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Reel/Frame:	039184/0280			Pages:	68
		Recorded:	07/12/2016
Attorney Dkt #:	F164159
Conveyance:	SECURITY INTEREST IN UNITED STATES PATENTS AND TRADEMARKS

Total properties: 679
Page 4 of 7
Pages: 1 2 3 4 5 6 7

1

Patent #:	7116119	Issue Dt:	10/03/2006	Application #:	11059164	Filing Dt:	02/15/2005
Publication #:	US20050140381	Pub Dt:	06/30/2005
Title:	PROBE CARD WITH COPLANAR DAUGHTER CARD

2

Patent #:	7444623	Issue Dt:	10/28/2008	Application #:	11070075	Filing Dt:	03/01/2005
Publication #:	US20050148243	Pub Dt:	07/07/2005
Title:	PROCESS AND APPARATUS FOR ADJUSTING TRACES

3

Patent #:	7196531	Issue Dt:	03/27/2007	Application #:	11073187	Filing Dt:	03/04/2005
Publication #:	US20050146339	Pub Dt:	07/07/2005
Title:	METHOD OF MANUFACTURING A PROBE CARD

4

Patent #:	7554322	Issue Dt:	06/30/2009	Application #:	11083677	Filing Dt:	03/16/2005
Publication #:	US20050179427	Pub Dt:	08/18/2005
Title:	PROBE STATION

5

Patent #:	7330041	Issue Dt:	02/12/2008	Application #:	11086126	Filing Dt:	03/21/2005
Publication #:	US20050287685	Pub Dt:	12/29/2005
Title:	LOCALIZING A TEMPERATURE OF A DEVICE FOR TESTING

6

Patent #:	7681309	Issue Dt:	03/23/2010	Application #:	11090613	Filing Dt:	03/25/2005
Publication #:	US20050161797	Pub Dt:	07/28/2005
Title:	METHOD FOR INTERCONNECTING AN INTEGRATED CIRCUIT MULTIPLE DIE ASSEMBLY

7

Patent #:	7330039	Issue Dt:	02/12/2008	Application #:	11090614	Filing Dt:	03/25/2005
Publication #:	US20050167816	Pub Dt:	08/04/2005
Title:	METHOD FOR MAKING A SOCKET TO PERFORM TESTING ON INTEGRATED CIRCUITS

8

Patent #:	NONE	Issue Dt:		Application #:	11091069	Filing Dt:	03/28/2005
Publication #:	US20060214679	Pub Dt:	09/28/2006
Title:	Active diagnostic interface for wafer probe applications

9

Patent #:	7579847	Issue Dt:	08/25/2009	Application #:	11112034	Filing Dt:	04/22/2005
Publication #:	US20050206397	Pub Dt:	09/22/2005
Title:	PROBE CARD COOLING ASSEMBLY WITH DIRECT COOLING OF ACTIVE ELECTRONIC COMPONENTS

10

Patent #:	7245137	Issue Dt:	07/17/2007	Application #:	11119715	Filing Dt:	05/02/2005
Publication #:	US20050189956	Pub Dt:	09/01/2005
Title:	A TEST HEAD ASSEMBLY HAVING PAIRED CONTACT STRUCTURES

11

Patent #:	7148711	Issue Dt:	12/12/2006	Application #:	11144852	Filing Dt:	06/03/2005
Publication #:	US20050248359	Pub Dt:	11/10/2005
Title:	MEMBRANE PROBING SYSTEM

12

Patent #:	8324725	Issue Dt:	12/04/2012	Application #:	11160477	Filing Dt:	06/24/2005
Publication #:	US20060076690	Pub Dt:	04/13/2006
Title:	STACKED DIE MODULE

13

Patent #:	7671614	Issue Dt:	03/02/2010	Application #:	11164737	Filing Dt:	12/02/2005
Publication #:	US20070126435	Pub Dt:	06/07/2007
Title:	APPARATUS AND METHOD FOR ADJUSTING AN ORIENTATION OF PROBES

14

Patent #:	7471094	Issue Dt:	12/30/2008	Application #:	11165833	Filing Dt:	06/24/2005
Publication #:	US20060290367	Pub Dt:	12/28/2006
Title:	METHOD AND APPARATUS FOR ADJUSTING A MULTI-SUBSTRATE PROBE STRUCTURE

15

Patent #:	7368927	Issue Dt:	05/06/2008	Application #:	11175600	Filing Dt:	07/05/2005
Publication #:	US20060006889	Pub Dt:	01/12/2006
Title:	PROBE HEAD HAVING A MEMBRANE SUSPENDED PROBE

16

Patent #:	NONE	Issue Dt:		Application #:	11180247	Filing Dt:	07/12/2005
Publication #:	US20110115512	Pub Dt:	05/19/2011
Title:	Integrated circuit tester with high bandwidth probe assembly

17

Patent #:	NONE	Issue Dt:		Application #:	11189954	Filing Dt:	07/25/2005
Publication #:	US20060019027	Pub Dt:	01/26/2006
Title:	METHOD FOR FORMING MICROELECTRONIC SPRING STRUCTURES ON A SUBSTRATE

18

Patent #:	NONE	Issue Dt:		Application #:	11209221	Filing Dt:	08/22/2005
Publication #:	US20060066334	Pub Dt:	03/30/2006
Title:	Fiducial alignment masks on microelectronic spring contacts

19

Patent #:	7119564	Issue Dt:	10/10/2006	Application #:	11216579	Filing Dt:	08/30/2005
Publication #:	US20060001440	Pub Dt:	01/05/2006
Title:	METHOD AND SYSTEM FOR COMPENSATING THERMALLY INDUCED MOTION OF PROBE CARDS

20

Patent #:	NONE	Issue Dt:		Application #:	11221231	Filing Dt:	09/06/2005
Publication #:	US20060006384	Pub Dt:	01/12/2006
Title:	Special contact points for accessing internal circuitry of an intergrated circuit

21

Patent #:	7731546	Issue Dt:	06/08/2010	Application #:	11228966	Filing Dt:	09/16/2005
Publication #:	US20070270041	Pub Dt:	11/22/2007
Title:	MICROELECTRONIC CONTACT STRUCTURE

22

Patent #:	7169646	Issue Dt:	01/30/2007	Application #:	11237090	Filing Dt:	09/27/2005
Publication #:	US20060024988	Pub Dt:	02/02/2006
Title:	INTERCONNECT ASSEMBLIES AND METHODS

23

Patent #:	7131848	Issue Dt:	11/07/2006	Application #:	11237091	Filing Dt:	09/27/2005
Publication #:	US20060024989	Pub Dt:	02/02/2006
Title:	HELICAL MICROELECTRONIC CONTACT AND METHOD FOR FABRICATING SAME

24

Patent #:	7245120	Issue Dt:	07/17/2007	Application #:	11237092	Filing Dt:	09/27/2005
Publication #:	US20060022699	Pub Dt:	02/02/2006
Title:	PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT UNDER TEST

25

Patent #:	7200930	Issue Dt:	04/10/2007	Application #:	11256514	Filing Dt:	10/19/2005
Publication #:	US20060033517	Pub Dt:	02/16/2006
Title:	PROBE FOR SEMICONDUCTOR DEVICES

26

Patent #:	7128587	Issue Dt:	10/31/2006	Application #:	11264948	Filing Dt:	11/01/2005
Publication #:	US20060057875	Pub Dt:	03/16/2006
Title:	PROBE CARD COVERING SYSTEM AND METHOD

27

Patent #:	7227371	Issue Dt:	06/05/2007	Application #:	11273889	Filing Dt:	11/14/2005
Publication #:	US20060066332	Pub Dt:	03/30/2006
Title:	HIGH PERFORMANCE PROBE SYSTEM

28

Patent #:	7746937	Issue Dt:	06/29/2010	Application #:	11279816	Filing Dt:	04/14/2006
Publication #:	US20070241836	Pub Dt:	10/18/2007
Title:	EFFICIENT WIRED INTERFACE FOR DIFFERENTIAL SIGNALS

29

Patent #:	7235990	Issue Dt:	06/26/2007	Application #:	11299487	Filing Dt:	12/12/2005
Publication #:	US20070132465	Pub Dt:	06/14/2007
Title:	PROBE STATION COMPRISING A BELLOWS WITH EMI SHIELDING CAPABILITIES

30

Patent #:	7345492	Issue Dt:	03/18/2008	Application #:	11302650	Filing Dt:	12/14/2005
Publication #:	US20070132466	Pub Dt:	06/14/2007
Title:	PROBE CARDS EMPLOYING PROBES HAVING RETAINING PORTIONS FOR POTTING IN A RETENTION ARRANGEMENT

31

Patent #:	7609080	Issue Dt:	10/27/2009	Application #:	11306186	Filing Dt:	12/19/2005
Publication #:	US20060217906	Pub Dt:	09/28/2006
Title:	VOLTAGE FAULT DETECTION AND PROTECTION

32

Patent #:	7498825	Issue Dt:	03/03/2009	Application #:	11306270	Filing Dt:	12/21/2005
Publication #:	US20070007977	Pub Dt:	01/11/2007
Title:	PROBE CARD ASSEMBLY WITH AN INTERCHANGEABLE PROBE INSERT

33

Patent #:	7658831	Issue Dt:	02/09/2010	Application #:	11306291	Filing Dt:	12/21/2005
Publication #:	US20070141743	Pub Dt:	06/21/2007
Title:	THREE DIMENSIONAL MICROSTRUCTURES AND METHODS FOR MAKING THREE DIMENSIONAL MICROSTRUCTURES

34

Patent #:	7285968	Issue Dt:	10/23/2007	Application #:	11306515	Filing Dt:	12/30/2005
Publication #:	US20060255814	Pub Dt:	11/16/2006
Title:	APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PROBE CARD ASSEMBLY

35

Patent #:	NONE	Issue Dt:		Application #:	11306574	Filing Dt:	01/03/2006
Publication #:	US20070152685	Pub Dt:	07/05/2007
Title:	A PROBE ARRAY STRUCTURE AND A METHOD OF MAKING A PROBE ARRAY STRUCTURE

36

Patent #:	7956633	Issue Dt:	06/07/2011	Application #:	11308094	Filing Dt:	03/06/2006
Publication #:	US20070205780	Pub Dt:	09/06/2007
Title:	STACKED GUARD STRUCTURES

37

Patent #:	7282930	Issue Dt:	10/16/2007	Application #:	11314624	Filing Dt:	12/21/2005
Publication #:	US20070139067	Pub Dt:	06/21/2007
Title:	DEVICE FOR TESTING THIN ELEMENTS

38

Patent #:	7535247	Issue Dt:	05/19/2009	Application #:	11335037	Filing Dt:	01/18/2006
Publication #:	US20060170441	Pub Dt:	08/03/2006
Title:	INTERFACE FOR TESTING SEMICONDUCTORS

39

Patent #:	7656172	Issue Dt:	02/02/2010	Application #:	11335069	Filing Dt:	01/18/2006
Publication #:	US20060184041	Pub Dt:	08/17/2006
Title:	SYSTEM FOR TESTING SEMICONDUCTORS

40

Patent #:	NONE	Issue Dt:		Application #:	11362632	Filing Dt:	02/27/2006
Publication #:	US20060138677	Pub Dt:	06/29/2006
Title:	Layered microelectronic contact and method for fabricating same

41

Patent #:	7238464	Issue Dt:	07/03/2007	Application #:	11362695	Filing Dt:	02/27/2006
Publication #:	US20060141394	Pub Dt:	06/29/2006
Title:	PHOTORESIST FORMULATION FOR HIGH ASPECT RATIO PLATING

42

Patent #:	7265536	Issue Dt:	09/04/2007	Application #:	11365424	Filing Dt:	03/01/2006
Publication #:	US20060212248	Pub Dt:	09/21/2006
Title:	PROCEDURE FOR REPRODUCTION OF A CALIBRATION POSITION OF AN ALIGNED AND AFTERWARDS DISPLACED CALIBRATION SUBSTRATE IN A PROBE STATION

43

Patent #:	NONE	Issue Dt:		Application #:	11374761	Filing Dt:	03/14/2006
Publication #:	US20060157839	Pub Dt:	07/20/2006
Title:	Re-assembly process for MEMS structures

44

Patent #:	7579856	Issue Dt:	08/25/2009	Application #:	11379760	Filing Dt:	04/21/2006
Publication #:	US20070247175	Pub Dt:	10/25/2007
Title:	PROBE STRUCTURES WITH PHYSICALLY SUSPENDED ELECTRONIC COMPONENTS

45

Patent #:	7528618	Issue Dt:	05/05/2009	Application #:	11381274	Filing Dt:	05/02/2006
Publication #:	US20070259456	Pub Dt:	11/08/2007
Title:	EXTENDED PROBE TIPS

46

Patent #:	7444253	Issue Dt:	10/28/2008	Application #:	11382458	Filing Dt:	05/09/2006
Publication #:	US20070265795	Pub Dt:	11/15/2007
Title:	AIR BRIDGE STRUCTURES AND METHODS OF MAKING AND USING AIR BRIDGE STRUCTURES

47

Patent #:	NONE	Issue Dt:		Application #:	11382756	Filing Dt:	05/11/2006
Publication #:	US20060191136	Pub Dt:	08/31/2006
Title:	Method Of Making Microelectronic Spring Contact Array

48

Patent #:	7312617	Issue Dt:	12/25/2007	Application #:	11385289	Filing Dt:	03/20/2006
Publication #:	US20070216432	Pub Dt:	09/20/2007
Title:	SPACE TRANSFORMERS EMPLOYING WIRE BONDS FOR INTERCONNECTIONS WITH FINE PITCH CONTACTS

49

Patent #:	7271603	Issue Dt:	09/18/2007	Application #:	11391895	Filing Dt:	03/28/2006
Publication #:	US20060170439	Pub Dt:	08/03/2006
Title:	Shielded probe for testing a device under test

50

Patent #:	7479792	Issue Dt:	01/20/2009	Application #:	11403138	Filing Dt:	04/11/2006
Publication #:	US20060185164	Pub Dt:	08/24/2006
Title:	METHODS FOR MAKING PLATED THROUGH HOLES USABLE AS INTERCONNECTION WIRE OR PROBE ATTACHMENTS

51

Patent #:	7221174	Issue Dt:	05/22/2007	Application #:	11406737	Filing Dt:	04/18/2006
Publication #:	US20060208748	Pub Dt:	09/21/2006
Title:	PROBE HOLDER FOR TESTING OF A TEST DEVICE

52

Patent #:	7449899	Issue Dt:	11/11/2008	Application #:	11410783	Filing Dt:	04/24/2006
Publication #:	US20060279299	Pub Dt:	12/14/2006
Title:	PROBE FOR HIGH FREQUENCY SIGNALS

53

Patent #:	7619419	Issue Dt:	11/17/2009	Application #:	11413738	Filing Dt:	04/28/2006
Publication #:	US20060290357	Pub Dt:	12/28/2006
Title:	WIDEBAND ACTIVE-PASSIVE DIFFERENTIAL SIGNAL PROBE

54

Patent #:	7897435	Issue Dt:	03/01/2011	Application #:	11420403	Filing Dt:	05/25/2006
Publication #:	US20060211234	Pub Dt:	09/21/2006
Title:	RE-ASSEMBLY PROCESS FOR MEMS STRUCTURES

55

Patent #:	7239220	Issue Dt:	07/03/2007	Application #:	11422565	Filing Dt:	06/06/2006
Publication #:	US20060208830	Pub Dt:	09/21/2006
Title:	ADJUSTABLE DELAY TRANSMISSION LINE

56

Patent #:	7557592	Issue Dt:	07/07/2009	Application #:	11422573	Filing Dt:	06/06/2006
Publication #:	US20070296422	Pub Dt:	12/27/2007
Title:	METHOD OF EXPANDING TESTER DRIVE AND MEASUREMENT CAPABILITY

57

Patent #:	NONE	Issue Dt:		Application #:	11423767	Filing Dt:	06/13/2006
Publication #:	US20060223345	Pub Dt:	10/05/2006
Title:	SOCKETS FOR "SPRINGED" SEMICONDUCTOR DEVICES

58

Patent #:	7352196	Issue Dt:	04/01/2008	Application #:	11423808	Filing Dt:	06/13/2006
Publication #:	US20060279300	Pub Dt:	12/14/2006
Title:	PROBE CARD ASSEMBLY AND KIT

59

Patent #:	7688085	Issue Dt:	03/30/2010	Application #:	11423878	Filing Dt:	06/13/2006
Publication #:	US20070296433	Pub Dt:	12/27/2007
Title:	CONTACTOR HAVING A GLOBAL SPRING STRUCTURE AND METHODS OF MAKING AND USING THE CONTACTOR

60

Patent #:	7578057	Issue Dt:	08/25/2009	Application #:	11426621	Filing Dt:	06/27/2006
Publication #:	US20060244469	Pub Dt:	11/02/2006
Title:	METHOD OF FABRICATING SEGMENTED CONTACTOR

61

Patent #:	7312618	Issue Dt:	12/25/2007	Application #:	11428423	Filing Dt:	07/03/2006
Publication #:	US20060238211	Pub Dt:	10/26/2006
Title:	METHOD AND SYSTEM FOR COMPENSATING THERMALLY INDUCED MOTION OF PROBE CARDS

62

Patent #:	7325302	Issue Dt:	02/05/2008	Application #:	11440145	Filing Dt:	05/23/2006
Publication #:	US20060211278	Pub Dt:	09/21/2006
Title:	METHOD OF FORMING AN INTERCONNECTION ELEMENT

63

Patent #:	7550983	Issue Dt:	06/23/2009	Application #:	11441673	Filing Dt:	05/25/2006
Publication #:	US20060214676	Pub Dt:	09/28/2006
Title:	MEMBRANE PROBING SYSTEM WITH LOCAL CONTACT SCRUB

64

Patent #:	7952375	Issue Dt:	05/31/2011	Application #:	11447371	Filing Dt:	06/06/2006
Publication #:	US20070296435	Pub Dt:	12/27/2007
Title:	AC COUPLED PARAMETERIC TEST PROBE

65

Patent #:	7733101	Issue Dt:	06/08/2010	Application #:	11450977	Filing Dt:	06/09/2006
Publication #:	US20070152686	Pub Dt:	07/05/2007
Title:	KNEE PROBE HAVING INCREASED SCRUB MOTION

66

Patent #:	7692433	Issue Dt:	04/06/2010	Application #:	11455110	Filing Dt:	06/16/2006
Publication #:	US20070290705	Pub Dt:	12/20/2007
Title:	SAWING TILE CORNERS ON PROBE CARD SUBSTRATES

67

Patent #:	7601039	Issue Dt:	10/13/2009	Application #:	11456568	Filing Dt:	07/11/2006
Publication #:	US20060237856	Pub Dt:	10/26/2006
Title:	MICROELECTRONIC CONTACT STRUCTURE AND METHOD OF MAKING SAME

68

Patent #:	7345493	Issue Dt:	03/18/2008	Application #:	11458375	Filing Dt:	07/18/2006
Publication #:	US20070013401	Pub Dt:	01/18/2007
Title:	WAFER-LEVEL BURN-IN AND TEST

69

Patent #:	7482822	Issue Dt:	01/27/2009	Application #:	11461734	Filing Dt:	08/01/2006
Publication #:	US20060261827	Pub Dt:	11/23/2006
Title:	APPARATUS AND METHOD FOR LIMITING OVER TRAVEL IN A PROBE CARD ASSEMBLY

70

Patent #:	NONE	Issue Dt:		Application #:	11461749	Filing Dt:	08/01/2006
Publication #:	US20060286828	Pub Dt:	12/21/2006
Title:	Contact Structures Comprising A Core Structure And An Overcoat

71

Patent #:	7368930	Issue Dt:	05/06/2008	Application #:	11464593	Filing Dt:	08/15/2006
Publication #:	US20080036480	Pub Dt:	02/14/2008
Title:	ADJUSTMENT MECHANISM

72

Patent #:	7593872	Issue Dt:	09/22/2009	Application #:	11464760	Filing Dt:	08/15/2006
Publication #:	US20060294008	Pub Dt:	12/28/2006
Title:	METHOD AND SYSTEM FOR DESIGNING A PROBE CARD

73

Patent #:	7731503	Issue Dt:	06/08/2010	Application #:	11466039	Filing Dt:	08/21/2006
Publication #:	US20100112828	Pub Dt:	05/06/2010
Title:	CARBON NANOTUBE CONTACT STRUCTURES

74

Patent #:	7498824	Issue Dt:	03/03/2009	Application #:	11466145	Filing Dt:	08/22/2006
Publication #:	US20080061803	Pub Dt:	03/13/2008
Title:	METHOD AND APPARATUS FOR MAKING A DETERMINATION RELATING TO RESISTANCE OF PROBES

75

Patent #:	7649366	Issue Dt:	01/19/2010	Application #:	11469788	Filing Dt:	09/01/2006
Publication #:	US20080054917	Pub Dt:	03/06/2008
Title:	METHOD AND APPARTUS FOR SWITCHING TESTER RESOURCES

76

Patent #:	7433188	Issue Dt:	10/07/2008	Application #:	11472048	Filing Dt:	06/20/2006
Publication #:	US20060274501	Pub Dt:	12/07/2006
Title:	ELECTRONIC PACKAGE WITH DIRECT COOLING OF ACTIVE ELECTRONIC COMPONENTS

77

Patent #:	7825674	Issue Dt:	11/02/2010	Application #:	11479068	Filing Dt:	06/30/2006
Publication #:	US20060244470	Pub Dt:	11/02/2006
Title:	PROBE CARD CONFIGURATION FOR LOW MECHANICAL FLEXURAL STRENGTH ELECTRICAL ROUTING SUBSTRATES

78

Patent #:	7759949	Issue Dt:	07/20/2010	Application #:	11480302	Filing Dt:	06/29/2006
Publication #:	US20080001612	Pub Dt:	01/03/2008
Title:	PROBES WITH SELF-CLEANING BLUNT SKATES FOR CONTACTING CONDUCTIVE PADS

79

Patent #:	7323895	Issue Dt:	01/29/2008	Application #:	11528808	Filing Dt:	09/27/2006
Publication #:	US20070024302	Pub Dt:	02/01/2007
Title:	LOW-CURRENT POGO PROBE CARD

80

Patent #:	7323895	Issue Dt:	01/29/2008	Application #:	11528808	Filing Dt:	09/27/2006
Publication #:	US20070024302	Pub Dt:	02/01/2007
Title:	LOW-CURRENT POGO PROBE CARD

81

Patent #:	7463044	Issue Dt:	12/09/2008	Application #:	11531092	Filing Dt:	09/12/2006
Publication #:	US20070296402	Pub Dt:	12/27/2007
Title:	ADAPTER FOR POSITIONING OF CONTACT TIPS

82

Patent #:	NONE	Issue Dt:		Application #:	11531558	Filing Dt:	09/13/2006
Publication #:	US20080063594	Pub Dt:	03/13/2008
Title:	RHODIUM SULFATE PRODUCTION FOR RHODIUM PLATING

83

Patent #:	7733106	Issue Dt:	06/08/2010	Application #:	11532494	Filing Dt:	09/15/2006
Publication #:	US20070063721	Pub Dt:	03/22/2007
Title:	APPARATUS AND METHOD OF TESTING SINGULATED DIES

84

Patent #:	7335057	Issue Dt:	02/26/2008	Application #:	11532801	Filing Dt:	09/18/2006
Publication #:	US20070007980	Pub Dt:	01/11/2007
Title:	HIGH DENSITY PLANAR ELECTRICAL INTERFACE

85

Patent #:	7486095	Issue Dt:	02/03/2009	Application #:	11532877	Filing Dt:	09/18/2006
Publication #:	US20070007989	Pub Dt:	01/11/2007
Title:	SYSTEM FOR MEASURING SIGNAL PATH RESISTANCE FOR AN INTEGRATED CIRCUIT TESTER INTERCONNECT STRUCTURE

86

Patent #:	7782072	Issue Dt:	08/24/2010	Application #:	11535859	Filing Dt:	09/27/2006
Publication #:	US20080074132	Pub Dt:	03/27/2008
Title:	SINGLE SUPPORT STRUCTURE PROBE GROUP WITH STAGGERED MOUNTING PATTERN

87

Patent #:	7746089	Issue Dt:	06/29/2010	Application #:	11537164	Filing Dt:	09/29/2006
Publication #:	US20080079449	Pub Dt:	04/03/2008
Title:	METHOD AND APPARATUS FOR INDIRECT PLANARIZATION

88

Patent #:	7292057	Issue Dt:	11/06/2007	Application #:	11546827	Filing Dt:	10/11/2006
Publication #:	US20070030021	Pub Dt:	02/08/2007
Title:	PROBE STATION THERMAL CHUCK WITH SHIELDING FOR CAPACITIVE CURRENT

89

Patent #:	7560941	Issue Dt:	07/14/2009	Application #:	11548183	Filing Dt:	10/10/2006
Publication #:	US20070139060	Pub Dt:	06/21/2007
Title:	METHOD AND SYSTEM FOR COMPENSATING THERMALLY INDUCED MOTION OF PROBE CARDS

90

Patent #:	7999375	Issue Dt:	08/16/2011	Application #:	11548668	Filing Dt:	10/11/2006
Publication #:	US20080088010	Pub Dt:	04/17/2008
Title:	ELECTRONIC DEVICE WITH INTEGRATED MICROMECHANICAL CONTACTS AND COOLING SYSTEM

91

Patent #:	7488917	Issue Dt:	02/10/2009	Application #:	11550340	Filing Dt:	10/17/2006
Publication #:	US20070062913	Pub Dt:	03/22/2007
Title:	ELECTRIC DISCHARGE MACHINING OF A PROBE ARRAY

92

Patent #:	7622935	Issue Dt:	11/24/2009	Application #:	11551545	Filing Dt:	10/20/2006
Publication #:	US20070126440	Pub Dt:	06/07/2007
Title:	PROBE CARD ASSEMBLY WITH A MECHANICALLY DECOUPLED WIRING SUBSTRATE

93

Patent #:	7524194	Issue Dt:	04/28/2009	Application #:	11551621	Filing Dt:	10/20/2006
Publication #:	US20070045874	Pub Dt:	03/01/2007
Title:	LITHOGRAPHIC TYPE MICROELECTRONIC SPRING STRUCTURES WITH IMPROVED CONTOURS

94

Patent #:	NONE	Issue Dt:		Application #:	11552856	Filing Dt:	10/25/2006
Publication #:	US20070046313	Pub Dt:	03/01/2007
Title:	MOUNTING SPRING ELEMENTS ON SEMICONDUCTOR DEVICES, AND WAFER-LEVEL TESTING METHODOLOGY

95

Patent #:	NONE	Issue Dt:		Application #:	11554485	Filing Dt:	10/30/2006
Publication #:	US20070054513	Pub Dt:	03/08/2007
Title:	METHODS OF FABRICATING AND USING SHAPED SPRINGS

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Patent #:	7825675	Issue Dt:	11/02/2010	Application #:	11555567	Filing Dt:	11/01/2006
Publication #:	US20080100312	Pub Dt:	05/01/2008
Title:	METHOD AND APPARATUS FOR PROVIDING ACTIVE COMPLIANCE IN A PROBE CARD ASSEMBLY

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Patent #:	7347702	Issue Dt:	03/25/2008	Application #:	11561297	Filing Dt:	11/17/2006
Publication #:	US20070075715	Pub Dt:	04/05/2007
Title:	CONTACT CARRIERS (TILES) FOR POPULATING LARGER SUBSTRATES WITH SPRING CONTACTS

98

Patent #:	7724004	Issue Dt:	05/25/2010	Application #:	11566194	Filing Dt:	12/01/2006
Publication #:	US20070139061	Pub Dt:	06/21/2007
Title:	PROBING APPARATUS WITH GUARDED SIGNAL TRACES

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Patent #:	7852094	Issue Dt:	12/14/2010	Application #:	11567705	Filing Dt:	12/06/2006
Publication #:	US20080136432	Pub Dt:	06/12/2008
Title:	SHARING RESOURCES IN A SYSTEM FOR TESTING SEMICONDUCTOR DEVICES

100

Patent #:	7786740	Issue Dt:	08/31/2010	Application #:	11580204	Filing Dt:	10/11/2006
Publication #:	US20080088327	Pub Dt:	04/17/2008
Title:	PROBE CARDS EMPLOYING PROBES HAVING RETAINING PORTIONS FOR POTTING IN A POTTING REGION

Assignors

1

FORMFACTOR, INC.

Exec Dt:

06/24/2016

2

ASTRIA SEMICONDUCTOR HOLDINGS, INC.

Exec Dt:

06/24/2016

3

CASCADE MICROTECH, INC.

Exec Dt:

06/24/2016

4

MICRO-PROBE INCORPORATED

Exec Dt:

06/24/2016

Assignee

1

HSBC BANK USA, NATIONAL ASSOCIATION

601 MONTGOMERY STREET, SUITE 1500

SAN FRANCISCO, CALIFORNIA 94111

Correspondence name and address
	STEWART WALSH
	1025 VERMONT AVE NW, SUITE 1130
	NATIONAL CORPORATE RESEARCH, LTD
	WASHINGTON, DC 20005

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