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Reel/Frame:039184/0280   Pages: 68
Recorded: 07/12/2016
Attorney Dkt #:F164159
Conveyance: SECURITY INTEREST IN UNITED STATES PATENTS AND TRADEMARKS
Total properties: 679
Page 3 of 7
Pages: 1 2 3 4 5 6 7
1
Patent #:
Issue Dt:
07/26/2005
Application #:
10310791
Filing Dt:
12/06/2002
Publication #:
Pub Dt:
06/10/2004
Title:
METHOD FOR MAKING A SOCKET TO PERFORM TESTING ON INTEGRATED CIRCUITS AND SOCKET MADE
2
Patent #:
Issue Dt:
11/30/2004
Application #:
10317486
Filing Dt:
12/11/2002
Publication #:
Pub Dt:
01/08/2004
Title:
TEST ASSEMBLY INCLUDING A TEST DIE FOR TESTING A SEMICONDUCTOR PRODUCT DIE
3
Patent #:
Issue Dt:
06/23/2009
Application #:
10317661
Filing Dt:
12/12/2002
Publication #:
Pub Dt:
06/17/2004
Title:
INTEGRATED CIRCUIT ASSEMBLY
4
Patent #:
Issue Dt:
03/01/2005
Application #:
10319287
Filing Dt:
12/13/2002
Publication #:
Pub Dt:
06/17/2004
Title:
GUARDED TUB ENCLOSURE
5
Patent #:
Issue Dt:
08/01/2006
Application #:
10321743
Filing Dt:
12/16/2002
Publication #:
Pub Dt:
06/17/2004
Title:
APPARATUS AND METHOD FOR LIMITING OVER TRAVEL IN A PROBE CARD ASSEMBLY
6
Patent #:
Issue Dt:
09/07/2004
Application #:
10326423
Filing Dt:
12/19/2002
Publication #:
Pub Dt:
06/12/2003
Title:
WAFER-LEVEL BURN-IN AND TEST
7
Patent #:
Issue Dt:
09/20/2005
Application #:
10328083
Filing Dt:
12/23/2002
Publication #:
Pub Dt:
06/24/2004
Title:
MICROELECTRONIC CONTACT STRUCTURE
8
Patent #:
Issue Dt:
04/10/2007
Application #:
10328113
Filing Dt:
12/20/2002
Publication #:
Pub Dt:
07/08/2004
Title:
COMPOSITE MOTION PROBING
9
Patent #:
Issue Dt:
01/18/2005
Application #:
10354636
Filing Dt:
01/29/2003
Publication #:
Pub Dt:
06/19/2003
Title:
METHOD OF DESIGNING , FABRICATING, TESTING AND INTERCONNECTING AN IC TO EXTERNAL CIRCUIT NODES
10
Patent #:
Issue Dt:
08/31/2004
Application #:
10406669
Filing Dt:
04/02/2003
Publication #:
Pub Dt:
09/11/2003
Title:
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
11
Patent #:
Issue Dt:
02/28/2006
Application #:
10410948
Filing Dt:
04/10/2003
Publication #:
Pub Dt:
10/14/2004
Title:
LAYERED MICROELECTRONIC CONTACT AND METHOD FOR FABRICATING SAME
12
Patent #:
Issue Dt:
09/27/2005
Application #:
10411175
Filing Dt:
04/10/2003
Publication #:
Pub Dt:
10/14/2004
Title:
HELICAL MICROELECTRONIC CONTACT AND METHOD FOR FABRICATING SAME
13
Patent #:
Issue Dt:
03/11/2008
Application #:
10411179
Filing Dt:
04/10/2003
Publication #:
Pub Dt:
10/14/2004
Title:
METHOD OF PROBING A DEVICE USING CAPTURED IMAGE OF PROBE STRUCTURE IN WHICH PROBE TIPS COMPRISE ALIGNMENT FEATURES
14
Patent #:
Issue Dt:
02/20/2007
Application #:
10418510
Filing Dt:
04/16/2003
Publication #:
Pub Dt:
10/16/2003
Title:
METHOD FOR CONSTRUCTING A MEMBRANE PROBE USING A DEPRESSION
15
Patent #:
Issue Dt:
06/28/2005
Application #:
10430628
Filing Dt:
05/05/2003
Publication #:
Pub Dt:
03/11/2004
Title:
HIGH PERFORMANCE PROBE SYSTEM
16
Patent #:
Issue Dt:
02/05/2008
Application #:
10456343
Filing Dt:
06/06/2003
Publication #:
Pub Dt:
12/09/2004
Title:
RHODIUM ELECTROPLATED STRUCTURES AND METHODS OF MAKING SAME
17
Patent #:
Issue Dt:
01/04/2005
Application #:
10458875
Filing Dt:
06/10/2003
Publication #:
Pub Dt:
12/04/2003
Title:
PROBE CARD ASSEMBLY
18
Patent #:
Issue Dt:
03/22/2005
Application #:
10607628
Filing Dt:
06/27/2003
Publication #:
Pub Dt:
12/30/2004
Title:
INSULATIVE COVERING OF PROBE TIPS
19
Patent #:
Issue Dt:
04/17/2007
Application #:
10609263
Filing Dt:
06/26/2003
Publication #:
Pub Dt:
05/20/2004
Title:
METHOD OF MAKING AN ELECTRONICS MODULE
20
Patent #:
Issue Dt:
06/28/2005
Application #:
10612235
Filing Dt:
07/01/2003
Publication #:
Pub Dt:
01/27/2005
Title:
APPARATUS AND METHOD FOR ELECTROMECHANICAL TESTING AND VALIDATION OF PROBE CARDS
21
Patent #:
Issue Dt:
10/31/2006
Application #:
10651821
Filing Dt:
08/29/2003
Publication #:
Pub Dt:
02/26/2004
Title:
METHODS OF FABRICATING AND USING SHAPED SPRINGS
22
Patent #:
Issue Dt:
01/25/2005
Application #:
10666219
Filing Dt:
09/18/2003
Title:
PROBE STATION WITH LOW NOISE CHARACTERISTICS
23
Patent #:
Issue Dt:
06/27/2006
Application #:
10667689
Filing Dt:
09/22/2003
Publication #:
Pub Dt:
03/25/2004
Title:
SEGMENTED CONTACTOR
24
Patent #:
Issue Dt:
07/31/2007
Application #:
10672655
Filing Dt:
09/25/2003
Publication #:
Pub Dt:
05/12/2005
Title:
PROBE STATION WITH LOW INDUCTANCE PATH
25
Patent #:
Issue Dt:
11/28/2006
Application #:
10673686
Filing Dt:
09/29/2003
Publication #:
Pub Dt:
04/15/2004
Title:
MOUNTING SPRING ELEMENTS ON SEMICONDUCTOR DEVICES, AND WAFER-LEVEL TESTING METHODOLOGY
26
Patent #:
Issue Dt:
06/13/2006
Application #:
10673691
Filing Dt:
09/29/2003
Publication #:
Pub Dt:
04/08/2004
Title:
SOCKETS FOR "SPRINGED" SEMICONDUCTOR DEVICE
27
Patent #:
Issue Dt:
05/16/2006
Application #:
10677178
Filing Dt:
10/02/2003
Publication #:
Pub Dt:
04/15/2004
Title:
TEST APPARATUS FOR TESTING SUBSTRATES AT LOW TEMPERATURES
28
Patent #:
Issue Dt:
05/02/2006
Application #:
10677524
Filing Dt:
10/02/2003
Publication #:
Pub Dt:
06/10/2004
Title:
TEST APPARATUS WITH LOADING DEVICE
29
Patent #:
Issue Dt:
07/05/2005
Application #:
10684094
Filing Dt:
10/10/2003
Publication #:
Pub Dt:
04/15/2004
Title:
METHODS OF REMOVABLY MOUNTING ELECTRONIC COMPONENTS TO A CIRCUIT BOARD, AND SOCKETS FORMED BY THE METHODS
30
Patent #:
Issue Dt:
05/15/2007
Application #:
10690170
Filing Dt:
10/21/2003
Publication #:
Pub Dt:
04/21/2005
Title:
WIRELESS TEST SYSTEM
31
Patent #:
Issue Dt:
11/28/2006
Application #:
10692114
Filing Dt:
10/23/2003
Publication #:
Pub Dt:
08/26/2004
Title:
CONTACT CARRIERS (TILES) FOR POPULATING LARGER SUBSTRATES WITH SPRING CONTACTS
32
Patent #:
NONE
Issue Dt:
Application #:
10692174
Filing Dt:
10/23/2003
Publication #:
Pub Dt:
04/15/2004
Title:
Microelectronic contact structures, and methods of making same
33
Patent #:
Issue Dt:
12/26/2006
Application #:
10693133
Filing Dt:
10/23/2003
Publication #:
Pub Dt:
04/28/2005
Title:
ISOLATION BUFFERS WITH CONTROLLED EQUAL TIME DELAYS
34
Patent #:
Issue Dt:
10/12/2010
Application #:
10693484
Filing Dt:
10/23/2003
Publication #:
Pub Dt:
05/06/2004
Title:
PROCESS AND APPARATUS FOR FINDING PATHS THROUGH A ROUTING SPACE
35
Patent #:
Issue Dt:
07/27/2010
Application #:
10705014
Filing Dt:
11/10/2003
Publication #:
Pub Dt:
05/20/2004
Title:
MEMBRANE PROBING METHOD USING IMPROVED CONTACT
36
Patent #:
Issue Dt:
05/23/2006
Application #:
10715683
Filing Dt:
11/17/2003
Publication #:
Pub Dt:
05/27/2004
Title:
INTERCONNECT FOR MICROELECTRONIC STRUCTURES WITH ENHANCED SPRING CHARACTERISTICS
37
Patent #:
Issue Dt:
04/11/2006
Application #:
10723269
Filing Dt:
11/26/2003
Publication #:
Pub Dt:
05/26/2005
Title:
METHODS FOR MAKING PLATED THROUGH HOLES USABLE AS INTERCONNECTION WIRE OR PROBE ATTACHMENTS
38
Patent #:
Issue Dt:
09/27/2005
Application #:
10725824
Filing Dt:
12/01/2003
Publication #:
Pub Dt:
04/22/2004
Title:
PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT UNDER TEST
39
Patent #:
Issue Dt:
09/27/2005
Application #:
10735226
Filing Dt:
12/12/2003
Publication #:
Pub Dt:
07/01/2004
Title:
INTERCONNECT ASSEMBLIES AND METHODS
40
Patent #:
Issue Dt:
04/10/2007
Application #:
10749028
Filing Dt:
12/30/2003
Publication #:
Pub Dt:
08/05/2004
Title:
SOCKET FOR MATING WITH ELECTRONIC COMPONENT, PARTICULARLY SEMICONDUCTOR DEVICE WITH SPRING PACKAGING, FOR FIXTURING, TESTING, BURNING-IN OR OPERATING SUCH A COMPONENT
41
Patent #:
Issue Dt:
07/12/2005
Application #:
10749358
Filing Dt:
12/29/2003
Publication #:
Pub Dt:
07/22/2004
Title:
INTEGRATED CIRCUIT TESTER WITH HIGH BANDWIDTH PROBE ASSEMBLY
42
Patent #:
Issue Dt:
11/23/2004
Application #:
10749546
Filing Dt:
12/29/2003
Publication #:
Pub Dt:
07/22/2004
Title:
INTEGRATED CIRCUIT INTERCONNECT SYSTEM
43
Patent #:
Issue Dt:
05/13/2008
Application #:
10750355
Filing Dt:
12/29/2003
Publication #:
Pub Dt:
07/22/2004
Title:
SPRING INTERCONNECT STRUCTURES
44
Patent #:
Issue Dt:
09/19/2006
Application #:
10750611
Filing Dt:
12/29/2003
Publication #:
Pub Dt:
02/17/2005
Title:
SYSTEM FOR MEASURING SIGNAL PATH RESISTANCE FOR AN INTEGRATED CIRCUIT TESTER INTERCONNECT STRUCTURE
45
Patent #:
Issue Dt:
05/30/2006
Application #:
10756477
Filing Dt:
01/12/2004
Publication #:
Pub Dt:
07/29/2004
Title:
METHOD FOR TESTING SIGNAL PATHS BETWEEN AN INTEGRATED CIRCUIT WAFER AND A WAFER TESTER
46
Patent #:
Issue Dt:
07/04/2006
Application #:
10771099
Filing Dt:
02/02/2004
Publication #:
Pub Dt:
07/21/2005
Title:
PROBE CARD CONFIGURATION FOR LOW MECHANICAL FLEXURAL STRENGTH ELECTRICAL ROUTING SUBSTRATES
47
Patent #:
Issue Dt:
07/15/2008
Application #:
10772172
Filing Dt:
02/03/2004
Publication #:
Pub Dt:
08/12/2004
Title:
MEMBRANE PROBING SYSTEM
48
Patent #:
Issue Dt:
12/16/2008
Application #:
10772970
Filing Dt:
02/05/2004
Publication #:
Pub Dt:
08/11/2005
Title:
CONTACTLESS INTERFACING OF TEST SIGNALS WITH A DEVICE UNDER TEST
49
Patent #:
Issue Dt:
05/15/2007
Application #:
10781369
Filing Dt:
02/18/2004
Publication #:
Pub Dt:
08/18/2005
Title:
A METHOD AND APPARATUS FOR PROBING AN ELECTRONIC DEVICE IN WHICH MOVEMENT OF PROBES AND/OR THE ELECTRONIC DEVICE INCLUDES A LATERAL COMPONENT
50
Patent #:
Issue Dt:
07/31/2007
Application #:
10794246
Filing Dt:
03/05/2004
Publication #:
Pub Dt:
04/28/2005
Title:
PROBE TESTING STRUCTURE
51
Patent #:
Issue Dt:
08/15/2006
Application #:
10810758
Filing Dt:
03/26/2004
Publication #:
Pub Dt:
09/16/2004
Title:
AUTOMATED SYSTEM FOR DESIGNING AND TESTING A PROBE CARD
52
Patent #:
Issue Dt:
06/17/2008
Application #:
10819748
Filing Dt:
04/07/2004
Publication #:
Pub Dt:
10/13/2005
Title:
APPARATUS FOR PROVIDING A HIGH FREQUENCY LOOP BACK WITH A DC PATH FOR A PARAMETRIC TEST
53
Patent #:
Issue Dt:
04/10/2007
Application #:
10820319
Filing Dt:
04/08/2004
Publication #:
Pub Dt:
10/13/2005
Title:
SYSTEMS AND METHODS FOR WIRELESS SEMICONDUCTOR DEVICE TESTING
54
Patent #:
Issue Dt:
08/25/2009
Application #:
10821715
Filing Dt:
04/08/2004
Publication #:
Pub Dt:
10/07/2004
Title:
MICROELECTRONIC SPRING CONTACT ELEMENTS
55
Patent #:
Issue Dt:
01/30/2007
Application #:
10823437
Filing Dt:
04/12/2004
Publication #:
Pub Dt:
10/07/2004
Title:
METHOD OF MANUFACTURING A PROBE CARD
56
Patent #:
Issue Dt:
07/03/2007
Application #:
10826715
Filing Dt:
04/16/2004
Publication #:
Pub Dt:
10/20/2005
Title:
METHOD AND APPARATUS FOR CALIBRATING COMMUNICATIONS CHANNELS
57
Patent #:
Issue Dt:
12/11/2007
Application #:
10828755
Filing Dt:
04/21/2004
Publication #:
Pub Dt:
10/27/2005
Title:
INTELLIGENT PROBE CARD ARCHITECTURE
58
Patent #:
Issue Dt:
08/07/2007
Application #:
10831870
Filing Dt:
04/26/2004
Publication #:
Pub Dt:
11/17/2005
Title:
METHOD TO BUILD ROBUST MECHANICAL STRUCTURES ON SUBSTRATE SURFACES
59
Patent #:
Issue Dt:
10/02/2007
Application #:
10832700
Filing Dt:
04/27/2004
Publication #:
Pub Dt:
01/06/2005
Title:
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
60
Patent #:
Issue Dt:
07/17/2007
Application #:
10832899
Filing Dt:
04/27/2004
Publication #:
Pub Dt:
10/14/2004
Title:
TESTER CHANNEL TO MULTIPLE IC TERMINALS
61
Patent #:
Issue Dt:
01/09/2007
Application #:
10848777
Filing Dt:
05/18/2004
Publication #:
Pub Dt:
11/25/2004
Title:
PROBE FOR TESTING A DEVICE UNDER TEST
62
Patent #:
Issue Dt:
12/12/2006
Application #:
10850921
Filing Dt:
05/21/2004
Publication #:
Pub Dt:
11/24/2005
Title:
FREELY DEFLECTING KNEE PROBE WITH CONTROLLED SCRUB MOTION
63
Patent #:
Issue Dt:
08/28/2007
Application #:
10852370
Filing Dt:
05/24/2004
Publication #:
Pub Dt:
12/30/2004
Title:
APPARATUSES AND METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTOR
64
Patent #:
Issue Dt:
02/28/2006
Application #:
10853858
Filing Dt:
05/26/2004
Publication #:
Pub Dt:
10/28/2004
Title:
PHOTORESIST FORMULATION FOR HIGH ASPECT RATIO PLATING
65
Patent #:
Issue Dt:
06/12/2007
Application #:
10868425
Filing Dt:
06/15/2004
Publication #:
Pub Dt:
12/15/2005
Title:
MECHANICALLY RECONFIGURABLE VERTICAL TESTER INTERFACE FOR IC PROBING
66
Patent #:
Issue Dt:
06/06/2006
Application #:
10879622
Filing Dt:
06/29/2004
Publication #:
Pub Dt:
01/13/2005
Title:
METHOD AND PROBER FOR CONTACTING A CONTACT AREA WITH A CONTACT TIP
67
Patent #:
Issue Dt:
05/16/2006
Application #:
10883568
Filing Dt:
06/30/2004
Publication #:
Pub Dt:
01/05/2006
Title:
DOUBLE ACTING SPRING PROBE
68
Patent #:
Issue Dt:
08/15/2006
Application #:
10888347
Filing Dt:
07/09/2004
Publication #:
Pub Dt:
01/12/2006
Title:
CANTILEVER PROBE WITH DUAL PLANE FIXTURE AND PROBE APPARATUS THEREWITH
69
Patent #:
Issue Dt:
06/13/2006
Application #:
10889334
Filing Dt:
07/12/2004
Publication #:
Pub Dt:
02/17/2005
Title:
PROBE CARD ASSEMBLY
70
Patent #:
Issue Dt:
08/07/2007
Application #:
10905199
Filing Dt:
12/21/2004
Publication #:
Pub Dt:
06/22/2006
Title:
REMOTE TEST FACILITY WITH WIRELESS INTERFACE TO LOCAL TEST FACILITIES
71
Patent #:
Issue Dt:
07/03/2007
Application #:
10906046
Filing Dt:
02/01/2005
Publication #:
Pub Dt:
08/03/2006
Title:
METHOD AND APPARATUS FOR VERIFYING PLANARITY IN A PROBING SYSTEM
72
Patent #:
Issue Dt:
09/11/2007
Application #:
10912789
Filing Dt:
08/06/2004
Publication #:
Pub Dt:
01/13/2005
Title:
OPTICAL TESTING DEVICE
73
Patent #:
NONE
Issue Dt:
Application #:
10919151
Filing Dt:
08/16/2004
Publication #:
Pub Dt:
01/27/2005
Title:
Forming tool for forming a contoured microelectronic spring mold
74
Patent #:
Issue Dt:
12/02/2008
Application #:
10922486
Filing Dt:
08/19/2004
Publication #:
Pub Dt:
02/23/2006
Title:
METHOD TO BUILD A WIREBOND PROBE CARD IN A MANY AT A TIME FASHION
75
Patent #:
Issue Dt:
07/18/2006
Application #:
10924141
Filing Dt:
08/23/2004
Publication #:
Pub Dt:
01/27/2005
Title:
WAFER-LEVEL BURN-IN AND TEST
76
Patent #:
Issue Dt:
03/27/2007
Application #:
10928975
Filing Dt:
08/27/2004
Publication #:
Pub Dt:
04/21/2005
Title:
APPARATUS FOR TESTING SUBSTRATES
77
Patent #:
Issue Dt:
03/14/2006
Application #:
10930015
Filing Dt:
08/30/2004
Publication #:
Pub Dt:
02/03/2005
Title:
TEST SIGNAL DISTRIBUTION SYSTEM FOR IC TESTER
78
Patent #:
Issue Dt:
06/10/2008
Application #:
10930272
Filing Dt:
08/31/2004
Publication #:
Pub Dt:
03/02/2006
Title:
METHOD OF DESIGNING A PROBE CARD APPARATUS WITH DESIRED COMPLIANCE CHARACTERISTICS
79
Patent #:
Issue Dt:
10/30/2007
Application #:
10933063
Filing Dt:
09/02/2004
Publication #:
Pub Dt:
07/07/2005
Title:
LITHOGRAPHIC CONTACT ELEMENTS
80
Patent #:
Issue Dt:
11/18/2008
Application #:
10937470
Filing Dt:
09/09/2004
Publication #:
Pub Dt:
03/09/2006
Title:
METHOD AND APPARATUS FOR REMOTELY BUFFERING TEST CHANNELS
81
Patent #:
Issue Dt:
08/01/2006
Application #:
10938267
Filing Dt:
09/10/2004
Publication #:
Pub Dt:
02/10/2005
Title:
CONTACT STRUCTURES AND METHODS FOR MAKING SAME
82
Patent #:
Issue Dt:
09/29/2009
Application #:
10939909
Filing Dt:
09/13/2004
Publication #:
Pub Dt:
01/12/2006
Title:
METHOD AND APPARATUS FOR CALIBRATING AND/OR DESKEWING COMMUNICATIONS CHANNELS
83
Patent #:
Issue Dt:
06/06/2006
Application #:
10954496
Filing Dt:
09/29/2004
Publication #:
Pub Dt:
02/17/2005
Title:
PROBE HOLDER FOR TESTING OF A TEST DEVICE
84
Patent #:
Issue Dt:
11/24/2009
Application #:
10971489
Filing Dt:
10/22/2004
Publication #:
Pub Dt:
04/27/2006
Title:
METHOD OF MANUFACTURING A RESILIENT CONTACT
85
Patent #:
Issue Dt:
05/15/2007
Application #:
10973704
Filing Dt:
10/26/2004
Publication #:
Pub Dt:
07/28/2005
Title:
METHOD FOR PROCESSING AN INTEGRATED CIRCUIT
86
Patent #:
Issue Dt:
11/15/2005
Application #:
10979059
Filing Dt:
11/01/2004
Publication #:
Pub Dt:
04/28/2005
Title:
COMPENSATION FOR TEST SIGNAL DEGRADATION DUE TO DUT FAULT
87
Patent #:
Issue Dt:
06/06/2006
Application #:
10985474
Filing Dt:
11/09/2004
Publication #:
Pub Dt:
05/12/2005
Title:
ADJUSTABLE DELAY TRANSMISSION LINES
88
Patent #:
Issue Dt:
05/01/2007
Application #:
10990640
Filing Dt:
11/16/2004
Publication #:
Pub Dt:
07/14/2005
Title:
APPARATUSES AND METHODS FOR CLEANING TEST PROBES
89
Patent #:
Issue Dt:
07/07/2009
Application #:
11000586
Filing Dt:
11/30/2004
Publication #:
Pub Dt:
07/21/2005
Title:
TEST ASSEMBLY INCLUDING A TEST DIE FOR TESTING A SEMICONDUCTOR PRODUCT DIE
90
Patent #:
Issue Dt:
08/28/2007
Application #:
11018211
Filing Dt:
12/21/2004
Publication #:
Pub Dt:
06/22/2006
Title:
BI-DIRECTIONAL BUFFER FOR INTERFACING TEST SYSTEM CHANNEL
91
Patent #:
Issue Dt:
09/23/2008
Application #:
11019440
Filing Dt:
12/21/2004
Publication #:
Pub Dt:
06/30/2005
Title:
ACTIVE WAFER PROBE
92
Patent #:
NONE
Issue Dt:
Application #:
11021412
Filing Dt:
12/22/2004
Publication #:
Pub Dt:
06/22/2006
Title:
Assembly with a detachable member
93
Patent #:
Issue Dt:
10/16/2007
Application #:
11028940
Filing Dt:
01/03/2005
Publication #:
Pub Dt:
07/06/2006
Title:
PROBE HEAD ARRAYS
94
Patent #:
Issue Dt:
08/19/2008
Application #:
11031504
Filing Dt:
01/07/2005
Publication #:
Pub Dt:
07/13/2006
Title:
METHOD AND APPARATUS FOR INCREASING OPERATING FREQUENCY OF A SYSTEM FOR TESTING ELECTRONIC DEVICES
95
Patent #:
Issue Dt:
05/22/2007
Application #:
11035543
Filing Dt:
01/14/2005
Publication #:
Pub Dt:
06/09/2005
Title:
GUARDED TUB ENCLOSURE
96
Patent #:
Issue Dt:
09/11/2007
Application #:
11036739
Filing Dt:
01/14/2005
Publication #:
Pub Dt:
06/23/2005
Title:
MEMBRANE PROBING SYSTEM
97
Patent #:
Issue Dt:
08/14/2007
Application #:
11038744
Filing Dt:
01/18/2005
Publication #:
Pub Dt:
06/09/2005
Title:
METHOD OF INCORPORATING INTERCONNECT SYSTEMS INTO AN INTEGRATED CIRCUIT PROCESS FLOW
98
Patent #:
Issue Dt:
07/17/2007
Application #:
11048167
Filing Dt:
01/31/2005
Publication #:
Pub Dt:
08/03/2006
Title:
A PROBE CARD ASSEMBLY INCLUDING A PROGRAMMABLE DEVICE TO SELECTIVELY ROUTE SIGNALS FROM CHANNELS OF A TEST SYSTEM CONTROLLER TO PROBES
99
Patent #:
Issue Dt:
04/28/2009
Application #:
11048383
Filing Dt:
01/31/2005
Publication #:
Pub Dt:
08/03/2006
Title:
METHOD OF ESTIMATING CHANNEL BANDWIDTH FROM A TIME DOMAIN REFLECTOMETER (TDR) MEASUREMENT USING RISE TIME AND MAXIMUM SLOPE
100
Patent #:
Issue Dt:
11/03/2009
Application #:
11058486
Filing Dt:
02/15/2005
Publication #:
Pub Dt:
07/21/2005
Title:
ELECTROMAGNETICALLY COUPLED INTERCONNECT SYSTEM ARCHITECTURE
Assignors
1
Exec Dt:
06/24/2016
2
Exec Dt:
06/24/2016
3
Exec Dt:
06/24/2016
4
Exec Dt:
06/24/2016
Assignee
1
601 MONTGOMERY STREET, SUITE 1500
SAN FRANCISCO, CALIFORNIA 94111
Correspondence name and address
STEWART WALSH
1025 VERMONT AVE NW, SUITE 1130
NATIONAL CORPORATE RESEARCH, LTD
WASHINGTON, DC 20005

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