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Reel/Frame:039184/0280   Pages: 68
Recorded: 07/12/2016
Attorney Dkt #:F164159
Conveyance: SECURITY INTEREST IN UNITED STATES PATENTS AND TRADEMARKS
Total properties: 679
Page 5 of 7
Pages: 1 2 3 4 5 6 7
1
Patent #:
Issue Dt:
03/06/2012
Application #:
11610925
Filing Dt:
12/14/2006
Publication #:
Pub Dt:
06/19/2008
Title:
ELECTRICAL GUARD STRUCTURES FOR PROTECTING A SIGNAL TRACE FROM ELECTRICAL INTERFERENCE
2
Patent #:
Issue Dt:
06/10/2008
Application #:
11611874
Filing Dt:
12/17/2006
Publication #:
Pub Dt:
06/19/2008
Title:
REINFORCED CONTACT ELEMENTS
3
Patent #:
Issue Dt:
04/22/2008
Application #:
11615976
Filing Dt:
12/24/2006
Publication #:
Pub Dt:
05/10/2007
Title:
ISOLATION BUFFERS WITH CONTROLLED EQUAL TIME DELAYS
4
Patent #:
Issue Dt:
03/09/2010
Application #:
11617373
Filing Dt:
12/28/2006
Publication #:
Pub Dt:
07/03/2008
Title:
RESILIENT CONTACT ELEMENT AND METHODS OF FABRICATION
5
Patent #:
Issue Dt:
12/14/2010
Application #:
11617394
Filing Dt:
12/28/2006
Publication #:
Pub Dt:
07/03/2008
Title:
ROTATING CONTACT ELEMENT AND METHODS OF FABRICATION
6
Patent #:
Issue Dt:
12/30/2008
Application #:
11617929
Filing Dt:
12/29/2006
Publication #:
Pub Dt:
07/03/2008
Title:
STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES
7
Patent #:
Issue Dt:
09/01/2009
Application #:
11624661
Filing Dt:
01/18/2007
Publication #:
Pub Dt:
07/24/2008
Title:
PROBING STRUCTURE WITH FINE PITCH PROBES
8
Patent #:
Issue Dt:
01/19/2010
Application #:
11635809
Filing Dt:
12/06/2006
Publication #:
Pub Dt:
10/30/2008
Title:
LOW PROFILE PROBE HAVING IMPROVED MECHANICAL SCRUB AND REDUCED CONTACT INDUCTANCE
9
Patent #:
NONE
Issue Dt:
Application #:
11668975
Filing Dt:
01/30/2007
Publication #:
Pub Dt:
05/31/2007
Title:
Inductive Heating of Microelectronic Components
10
Patent #:
NONE
Issue Dt:
Application #:
11669010
Filing Dt:
01/30/2007
Publication #:
Pub Dt:
06/07/2007
Title:
Method of Manufacturing A Probe Card
11
Patent #:
Issue Dt:
11/17/2009
Application #:
11669068
Filing Dt:
01/30/2007
Publication #:
Pub Dt:
05/31/2007
Title:
INTERCONNECT ASSEMBLIES AND METHODS
12
Patent #:
Issue Dt:
12/28/2010
Application #:
11674205
Filing Dt:
02/13/2007
Publication #:
Pub Dt:
05/29/2008
Title:
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
13
Patent #:
Issue Dt:
08/25/2009
Application #:
11674430
Filing Dt:
02/13/2007
Publication #:
Pub Dt:
05/29/2008
Title:
PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS
14
Patent #:
NONE
Issue Dt:
Application #:
11676930
Filing Dt:
02/20/2007
Publication #:
Pub Dt:
06/14/2007
Title:
Semiconductor Fuse Covering
15
Patent #:
NONE
Issue Dt:
Application #:
11690139
Filing Dt:
03/23/2007
Publication #:
Pub Dt:
09/25/2008
Title:
STIFFENING CONNECTOR AND PROBE CARD ASSEMBLY INCORPORATING SAME
16
Patent #:
Issue Dt:
11/25/2008
Application #:
11691369
Filing Dt:
03/26/2007
Publication #:
Pub Dt:
12/13/2007
Title:
ELECTRICAL CONTACTOR, ESPCECIALLY WAFER LEVEL CONTACTOR, USING FLUID PRESSURE
17
Patent #:
Issue Dt:
07/15/2008
Application #:
11692035
Filing Dt:
03/27/2007
Publication #:
Pub Dt:
10/25/2007
Title:
A COMPOSITE WIRING STRUCTURE HAVING A WIRING BLOCK AND AN INSULATING LAYER WITH ELECTRICAL CONNECTIONS TO PROBES
18
Patent #:
Issue Dt:
06/16/2009
Application #:
11696582
Filing Dt:
04/04/2007
Publication #:
Pub Dt:
08/09/2007
Title:
TESTING AN ELECTRONIC DEVICE USING TEST DATA FROM A PLURALITY OF TESTERS
19
Patent #:
Issue Dt:
01/11/2011
Application #:
11697603
Filing Dt:
04/06/2007
Publication #:
Pub Dt:
07/26/2007
Title:
COMPOSITE MOTION PROBING
20
Patent #:
NONE
Issue Dt:
Application #:
11697643
Filing Dt:
04/06/2007
Publication #:
Pub Dt:
08/02/2007
Title:
Probe For Semiconductor Devices
21
Patent #:
Issue Dt:
10/14/2008
Application #:
11701236
Filing Dt:
01/31/2007
Publication #:
Pub Dt:
01/03/2008
Title:
PROBE SKATES FOR ELECTRICAL TESTING OF CONVEX PAD TOPOLOGIES
22
Patent #:
Issue Dt:
10/23/2007
Application #:
11714003
Filing Dt:
03/05/2007
Publication #:
Pub Dt:
07/12/2007
Title:
PROBE FOR COMBINED SIGNALS
23
Patent #:
Issue Dt:
10/28/2008
Application #:
11716428
Filing Dt:
03/09/2007
Publication #:
Pub Dt:
12/13/2007
Title:
ON-WAFER TEST STRUCTURES FOR DIFFERENTIAL SIGNALS
24
Patent #:
Issue Dt:
05/19/2009
Application #:
11733562
Filing Dt:
04/10/2007
Publication #:
Pub Dt:
12/13/2007
Title:
SOCKET FOR MAKING WITH ELECTRONIC COMPONENT, PARTICULARLY SEMICONDUCTOR DEVICE WITH SPRING PACKAGING, FOR FIXTURING, TESTING, BURNING-IN OR OPERATING SUCH A COMPONENT
25
Patent #:
Issue Dt:
12/22/2009
Application #:
11736307
Filing Dt:
04/17/2007
Publication #:
Pub Dt:
08/23/2007
Title:
METHOD OF ASSEMBLING AND TESTING AN ELECTRONICS MODULE
26
Patent #:
Issue Dt:
12/02/2008
Application #:
11742960
Filing Dt:
05/01/2007
Publication #:
Pub Dt:
11/22/2007
Title:
APPARATUSES AND METHODS FOR CLEANING TEST PROBES
27
Patent #:
Issue Dt:
12/09/2008
Application #:
11748988
Filing Dt:
05/15/2007
Publication #:
Pub Dt:
11/15/2007
Title:
METHODS OF PROBING AN ELECTRONIC DEVICE
28
Patent #:
Issue Dt:
03/09/2010
Application #:
11749004
Filing Dt:
05/15/2007
Publication #:
Pub Dt:
09/13/2007
Title:
WIRELESS TEST SYSTEM
29
Patent #:
NONE
Issue Dt:
Application #:
11749084
Filing Dt:
05/15/2007
Publication #:
Pub Dt:
11/22/2007
Title:
METHOD FOR PROCESSING AN INTEGRATED CIRCUIT
30
Patent #:
NONE
Issue Dt:
Application #:
11758479
Filing Dt:
06/05/2007
Publication #:
Pub Dt:
10/04/2007
Title:
Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out
31
Patent #:
Issue Dt:
10/28/2008
Application #:
11758525
Filing Dt:
06/05/2007
Publication #:
Pub Dt:
10/04/2007
Title:
HIGH PERFORMANCE PROBE SYSTEM
32
Patent #:
Issue Dt:
02/09/2010
Application #:
11761912
Filing Dt:
06/12/2007
Publication #:
Pub Dt:
10/04/2007
Title:
MECHANICALLY RECONFIGURABLE VERTICAL TESTER INTERFACE FOR IC PROBING
33
Patent #:
Issue Dt:
08/11/2009
Application #:
11765019
Filing Dt:
06/19/2007
Publication #:
Pub Dt:
12/25/2008
Title:
METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST
34
Patent #:
Issue Dt:
07/21/2009
Application #:
11772998
Filing Dt:
07/03/2007
Publication #:
Pub Dt:
10/25/2007
Title:
PHOTORESIST FORMULATION FOR HIGH ASPECT RATIO PLATING
35
Patent #:
Issue Dt:
03/23/2010
Application #:
11773011
Filing Dt:
07/03/2007
Publication #:
Pub Dt:
12/06/2007
Title:
ADJUSTABLE DELAY TRANSMISSION LINE
36
Patent #:
NONE
Issue Dt:
Application #:
11779145
Filing Dt:
07/17/2007
Publication #:
Pub Dt:
11/08/2007
Title:
PROGRAMMABLE DEVICES TO ROUTE SIGNALS ON PROBE CARDS
37
Patent #:
NONE
Issue Dt:
Application #:
11779163
Filing Dt:
07/17/2007
Publication #:
Pub Dt:
01/17/2008
Title:
TESTER CHANNEL TO MULTIPLE IC TERMINALS
38
Patent #:
Issue Dt:
03/09/2010
Application #:
11779183
Filing Dt:
07/17/2007
Publication #:
Pub Dt:
11/22/2007
Title:
ELECTRONIC COMPONENTS WITH PLURALITY OF CONTOURED MICROELECTRONIC SPRING CONTACTS
39
Patent #:
Issue Dt:
05/11/2010
Application #:
11779188
Filing Dt:
07/17/2007
Publication #:
Pub Dt:
11/08/2007
Title:
PREDICTIVE, ADAPTIVE POWER SUPPLY FOR AN INTEGRATED CIRCUIT UNDER TEST
40
Patent #:
Issue Dt:
04/07/2009
Application #:
11786107
Filing Dt:
04/10/2007
Publication #:
Pub Dt:
10/16/2008
Title:
VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION
41
Patent #:
Issue Dt:
03/17/2009
Application #:
11786633
Filing Dt:
04/11/2007
Publication #:
Pub Dt:
08/23/2007
Title:
PROBE HOLDER FOR TESTING OF A TEST DEVICE
42
Patent #:
Issue Dt:
12/29/2009
Application #:
11786641
Filing Dt:
04/11/2007
Publication #:
Pub Dt:
08/23/2007
Title:
GUARDED TUB ENCLOSURE
43
Patent #:
Issue Dt:
03/30/2010
Application #:
11796237
Filing Dt:
04/26/2007
Publication #:
Pub Dt:
08/30/2007
Title:
WAFER PROBE
44
Patent #:
Issue Dt:
03/03/2009
Application #:
11820518
Filing Dt:
06/20/2007
Publication #:
Pub Dt:
10/25/2007
Title:
PROBE STATION WITH LOW INDUCTANCE PATH
45
Patent #:
Issue Dt:
10/14/2008
Application #:
11820519
Filing Dt:
06/20/2007
Publication #:
Pub Dt:
10/25/2007
Title:
PROBE STATION HAVING MULTIPLE ENCLOSURES
46
Patent #:
Issue Dt:
06/08/2010
Application #:
11835136
Filing Dt:
08/07/2007
Publication #:
Pub Dt:
01/24/2008
Title:
METHOD TO BUILD ROBUST MECHANICAL STRUCTURES ON SUBSTRATE SURFACES
47
Patent #:
Issue Dt:
11/03/2009
Application #:
11835151
Filing Dt:
08/07/2007
Publication #:
Pub Dt:
11/22/2007
Title:
REMOTE TEST FACILITY WITH WIRELESS INTERFACE TO LOCAL TEST FACILITIES
48
Patent #:
Issue Dt:
03/02/2010
Application #:
11839899
Filing Dt:
08/16/2007
Publication #:
Pub Dt:
02/21/2008
Title:
METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF ELECTRONIC COMPONENTS
49
Patent #:
Issue Dt:
06/15/2010
Application #:
11846012
Filing Dt:
08/28/2007
Publication #:
Pub Dt:
02/28/2008
Title:
METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTOR
50
Patent #:
Issue Dt:
07/12/2011
Application #:
11846446
Filing Dt:
08/28/2007
Publication #:
Pub Dt:
12/20/2007
Title:
BI-DIRECTIONAL BUFFER FOR INTERFACING TEST SYSTEM CHANNEL
51
Patent #:
Issue Dt:
11/23/2010
Application #:
11858057
Filing Dt:
09/19/2007
Publication #:
Pub Dt:
03/27/2008
Title:
METHOD OF REPAIRING A CONTACTOR APPARATUS
52
Patent #:
Issue Dt:
02/08/2011
Application #:
11860406
Filing Dt:
09/24/2007
Publication #:
Pub Dt:
07/03/2008
Title:
STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES
53
Patent #:
Issue Dt:
02/15/2011
Application #:
11861223
Filing Dt:
09/25/2007
Publication #:
Pub Dt:
03/26/2009
Title:
METHOD AND APPARATUS FOR TESTING DEVICES USING SERIALLY CONTROLLED RESOURCES
54
Patent #:
Issue Dt:
10/05/2010
Application #:
11861559
Filing Dt:
09/26/2007
Publication #:
Pub Dt:
03/26/2009
Title:
COMPONENT ASSEMBLY AND ALIGNMENT
55
Patent #:
NONE
Issue Dt:
Application #:
11862172
Filing Dt:
09/26/2007
Publication #:
Pub Dt:
03/26/2009
Title:
REDUCED SCRUB CONTACT ELEMENT
56
Patent #:
Issue Dt:
07/12/2011
Application #:
11862751
Filing Dt:
09/27/2007
Publication #:
Pub Dt:
04/02/2009
Title:
METHOD AND APPARATUS FOR TESTING DEVICES USING SERIALLY CONTROLLED INTELLIGENT SWITCHES
57
Patent #:
NONE
Issue Dt:
Application #:
11863443
Filing Dt:
09/28/2007
Publication #:
Pub Dt:
04/17/2008
Title:
ATTACHING AND INTERCONNECTING DIES TO A SUBSTRATE
58
Patent #:
Issue Dt:
11/30/2010
Application #:
11864690
Filing Dt:
09/28/2007
Publication #:
Pub Dt:
08/07/2008
Title:
APPARATUS FOR TESTING DEVICES
59
Patent #:
Issue Dt:
03/24/2009
Application #:
11866024
Filing Dt:
10/02/2007
Publication #:
Pub Dt:
01/31/2008
Title:
CLOSED-GRID BUS ARCHITECTURE FOR WAFER INTERCONNECT STRUCTURE
60
Patent #:
Issue Dt:
03/06/2012
Application #:
11872008
Filing Dt:
10/13/2007
Publication #:
Pub Dt:
03/12/2009
Title:
A PROBE CARD ASSEMBLY WITH CARBON NANOTUBE PROBES HAVING A SPRING MECHANISM THEREIN
61
Patent #:
Issue Dt:
09/22/2009
Application #:
11877466
Filing Dt:
10/23/2007
Publication #:
Pub Dt:
02/21/2008
Title:
APPARATUS AND METHOD FOR MANAGING THERMALLY INDUCED MOTION OF A PROBE CARD ASSEMBLY
62
Patent #:
Issue Dt:
03/15/2011
Application #:
11879865
Filing Dt:
07/18/2007
Publication #:
Pub Dt:
01/24/2008
Title:
LINE-REFLECT-REFLECT MATCH CALIBRATION
63
Patent #:
Issue Dt:
03/23/2010
Application #:
11888429
Filing Dt:
07/31/2007
Publication #:
Pub Dt:
12/13/2007
Title:
MEMBRANE PROBING SYSTEM
64
Patent #:
Issue Dt:
07/01/2008
Application #:
11888957
Filing Dt:
08/03/2007
Publication #:
Pub Dt:
11/29/2007
Title:
PROBE FOR TESTING A DEVICE UNDER TEST
65
Patent #:
Issue Dt:
06/02/2009
Application #:
11897397
Filing Dt:
08/29/2007
Publication #:
Pub Dt:
12/27/2007
Title:
MEMBRANE PROBING SYSTEM WITH LOCAL CONTACT SCRUB
66
Patent #:
Issue Dt:
07/07/2009
Application #:
11929510
Filing Dt:
10/30/2007
Publication #:
Pub Dt:
05/22/2008
Title:
METHOD OF MAKING LITHOGRAPHIC CONTACT ELEMENTS
67
Patent #:
Issue Dt:
01/26/2010
Application #:
11940354
Filing Dt:
11/15/2007
Publication #:
Pub Dt:
05/22/2008
Title:
PROBE SUPPORT WITH SHIELD FOR THE EXAMINATION OF TEST SUBSTRATES UNDER USE OF PROBE SUPPORTS
68
Patent #:
Issue Dt:
10/02/2012
Application #:
11940355
Filing Dt:
11/15/2007
Publication #:
Pub Dt:
05/22/2008
Title:
PROBE STATION FOR TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EMI SHIELDING
69
Patent #:
Issue Dt:
08/25/2009
Application #:
11943975
Filing Dt:
11/21/2007
Publication #:
Pub Dt:
06/19/2008
Title:
PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES UNDER DEFINED ATMOSPHERE
70
Patent #:
Issue Dt:
09/14/2010
Application #:
11947163
Filing Dt:
11/29/2007
Publication #:
Pub Dt:
08/07/2008
Title:
DEVICE FOR RAPIDLY CHANGING OBJECTIVES WITH THE AID OF THREADED FASTENING
71
Patent #:
Issue Dt:
02/09/2010
Application #:
11947206
Filing Dt:
11/29/2007
Publication #:
Pub Dt:
07/31/2008
Title:
METHOD AND APPARATUS FOR TESTING ELECTRONIC COMPONENTS WITHIN HORIZONTAL AND VERTICAL BOUNDARY LINES OF A WAFER
72
Patent #:
NONE
Issue Dt:
Application #:
11960396
Filing Dt:
12/19/2007
Publication #:
Pub Dt:
06/25/2009
Title:
Method and Apparatus for Managing Test Result Data Generated by a Semiconductor Test System
73
Patent #:
Issue Dt:
01/05/2010
Application #:
11963575
Filing Dt:
12/21/2007
Publication #:
Pub Dt:
04/24/2008
Title:
METHOD AND SYSTEM FOR COMPENSATING THERMALLY INDUCED MOTION OF PROBE CARDS
74
Patent #:
Issue Dt:
11/10/2009
Application #:
11975221
Filing Dt:
10/17/2007
Publication #:
Pub Dt:
02/21/2008
Title:
PROBE STATION THERMAL CHUCK WITH SHIELDING FOR CAPACITIVE CURRENT
75
Patent #:
Issue Dt:
03/02/2010
Application #:
11975743
Filing Dt:
10/19/2007
Publication #:
Pub Dt:
04/23/2009
Title:
VERTICAL GUIDED PROBE ARRAY PROVIDING SIDEWAYS SCRUB MOTION
76
Patent #:
Issue Dt:
03/10/2009
Application #:
11977050
Filing Dt:
10/23/2007
Publication #:
Pub Dt:
02/28/2008
Title:
CHUCK FOR HOLDING A DEVICE UNDER TEST
77
Patent #:
Issue Dt:
06/28/2011
Application #:
11977134
Filing Dt:
10/23/2007
Publication #:
Pub Dt:
05/06/2010
Title:
CHUCK FOR HOLDING A DEVICE UNDER TEST
78
Patent #:
Issue Dt:
02/10/2009
Application #:
11977280
Filing Dt:
10/24/2007
Publication #:
Pub Dt:
03/06/2008
Title:
SHIELDED PROBE FOR TESTING A DEVICE UNDER TEST
79
Patent #:
Issue Dt:
01/27/2009
Application #:
11977282
Filing Dt:
10/24/2007
Publication #:
Pub Dt:
03/06/2008
Title:
SHIELDED PROBE FOR TESTING A DEVICE UNDER TEST
80
Patent #:
NONE
Issue Dt:
Application #:
12001281
Filing Dt:
12/11/2007
Publication #:
Pub Dt:
05/01/2008
Title:
Intelligent probe card architecture
81
Patent #:
Issue Dt:
02/17/2009
Application #:
12008594
Filing Dt:
01/10/2008
Publication #:
Pub Dt:
05/15/2008
Title:
MEMBRANE PROBING SYSTEM
82
Patent #:
Issue Dt:
08/26/2008
Application #:
12009128
Filing Dt:
01/15/2008
Publication #:
Pub Dt:
05/15/2008
Title:
PROBE CARDS EMPLOYING PROBES HAVING RETAINING PORTIONS FOR POTTING IN A RETENTION ARRANGEMENT
83
Patent #:
NONE
Issue Dt:
Application #:
12020380
Filing Dt:
01/25/2008
Publication #:
Pub Dt:
05/22/2008
Title:
CONTACT TIP STRUCTURE FOR MICROELECTRONIC INTERCONNECTION ELEMENTS AND METHODS OF MAKING SAME
84
Patent #:
NONE
Issue Dt:
Application #:
12026466
Filing Dt:
02/05/2008
Publication #:
Pub Dt:
05/29/2008
Title:
METHOD OF MAKING AN INTERCONNECT ELEMENT FOR MICROELECTRONIC STRUCTURES
85
Patent #:
NONE
Issue Dt:
Application #:
12026471
Filing Dt:
02/05/2008
Publication #:
Pub Dt:
10/02/2008
Title:
RHODIUM ELECTROPLATED STRUCTURES AND METHODS OF MAKING SAME
86
Patent #:
NONE
Issue Dt:
Application #:
12030037
Filing Dt:
02/12/2008
Publication #:
Pub Dt:
06/05/2008
Title:
METHOD OF MAKING A SOCKET TO PERFORM TESTING ON INTEGRATED CIRCUITS AND SOCKET MADE
87
Patent #:
Issue Dt:
04/20/2010
Application #:
12034110
Filing Dt:
02/20/2008
Publication #:
Pub Dt:
06/26/2008
Title:
HIGH DENSITY PLANAR ELECTRICAL INTERFACE
88
Patent #:
NONE
Issue Dt:
Application #:
12044600
Filing Dt:
03/07/2008
Publication #:
Pub Dt:
09/10/2009
Title:
Method And Apparatus For Designing A Custom Test System
89
Patent #:
Issue Dt:
05/03/2011
Application #:
12044893
Filing Dt:
03/07/2008
Publication #:
Pub Dt:
09/10/2009
Title:
PROVIDING AN ELECTRICALLY CONDUCTIVE WALL STRUCTURE ADJACENT A CONTACT STRUCTURE OF AN ELECTRONIC DEVICE
90
Patent #:
Issue Dt:
02/21/2012
Application #:
12046009
Filing Dt:
03/11/2008
Publication #:
Pub Dt:
09/17/2009
Title:
METHOD AND APPARATUS FOR PROCESSING FAILURES DURING SEMICONDUCTOR DEVICE TESTING
91
Patent #:
Issue Dt:
07/14/2009
Application #:
12046362
Filing Dt:
03/11/2008
Publication #:
Pub Dt:
06/26/2008
Title:
ALIGNMENT FEATURES IN A PROBING DEVICE
92
Patent #:
Issue Dt:
08/14/2012
Application #:
12048323
Filing Dt:
03/14/2008
Publication #:
Pub Dt:
09/18/2008
Title:
CHUCK WITH TRIAXIAL CONSTRUCTION
93
Patent #:
Issue Dt:
03/30/2010
Application #:
12050857
Filing Dt:
03/18/2008
Publication #:
Pub Dt:
07/03/2008
Title:
WAFER-LEVEL BURN-IN AND TEST
94
Patent #:
Issue Dt:
05/11/2010
Application #:
12054289
Filing Dt:
03/24/2008
Publication #:
Pub Dt:
09/25/2008
Title:
CONTACT CARRIERS (TILES) FOR POPULATING LARGER SUBSTRATES WITH SPRING CONTACTS
95
Patent #:
Issue Dt:
11/10/2009
Application #:
12060753
Filing Dt:
04/01/2008
Publication #:
Pub Dt:
07/31/2008
Title:
PROBE CARD ASSEMBLY AND KIT
96
Patent #:
Issue Dt:
04/07/2009
Application #:
12075341
Filing Dt:
03/10/2008
Publication #:
Pub Dt:
07/03/2008
Title:
PROBE HEAD HAVING A MEMBRANE SUSPENDED PROBE
97
Patent #:
Issue Dt:
03/20/2012
Application #:
12106364
Filing Dt:
04/21/2008
Publication #:
Pub Dt:
10/22/2009
Title:
SWITCH FOR USE IN MICROELECTROMECHANICAL SYSTEMS (MEMS) AND MEMS DEVICES INCORPORATING SAME
98
Patent #:
Issue Dt:
09/10/2013
Application #:
12106369
Filing Dt:
04/21/2008
Publication #:
Pub Dt:
10/22/2009
Title:
MULTI-STAGE SPRING SYSTEM
99
Patent #:
Issue Dt:
06/21/2011
Application #:
12106372
Filing Dt:
04/21/2008
Publication #:
Pub Dt:
10/22/2009
Title:
SELF-MONITORING SWITCH
100
Patent #:
Issue Dt:
09/08/2009
Application #:
12107645
Filing Dt:
04/22/2008
Publication #:
Pub Dt:
08/14/2008
Title:
ISOLATION BUFFERS WITH CONTROLLED EQUAL TIME DELAYS
Assignors
1
Exec Dt:
06/24/2016
2
Exec Dt:
06/24/2016
3
Exec Dt:
06/24/2016
4
Exec Dt:
06/24/2016
Assignee
1
601 MONTGOMERY STREET, SUITE 1500
SAN FRANCISCO, CALIFORNIA 94111
Correspondence name and address
STEWART WALSH
1025 VERMONT AVE NW, SUITE 1130
NATIONAL CORPORATE RESEARCH, LTD
WASHINGTON, DC 20005

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