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679
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Patent #:
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Issue Dt:
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07/26/2005
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Application #:
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10310791
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Filing Dt:
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12/06/2002
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Publication #:
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Pub Dt:
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06/10/2004
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Title:
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METHOD FOR MAKING A SOCKET TO PERFORM TESTING ON INTEGRATED CIRCUITS AND SOCKET MADE
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Patent #:
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Issue Dt:
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11/30/2004
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Application #:
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10317486
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Filing Dt:
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12/11/2002
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Publication #:
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Pub Dt:
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01/08/2004
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Title:
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TEST ASSEMBLY INCLUDING A TEST DIE FOR TESTING A SEMICONDUCTOR PRODUCT DIE
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Patent #:
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Issue Dt:
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06/23/2009
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Application #:
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10317661
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Filing Dt:
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12/12/2002
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Publication #:
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Pub Dt:
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06/17/2004
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Title:
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INTEGRATED CIRCUIT ASSEMBLY
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Patent #:
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Issue Dt:
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03/01/2005
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Application #:
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10319287
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Filing Dt:
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12/13/2002
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Publication #:
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Pub Dt:
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06/17/2004
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Title:
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GUARDED TUB ENCLOSURE
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Patent #:
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Issue Dt:
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08/01/2006
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Application #:
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10321743
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Filing Dt:
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12/16/2002
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Publication #:
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Pub Dt:
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06/17/2004
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Title:
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APPARATUS AND METHOD FOR LIMITING OVER TRAVEL IN A PROBE CARD ASSEMBLY
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Patent #:
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Issue Dt:
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09/07/2004
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Application #:
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10326423
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Filing Dt:
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12/19/2002
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Publication #:
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Pub Dt:
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06/12/2003
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Title:
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WAFER-LEVEL BURN-IN AND TEST
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Patent #:
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Issue Dt:
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09/20/2005
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Application #:
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10328083
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Filing Dt:
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12/23/2002
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Publication #:
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Pub Dt:
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06/24/2004
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Title:
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MICROELECTRONIC CONTACT STRUCTURE
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Patent #:
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Issue Dt:
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04/10/2007
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Application #:
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10328113
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Filing Dt:
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12/20/2002
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Publication #:
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Pub Dt:
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07/08/2004
| | | | |
Title:
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COMPOSITE MOTION PROBING
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Patent #:
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Issue Dt:
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01/18/2005
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Application #:
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10354636
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Filing Dt:
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01/29/2003
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Publication #:
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Pub Dt:
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06/19/2003
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Title:
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METHOD OF DESIGNING , FABRICATING, TESTING AND INTERCONNECTING AN IC TO EXTERNAL CIRCUIT NODES
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Patent #:
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Issue Dt:
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08/31/2004
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Application #:
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10406669
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Filing Dt:
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04/02/2003
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Publication #:
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Pub Dt:
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09/11/2003
| | | | |
Title:
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CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
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Patent #:
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Issue Dt:
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02/28/2006
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Application #:
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10410948
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Filing Dt:
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04/10/2003
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Publication #:
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Pub Dt:
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10/14/2004
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Title:
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LAYERED MICROELECTRONIC CONTACT AND METHOD FOR FABRICATING SAME
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Patent #:
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Issue Dt:
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09/27/2005
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Application #:
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10411175
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Filing Dt:
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04/10/2003
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Publication #:
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Pub Dt:
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10/14/2004
| | | | |
Title:
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HELICAL MICROELECTRONIC CONTACT AND METHOD FOR FABRICATING SAME
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Patent #:
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Issue Dt:
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03/11/2008
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Application #:
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10411179
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Filing Dt:
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04/10/2003
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Publication #:
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Pub Dt:
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10/14/2004
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Title:
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METHOD OF PROBING A DEVICE USING CAPTURED IMAGE OF PROBE STRUCTURE IN WHICH PROBE TIPS COMPRISE ALIGNMENT FEATURES
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Patent #:
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Issue Dt:
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02/20/2007
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Application #:
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10418510
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Filing Dt:
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04/16/2003
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Publication #:
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Pub Dt:
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10/16/2003
| | | | |
Title:
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METHOD FOR CONSTRUCTING A MEMBRANE PROBE USING A DEPRESSION
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Patent #:
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Issue Dt:
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06/28/2005
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Application #:
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10430628
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Filing Dt:
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05/05/2003
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Publication #:
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Pub Dt:
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03/11/2004
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Title:
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HIGH PERFORMANCE PROBE SYSTEM
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Patent #:
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Issue Dt:
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02/05/2008
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Application #:
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10456343
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Filing Dt:
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06/06/2003
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Publication #:
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Pub Dt:
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12/09/2004
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Title:
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RHODIUM ELECTROPLATED STRUCTURES AND METHODS OF MAKING SAME
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Patent #:
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Issue Dt:
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01/04/2005
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Application #:
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10458875
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Filing Dt:
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06/10/2003
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Publication #:
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Pub Dt:
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12/04/2003
| | | | |
Title:
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PROBE CARD ASSEMBLY
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Patent #:
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Issue Dt:
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03/22/2005
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Application #:
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10607628
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Filing Dt:
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06/27/2003
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Publication #:
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Pub Dt:
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12/30/2004
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Title:
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INSULATIVE COVERING OF PROBE TIPS
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Patent #:
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Issue Dt:
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04/17/2007
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Application #:
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10609263
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Filing Dt:
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06/26/2003
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Publication #:
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Pub Dt:
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05/20/2004
| | | | |
Title:
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METHOD OF MAKING AN ELECTRONICS MODULE
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Patent #:
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Issue Dt:
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06/28/2005
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Application #:
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10612235
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Filing Dt:
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07/01/2003
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Publication #:
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Pub Dt:
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01/27/2005
| | | | |
Title:
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APPARATUS AND METHOD FOR ELECTROMECHANICAL TESTING AND VALIDATION OF PROBE CARDS
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Patent #:
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Issue Dt:
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10/31/2006
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Application #:
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10651821
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Filing Dt:
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08/29/2003
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Publication #:
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Pub Dt:
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02/26/2004
| | | | |
Title:
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METHODS OF FABRICATING AND USING SHAPED SPRINGS
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Patent #:
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Issue Dt:
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01/25/2005
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Application #:
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10666219
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Filing Dt:
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09/18/2003
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Title:
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PROBE STATION WITH LOW NOISE CHARACTERISTICS
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Patent #:
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Issue Dt:
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06/27/2006
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Application #:
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10667689
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Filing Dt:
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09/22/2003
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Publication #:
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Pub Dt:
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03/25/2004
| | | | |
Title:
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SEGMENTED CONTACTOR
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Patent #:
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Issue Dt:
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07/31/2007
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Application #:
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10672655
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Filing Dt:
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09/25/2003
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Publication #:
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Pub Dt:
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05/12/2005
| | | | |
Title:
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PROBE STATION WITH LOW INDUCTANCE PATH
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Patent #:
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Issue Dt:
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11/28/2006
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Application #:
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10673686
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Filing Dt:
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09/29/2003
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Publication #:
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Pub Dt:
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04/15/2004
| | | | |
Title:
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MOUNTING SPRING ELEMENTS ON SEMICONDUCTOR DEVICES, AND WAFER-LEVEL TESTING METHODOLOGY
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Patent #:
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Issue Dt:
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06/13/2006
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Application #:
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10673691
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Filing Dt:
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09/29/2003
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Publication #:
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Pub Dt:
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04/08/2004
| | | | |
Title:
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SOCKETS FOR "SPRINGED" SEMICONDUCTOR DEVICE
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Patent #:
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Issue Dt:
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05/16/2006
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Application #:
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10677178
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Filing Dt:
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10/02/2003
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Publication #:
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Pub Dt:
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04/15/2004
| | | | |
Title:
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TEST APPARATUS FOR TESTING SUBSTRATES AT LOW TEMPERATURES
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Patent #:
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Issue Dt:
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05/02/2006
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Application #:
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10677524
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Filing Dt:
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10/02/2003
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Publication #:
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Pub Dt:
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06/10/2004
| | | | |
Title:
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TEST APPARATUS WITH LOADING DEVICE
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Patent #:
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Issue Dt:
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07/05/2005
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Application #:
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10684094
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Filing Dt:
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10/10/2003
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Publication #:
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Pub Dt:
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04/15/2004
| | | | |
Title:
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METHODS OF REMOVABLY MOUNTING ELECTRONIC COMPONENTS TO A CIRCUIT BOARD, AND SOCKETS FORMED BY THE METHODS
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Patent #:
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Issue Dt:
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05/15/2007
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Application #:
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10690170
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Filing Dt:
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10/21/2003
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Publication #:
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Pub Dt:
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04/21/2005
| | | | |
Title:
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WIRELESS TEST SYSTEM
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Patent #:
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Issue Dt:
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11/28/2006
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Application #:
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10692114
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Filing Dt:
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10/23/2003
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Publication #:
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Pub Dt:
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08/26/2004
| | | | |
Title:
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CONTACT CARRIERS (TILES) FOR POPULATING LARGER SUBSTRATES WITH SPRING CONTACTS
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10692174
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Filing Dt:
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10/23/2003
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Publication #:
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Pub Dt:
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04/15/2004
| | | | |
Title:
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Microelectronic contact structures, and methods of making same
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Patent #:
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Issue Dt:
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12/26/2006
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Application #:
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10693133
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Filing Dt:
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10/23/2003
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Publication #:
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Pub Dt:
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04/28/2005
| | | | |
Title:
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ISOLATION BUFFERS WITH CONTROLLED EQUAL TIME DELAYS
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Patent #:
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Issue Dt:
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10/12/2010
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Application #:
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10693484
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Filing Dt:
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10/23/2003
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Publication #:
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Pub Dt:
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05/06/2004
| | | | |
Title:
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PROCESS AND APPARATUS FOR FINDING PATHS THROUGH A ROUTING SPACE
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Patent #:
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Issue Dt:
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07/27/2010
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Application #:
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10705014
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Filing Dt:
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11/10/2003
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Publication #:
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Pub Dt:
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05/20/2004
| | | | |
Title:
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MEMBRANE PROBING METHOD USING IMPROVED CONTACT
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Patent #:
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Issue Dt:
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05/23/2006
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Application #:
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10715683
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Filing Dt:
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11/17/2003
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Publication #:
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Pub Dt:
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05/27/2004
| | | | |
Title:
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INTERCONNECT FOR MICROELECTRONIC STRUCTURES WITH ENHANCED SPRING CHARACTERISTICS
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Patent #:
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Issue Dt:
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04/11/2006
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Application #:
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10723269
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Filing Dt:
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11/26/2003
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Publication #:
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Pub Dt:
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05/26/2005
| | | | |
Title:
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METHODS FOR MAKING PLATED THROUGH HOLES USABLE AS INTERCONNECTION WIRE OR PROBE ATTACHMENTS
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Patent #:
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Issue Dt:
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09/27/2005
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Application #:
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10725824
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Filing Dt:
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12/01/2003
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Publication #:
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Pub Dt:
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04/22/2004
| | | | |
Title:
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PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT UNDER TEST
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Patent #:
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Issue Dt:
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09/27/2005
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Application #:
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10735226
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Filing Dt:
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12/12/2003
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Publication #:
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Pub Dt:
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07/01/2004
| | | | |
Title:
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INTERCONNECT ASSEMBLIES AND METHODS
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Patent #:
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Issue Dt:
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04/10/2007
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Application #:
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10749028
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Filing Dt:
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12/30/2003
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Publication #:
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Pub Dt:
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08/05/2004
| | | | |
Title:
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SOCKET FOR MATING WITH ELECTRONIC COMPONENT, PARTICULARLY SEMICONDUCTOR DEVICE WITH SPRING PACKAGING, FOR FIXTURING, TESTING, BURNING-IN OR OPERATING SUCH A COMPONENT
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Patent #:
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Issue Dt:
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07/12/2005
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Application #:
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10749358
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Filing Dt:
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12/29/2003
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Publication #:
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Pub Dt:
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07/22/2004
| | | | |
Title:
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INTEGRATED CIRCUIT TESTER WITH HIGH BANDWIDTH PROBE ASSEMBLY
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Patent #:
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Issue Dt:
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11/23/2004
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Application #:
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10749546
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Filing Dt:
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12/29/2003
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Publication #:
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Pub Dt:
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07/22/2004
| | | | |
Title:
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INTEGRATED CIRCUIT INTERCONNECT SYSTEM
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Patent #:
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Issue Dt:
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05/13/2008
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Application #:
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10750355
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Filing Dt:
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12/29/2003
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Publication #:
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Pub Dt:
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07/22/2004
| | | | |
Title:
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SPRING INTERCONNECT STRUCTURES
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Patent #:
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Issue Dt:
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09/19/2006
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Application #:
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10750611
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Filing Dt:
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12/29/2003
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Publication #:
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Pub Dt:
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02/17/2005
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Title:
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SYSTEM FOR MEASURING SIGNAL PATH RESISTANCE FOR AN INTEGRATED CIRCUIT TESTER INTERCONNECT STRUCTURE
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Patent #:
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Issue Dt:
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05/30/2006
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Application #:
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10756477
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Filing Dt:
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01/12/2004
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Publication #:
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Pub Dt:
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07/29/2004
| | | | |
Title:
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METHOD FOR TESTING SIGNAL PATHS BETWEEN AN INTEGRATED CIRCUIT WAFER AND A WAFER TESTER
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Patent #:
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Issue Dt:
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07/04/2006
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Application #:
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10771099
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Filing Dt:
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02/02/2004
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Publication #:
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Pub Dt:
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07/21/2005
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Title:
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PROBE CARD CONFIGURATION FOR LOW MECHANICAL FLEXURAL STRENGTH ELECTRICAL ROUTING SUBSTRATES
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Patent #:
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Issue Dt:
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07/15/2008
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Application #:
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10772172
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Filing Dt:
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02/03/2004
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Publication #:
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Pub Dt:
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08/12/2004
| | | | |
Title:
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MEMBRANE PROBING SYSTEM
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Patent #:
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Issue Dt:
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12/16/2008
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Application #:
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10772970
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Filing Dt:
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02/05/2004
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Publication #:
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Pub Dt:
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08/11/2005
| | | | |
Title:
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CONTACTLESS INTERFACING OF TEST SIGNALS WITH A DEVICE UNDER TEST
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Patent #:
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Issue Dt:
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05/15/2007
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Application #:
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10781369
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Filing Dt:
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02/18/2004
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Publication #:
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Pub Dt:
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08/18/2005
| | | | |
Title:
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A METHOD AND APPARATUS FOR PROBING AN ELECTRONIC DEVICE IN WHICH MOVEMENT OF PROBES AND/OR THE ELECTRONIC DEVICE INCLUDES A LATERAL COMPONENT
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Patent #:
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Issue Dt:
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07/31/2007
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10794246
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03/05/2004
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Publication #:
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Pub Dt:
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04/28/2005
| | | | |
Title:
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PROBE TESTING STRUCTURE
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Patent #:
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Issue Dt:
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08/15/2006
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Application #:
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10810758
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Filing Dt:
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03/26/2004
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Publication #:
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Pub Dt:
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09/16/2004
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Title:
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AUTOMATED SYSTEM FOR DESIGNING AND TESTING A PROBE CARD
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Patent #:
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Issue Dt:
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06/17/2008
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10819748
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Filing Dt:
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04/07/2004
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Publication #:
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Pub Dt:
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10/13/2005
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Title:
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APPARATUS FOR PROVIDING A HIGH FREQUENCY LOOP BACK WITH A DC PATH FOR A PARAMETRIC TEST
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Patent #:
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Issue Dt:
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04/10/2007
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Application #:
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10820319
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Filing Dt:
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04/08/2004
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Publication #:
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Pub Dt:
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10/13/2005
| | | | |
Title:
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SYSTEMS AND METHODS FOR WIRELESS SEMICONDUCTOR DEVICE TESTING
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Patent #:
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Issue Dt:
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08/25/2009
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Application #:
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10821715
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Filing Dt:
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04/08/2004
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Publication #:
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Pub Dt:
|
10/07/2004
| | | | |
Title:
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MICROELECTRONIC SPRING CONTACT ELEMENTS
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Patent #:
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Issue Dt:
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01/30/2007
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Application #:
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10823437
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Filing Dt:
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04/12/2004
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Publication #:
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Pub Dt:
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10/07/2004
| | | | |
Title:
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METHOD OF MANUFACTURING A PROBE CARD
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Patent #:
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Issue Dt:
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07/03/2007
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Application #:
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10826715
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Filing Dt:
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04/16/2004
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Publication #:
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Pub Dt:
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10/20/2005
| | | | |
Title:
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METHOD AND APPARATUS FOR CALIBRATING COMMUNICATIONS CHANNELS
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Patent #:
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Issue Dt:
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12/11/2007
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Application #:
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10828755
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Filing Dt:
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04/21/2004
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Publication #:
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Pub Dt:
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10/27/2005
| | | | |
Title:
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INTELLIGENT PROBE CARD ARCHITECTURE
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Patent #:
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Issue Dt:
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08/07/2007
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Application #:
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10831870
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Filing Dt:
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04/26/2004
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Publication #:
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Pub Dt:
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11/17/2005
| | | | |
Title:
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METHOD TO BUILD ROBUST MECHANICAL STRUCTURES ON SUBSTRATE SURFACES
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Patent #:
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Issue Dt:
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10/02/2007
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Application #:
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10832700
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Filing Dt:
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04/27/2004
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Publication #:
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Pub Dt:
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01/06/2005
| | | | |
Title:
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CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
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Patent #:
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Issue Dt:
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07/17/2007
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Application #:
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10832899
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Filing Dt:
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04/27/2004
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Publication #:
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Pub Dt:
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10/14/2004
| | | | |
Title:
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TESTER CHANNEL TO MULTIPLE IC TERMINALS
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Patent #:
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01/09/2007
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10848777
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Filing Dt:
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05/18/2004
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Pub Dt:
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11/25/2004
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Title:
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PROBE FOR TESTING A DEVICE UNDER TEST
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12/12/2006
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10850921
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Filing Dt:
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05/21/2004
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11/24/2005
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Title:
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FREELY DEFLECTING KNEE PROBE WITH CONTROLLED SCRUB MOTION
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Issue Dt:
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08/28/2007
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10852370
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05/24/2004
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12/30/2004
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Title:
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APPARATUSES AND METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTOR
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02/28/2006
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10853858
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05/26/2004
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Pub Dt:
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10/28/2004
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Title:
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PHOTORESIST FORMULATION FOR HIGH ASPECT RATIO PLATING
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06/12/2007
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10868425
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06/15/2004
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Publication #:
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Pub Dt:
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12/15/2005
| | | | |
Title:
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MECHANICALLY RECONFIGURABLE VERTICAL TESTER INTERFACE FOR IC PROBING
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06/06/2006
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10879622
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06/29/2004
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Pub Dt:
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01/13/2005
| | | | |
Title:
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METHOD AND PROBER FOR CONTACTING A CONTACT AREA WITH A CONTACT TIP
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05/16/2006
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10883568
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06/30/2004
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Pub Dt:
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01/05/2006
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Title:
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DOUBLE ACTING SPRING PROBE
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08/15/2006
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10888347
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07/09/2004
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Publication #:
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Pub Dt:
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01/12/2006
| | | | |
Title:
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CANTILEVER PROBE WITH DUAL PLANE FIXTURE AND PROBE APPARATUS THEREWITH
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06/13/2006
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10889334
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07/12/2004
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Pub Dt:
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02/17/2005
| | | | |
Title:
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PROBE CARD ASSEMBLY
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Patent #:
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08/07/2007
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10905199
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12/21/2004
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Pub Dt:
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06/22/2006
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Title:
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REMOTE TEST FACILITY WITH WIRELESS INTERFACE TO LOCAL TEST FACILITIES
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07/03/2007
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10906046
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02/01/2005
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08/03/2006
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Title:
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METHOD AND APPARATUS FOR VERIFYING PLANARITY IN A PROBING SYSTEM
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09/11/2007
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10912789
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08/06/2004
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Pub Dt:
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01/13/2005
| | | | |
Title:
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OPTICAL TESTING DEVICE
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Patent #:
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NONE
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10919151
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08/16/2004
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Pub Dt:
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01/27/2005
| | | | |
Title:
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Forming tool for forming a contoured microelectronic spring mold
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12/02/2008
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10922486
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08/19/2004
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02/23/2006
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Title:
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METHOD TO BUILD A WIREBOND PROBE CARD IN A MANY AT A TIME FASHION
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07/18/2006
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10924141
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08/23/2004
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01/27/2005
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Title:
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WAFER-LEVEL BURN-IN AND TEST
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03/27/2007
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10928975
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08/27/2004
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Pub Dt:
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04/21/2005
| | | | |
Title:
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APPARATUS FOR TESTING SUBSTRATES
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Patent #:
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03/14/2006
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10930015
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08/30/2004
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02/03/2005
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Title:
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TEST SIGNAL DISTRIBUTION SYSTEM FOR IC TESTER
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06/10/2008
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10930272
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08/31/2004
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Pub Dt:
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03/02/2006
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Title:
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METHOD OF DESIGNING A PROBE CARD APPARATUS WITH DESIRED COMPLIANCE CHARACTERISTICS
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10/30/2007
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10933063
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09/02/2004
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07/07/2005
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Title:
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LITHOGRAPHIC CONTACT ELEMENTS
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11/18/2008
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10937470
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09/09/2004
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03/09/2006
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Title:
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METHOD AND APPARATUS FOR REMOTELY BUFFERING TEST CHANNELS
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08/01/2006
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10938267
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09/10/2004
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Pub Dt:
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02/10/2005
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Title:
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CONTACT STRUCTURES AND METHODS FOR MAKING SAME
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09/29/2009
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10939909
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09/13/2004
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Pub Dt:
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01/12/2006
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Title:
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METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATIONS CHANNELS
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06/06/2006
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10954496
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09/29/2004
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Pub Dt:
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02/17/2005
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Title:
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PROBE HOLDER FOR TESTING OF A TEST DEVICE
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11/24/2009
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10971489
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10/22/2004
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04/27/2006
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Title:
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METHOD OF MANUFACTURING A RESILIENT CONTACT
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05/15/2007
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10973704
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10/26/2004
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07/28/2005
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Title:
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METHOD FOR PROCESSING AN INTEGRATED CIRCUIT
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11/15/2005
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10979059
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11/01/2004
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04/28/2005
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Title:
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COMPENSATION FOR TEST SIGNAL DEGRADATION DUE TO DUT FAULT
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06/06/2006
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10985474
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11/09/2004
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Pub Dt:
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05/12/2005
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Title:
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ADJUSTABLE DELAY TRANSMISSION LINES
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05/01/2007
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10990640
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11/16/2004
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07/14/2005
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APPARATUSES AND METHODS FOR CLEANING TEST PROBES
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07/07/2009
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11000586
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11/30/2004
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Pub Dt:
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07/21/2005
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TEST ASSEMBLY INCLUDING A TEST DIE FOR TESTING A SEMICONDUCTOR PRODUCT DIE
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08/28/2007
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11018211
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12/21/2004
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06/22/2006
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BI-DIRECTIONAL BUFFER FOR INTERFACING TEST SYSTEM CHANNEL
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09/23/2008
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11019440
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12/21/2004
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06/30/2005
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ACTIVE WAFER PROBE
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NONE
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11021412
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12/22/2004
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06/22/2006
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Assembly with a detachable member
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10/16/2007
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11028940
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01/03/2005
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07/06/2006
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PROBE HEAD ARRAYS
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08/19/2008
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11031504
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01/07/2005
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07/13/2006
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METHOD AND APPARATUS FOR INCREASING OPERATING FREQUENCY OF A SYSTEM FOR TESTING ELECTRONIC DEVICES
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05/22/2007
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11035543
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01/14/2005
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06/09/2005
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GUARDED TUB ENCLOSURE
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09/11/2007
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11036739
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01/14/2005
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06/23/2005
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MEMBRANE PROBING SYSTEM
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08/14/2007
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11038744
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01/18/2005
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06/09/2005
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METHOD OF INCORPORATING INTERCONNECT SYSTEMS INTO AN INTEGRATED CIRCUIT PROCESS FLOW
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07/17/2007
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11048167
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01/31/2005
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Pub Dt:
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08/03/2006
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A PROBE CARD ASSEMBLY INCLUDING A PROGRAMMABLE DEVICE TO SELECTIVELY ROUTE SIGNALS FROM CHANNELS OF A TEST SYSTEM CONTROLLER TO PROBES
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04/28/2009
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11048383
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01/31/2005
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08/03/2006
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METHOD OF ESTIMATING CHANNEL BANDWIDTH FROM A TIME DOMAIN REFLECTOMETER (TDR) MEASUREMENT USING RISE TIME AND MAXIMUM SLOPE
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11/03/2009
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11058486
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02/15/2005
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Pub Dt:
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07/21/2005
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Title:
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ELECTROMAGNETICALLY COUPLED INTERCONNECT SYSTEM ARCHITECTURE
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