:	12/05/1996
Title:	TIPS AND SUBSTRATES FOR SCANNING PROBE MICROSCOPY

Patent #:	5805448	Issue Dt:	09/08/1998	Application #:	08805030	Filing Dt:	02/21/1997
Title:	HYBRID CONTROL SYSTEM FOR SCANNING PROBE MICROSCOPES

Patent #:	5760396	Issue Dt:	06/02/1998	Application #:	08874440	Filing Dt:	06/16/1997
Title:	SCANNING PROBE MICROSCOPE

Patent #:	5983712	Issue Dt:	11/16/1999	Application #:	08905815	Filing Dt:	08/04/1997
Title:	MICROSCOPE FOR COMPLIANCE MEASUREMENT

Patent #:	6121611	Issue Dt:	09/19/2000	Application #:	09082095	Filing Dt:	05/20/1998
Title:	FORCE SENSING PROBE FOR SCANNING PROBE MICROSCOPY

Patent #:	6051825	Issue Dt:	04/18/2000	Application #:	09100049	Filing Dt:	06/19/1998
Title:	CONDUCTING SCANNING PROBE MICROSCOPE WITH ENVIRONMENTAL CONTROL

Patent #:	6134955	Issue Dt:	10/24/2000	Application #:	09228226	Filing Dt:	01/11/1999
Title:	MAGNETIC MODULATION OF FORCE SENSOR FOR AC DETECTION IN AN ATOMIC FORCE MICROSCOPE

Patent #:	6245204	Issue Dt:	06/12/2001	Application #:	09273634	Filing Dt:	03/23/1999
Title:	VIBRATING TIP CONDUCTING PROBE MICROSCOPE

Patent #:	6734438	Issue Dt:	05/11/2004	Application #:	09882465	Filing Dt:	06/14/2001
Title:	SCANNING PROBE MICROSCOPE AND SOLENOID DRIVEN CANTILEVER ASSEMBLY

Patent #:	6748795	Issue Dt:	06/15/2004	Application #:	10205778	Filing Dt:	07/26/2002
Title:	PENDULUM SCANNER FOR SCANNING PROBE MICROSCOPE

Patent #:	6952952	Issue Dt:	10/11/2005	Application #:	10697841	Filing Dt:	10/30/2003
Publication #:	US20040129064	Pub Dt:	07/08/2004
Title:	TOPOGRAPHY AND RECOGNITION IMAGING ATOMIC FORCE MICROSCOPE AND METHOD OF OPERATION

Patent #:	7687767	Issue Dt:	03/30/2010	Application #:	10725769	Filing Dt:	12/02/2003
Publication #:	US20040129873	Pub Dt:	07/08/2004
Title:	FAST SCANNING STAGE FOR A SCANNING PROBE MICROSCOPE

Patent #:	7152462	Issue Dt:	12/26/2006	Application #:	11152827	Filing Dt:	06/14/2005
Publication #:	US20060016251	Pub Dt:	01/26/2006
Title:	TOPOGRAPHY AND RECOGNITION IMAGING ATOMIC FORCE MICROSCOPE AND METHOD OF OPERATION

Assignor

MOLECULAR IMAGING CORP, A WHOLLY OWNED SUBSIDIARY OF AGILENT TECHNOLOGIES, INC.

Exec Dt:

04/25/2006

Assignee

AGILENT TECHNOLOGIES, INC.

815 SW 14TH STREET

ATTN: SUE HEBERT DM 525

LOVELAND, COLORADO 80537

Correspondence name and address
	AGILENT TECHNOLOGIES, INC.
	815 SW 14TH STREET
	ATTN: SUE HEBERT DM 525
	LOVELAND, CO 80537

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