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Reel/Frame:	039184/0280			Pages:	68
		Recorded:	07/12/2016
Attorney Dkt #:	F164159
Conveyance:	SECURITY INTEREST IN UNITED STATES PATENTS AND TRADEMARKS

Total properties: 679
Page 7 of 7
Pages: 1 2 3 4 5 6 7

1

Patent #:	NONE	Issue Dt:		Application #:	12766101	Filing Dt:	04/23/2010
Publication #:	US20100263432	Pub Dt:	10/21/2010
Title:	METHODS FOR PLANARIZING A SEMICONDUCTOR CONTACTOR

2

Patent #:	8638113	Issue Dt:	01/28/2014	Application #:	12773117	Filing Dt:	05/04/2010
Publication #:	US20110018566	Pub Dt:	01/27/2011
Title:	TEMPORARY PLANAR ELECTRICAL CONTACT DEVICE AND METHOD USING VERTICALLY-COMPRESSIBLE NANOTUBE CONTACT STRUCTURES

3

Patent #:	8203353	Issue Dt:	06/19/2012	Application #:	12777827	Filing Dt:	05/11/2010
Publication #:	US20100289512	Pub Dt:	11/18/2010
Title:	PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE

4

Patent #:	8203351	Issue Dt:	06/19/2012	Application #:	12782904	Filing Dt:	05/19/2010
Publication #:	US20100225344	Pub Dt:	09/09/2010
Title:	PROBING APPARATUS WITH GUARDED SIGNAL TRACES

5

Patent #:	7967621	Issue Dt:	06/28/2011	Application #:	12783379	Filing Dt:	05/19/2010
Publication #:	US20100297863	Pub Dt:	11/25/2010
Title:	ELECTRICAL CONTACTOR, ESPECIALLY WAFER LEVEL CONTACTOR, USING FLUID PRESSURE

6

Patent #:	8383958	Issue Dt:	02/26/2013	Application #:	12783967	Filing Dt:	05/20/2010
Publication #:	US20100224303	Pub Dt:	09/09/2010
Title:	METHOD TO BUILD ROBUST MECHANICAL STRUCTURES ON SUBSTRATE SURFACES

7

Patent #:	8513969	Issue Dt:	08/20/2013	Application #:	12796457	Filing Dt:	06/08/2010
Publication #:	US20100244873	Pub Dt:	09/30/2010
Title:	APPARATUS AND METHOD OF TESTING SINGULATED DIES

8

Patent #:	8344744	Issue Dt:	01/01/2013	Application #:	12818442	Filing Dt:	06/18/2010
Publication #:	US20110227602	Pub Dt:	09/22/2011
Title:	PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING

9

Patent #:	8451017	Issue Dt:	05/28/2013	Application #:	12818521	Filing Dt:	06/18/2010
Publication #:	US20100271060	Pub Dt:	10/28/2010
Title:	MEMBRANE PROBING METHOD USING IMPROVED CONTACT

10

Patent #:	8072586	Issue Dt:	12/06/2011	Application #:	12847723	Filing Dt:	07/30/2010
Publication #:	US20110013011	Pub Dt:	01/20/2011
Title:	ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION ON A PROBER

11

Patent #:	9030222	Issue Dt:	05/12/2015	Application #:	12852337	Filing Dt:	08/06/2010
Publication #:	US20100323551	Pub Dt:	12/23/2010
Title:	SHARPENED, ORIENTED CONTACT TIP STRUCTURES

12

Patent #:	8203352	Issue Dt:	06/19/2012	Application #:	12861984	Filing Dt:	08/24/2010
Publication #:	US20100315111	Pub Dt:	12/16/2010
Title:	SINGLE SUPPORT STRUCTURE PROBE GROUP WITH STAGGERED MOUNTING PATTERN

13

Patent #:	8907689	Issue Dt:	12/09/2014	Application #:	12871420	Filing Dt:	08/30/2010
Publication #:	US20110006796	Pub Dt:	01/13/2011
Title:	PROBE RETENTION ARRANGEMENT

14

Patent #:	8988091	Issue Dt:	03/24/2015	Application #:	12880808	Filing Dt:	09/13/2010
Publication #:	US20110062978	Pub Dt:	03/17/2011
Title:	MULTIPLE CONTACT PROBES

15

Patent #:	RE43503	Issue Dt:	07/10/2012	Application #:	12903566	Filing Dt:	10/13/2010
Title:	PROBE SKATES FOR ELECTRICAL TESTING OF CONVEX PAD TOPOLOGIES

16

Patent #:	8829937	Issue Dt:	09/09/2014	Application #:	12931260	Filing Dt:	01/27/2011
Publication #:	US20120194212	Pub Dt:	08/02/2012
Title:	FINE PITCH GUIDED VERTICAL PROBE ARRAY HAVING ENCLOSED PROBE FLEXURES

17

Patent #:	8513965	Issue Dt:	08/20/2013	Application #:	12938164	Filing Dt:	11/02/2010
Publication #:	US20110043240	Pub Dt:	02/24/2011
Title:	METHOD AND APPARATUS FOR PROVIDING ACTIVE COMPLIANCE IN A PROBE CARD ASSEMBLY

18

Patent #:	8485418	Issue Dt:	07/16/2013	Application #:	12942709	Filing Dt:	11/09/2010
Publication #:	US20110057018	Pub Dt:	03/10/2011
Title:	METHOD OF WIREBONDING THAT UTILIZES A GAS FLOW WITHIN A CAPILLARY FROM WHICH A WIRE IS PLAYED OUT

19

Patent #:	9081037	Issue Dt:	07/14/2015	Application #:	12952440	Filing Dt:	11/23/2010
Publication #:	US20110067231	Pub Dt:	03/24/2011
Title:	ATTACHMENT OF AN ELECTRICAL ELEMENT TO AN ELECTRONIC DEVICE USING A CONDUCTIVE MATERIAL

20

Patent #:	8736294	Issue Dt:	05/27/2014	Application #:	12967302	Filing Dt:	12/14/2010
Publication #:	US20120146679	Pub Dt:	06/14/2012
Title:	PROBE CARD STIFFENER WITH DECOUPLING

21

Patent #:	8513942	Issue Dt:	08/20/2013	Application #:	12974152	Filing Dt:	12/21/2010
Title:	METHOD OF FORMING A PROBE SUBSTRATE BY LAYERING PROBE ROW STRUCTURES AND PROBE SUBSTRATES FORMED THEREBY

22

Patent #:	8872532	Issue Dt:	10/28/2014	Application #:	12979200	Filing Dt:	12/27/2010
Publication #:	US20110156735	Pub Dt:	06/30/2011
Title:	WAFER TEST CASSETTE SYSTEM

23

Patent #:	8697301	Issue Dt:	04/15/2014	Application #:	13015848	Filing Dt:	01/28/2011
Publication #:	US20110189564	Pub Dt:	08/04/2011
Title:	FUEL CELL USING CARBON NANOTUBES

24

Patent #:	8120373	Issue Dt:	02/21/2012	Application #:	13022443	Filing Dt:	02/07/2011
Publication #:	US20110128029	Pub Dt:	06/02/2011
Title:	STIFFENER ASSEMBLY FOR USE WITH TESTING DEVICES

25

Patent #:	8167648	Issue Dt:	05/01/2012	Application #:	13030961	Filing Dt:	02/18/2011
Publication #:	US20110207370	Pub Dt:	08/25/2011
Title:	A LOW NOISE CONNECTOR WITH CABLES HAVING A CENTER, MIDDLE AND OUTER CONDUCTORS

26

Patent #:	NONE	Issue Dt:		Application #:	13073585	Filing Dt:	03/28/2011
Publication #:	US20110171838	Pub Dt:	07/14/2011
Title:	SEGMENTED CONTACTOR

27

Patent #:	8427183	Issue Dt:	04/23/2013	Application #:	13092709	Filing Dt:	04/22/2011
Publication #:	US20110193583	Pub Dt:	08/11/2011
Title:	PROBE CARD ASSEMBLY HAVING AN ACTUATOR FOR BENDING THE PROBE SUBSTRATE

28

Patent #:	8841932	Issue Dt:	09/23/2014	Application #:	13094604	Filing Dt:	04/26/2011
Publication #:	US20110316574	Pub Dt:	12/29/2011
Title:	PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

29

Patent #:	8415963	Issue Dt:	04/09/2013	Application #:	13108368	Filing Dt:	05/16/2011
Publication #:	US20110273198	Pub Dt:	11/10/2011
Title:	LOW PROFILE PROBE HAVING IMPROVED MECHANICAL SCRUB AND REDUCED CONTACT INDUCTANCE

30

Patent #:	8324923	Issue Dt:	12/04/2012	Application #:	13118952	Filing Dt:	05/31/2011
Publication #:	US20110273199	Pub Dt:	11/10/2011
Title:	VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION

31

Patent #:	8692567	Issue Dt:	04/08/2014	Application #:	13119145	Filing Dt:	06/20/2011
Publication #:	US20110241711	Pub Dt:	10/06/2011
Title:	METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THERMAL CONDITIONS

32

Patent #:	8368413	Issue Dt:	02/05/2013	Application #:	13119916	Filing Dt:	05/26/2011
Publication #:	US20110221461	Pub Dt:	09/15/2011
Title:	METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UNDER DEFINED THERMAL CONDITIONS

33

Patent #:	8896336	Issue Dt:	11/25/2014	Application #:	13172001	Filing Dt:	06/29/2011
Publication #:	US20120007626	Pub Dt:	01/12/2012
Title:	TESTING TECHNIQUES FOR THROUGH-DEVICE VIAS

34

Patent #:	8872534	Issue Dt:	10/28/2014	Application #:	13179185	Filing Dt:	07/08/2011
Publication #:	US20110267085	Pub Dt:	11/03/2011
Title:	METHOD AND APPARATUS FOR TESTING DEVICES USING SERIALLY CONTROLLED INTELLIGENT SWITCHES

35

Patent #:	8680879	Issue Dt:	03/25/2014	Application #:	13209171	Filing Dt:	08/12/2011
Publication #:	US20110291680	Pub Dt:	12/01/2011
Title:	CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATION SUBSTRATE

36

Patent #:	9052342	Issue Dt:	06/09/2015	Application #:	13250756	Filing Dt:	09/30/2011
Publication #:	US20130082729	Pub Dt:	04/04/2013
Title:	PROBE WITH CANTILEVERED BEAM HAVING SOLID AND HOLLOW SECTIONS

37

Patent #:	8872176	Issue Dt:	10/28/2014	Application #:	13253665	Filing Dt:	10/05/2011
Publication #:	US20120086004	Pub Dt:	04/12/2012
Title:	ELASTIC ENCAPSULATED CARBON NANOTUBE BASED ELECTRICAL CONTACTS

38

Patent #:	8823406	Issue Dt:	09/02/2014	Application #:	13275107	Filing Dt:	10/17/2011
Publication #:	US20120098559	Pub Dt:	04/26/2012
Title:	SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY OF DEVICES UNDER TEST

39

Patent #:	8970240	Issue Dt:	03/03/2015	Application #:	13287794	Filing Dt:	11/02/2011
Publication #:	US20120112779	Pub Dt:	05/10/2012
Title:	RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOSERS, AND METHODS FOR USING AND FORMING THE SAME

40

Patent #:	9702904	Issue Dt:	07/11/2017	Application #:	13288925	Filing Dt:	11/03/2011
Publication #:	US20120242363	Pub Dt:	09/27/2012
Title:	NON-LINEAR VERTICAL LEAF SPRING

41

Patent #:	8922229	Issue Dt:	12/30/2014	Application #:	13380484	Filing Dt:	03/06/2012
Publication #:	US20120146676	Pub Dt:	06/14/2012
Title:	METHOD FOR MEASUREMENT OF A POWER DEVICE

42

Patent #:	9037432	Issue Dt:	05/19/2015	Application #:	13418532	Filing Dt:	03/13/2012
Publication #:	US20120239339	Pub Dt:	09/20/2012
Title:	WIRELESS PROBE CARD VERIFICATION SYSTEM AND METHOD

43

Patent #:	9476911	Issue Dt:	10/25/2016	Application #:	13424031	Filing Dt:	03/19/2012
Publication #:	US20120286816	Pub Dt:	11/15/2012
Title:	PROBES WITH HIGH CURRENT CARRYING CAPABILITY AND LASER MACHINING METHODS

44

Patent #:	8706289	Issue Dt:	04/22/2014	Application #:	13429289	Filing Dt:	03/23/2012
Publication #:	US20120185078	Pub Dt:	07/19/2012
Title:	PRE-ALIGNER SEARCH

45

Patent #:	9244099	Issue Dt:	01/26/2016	Application #:	13463712	Filing Dt:	05/03/2012
Publication #:	US20120286817	Pub Dt:	11/15/2012
Title:	PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING THE SAME, AND METHODS OF OPERATING THE SAME

46

Patent #:	9372214	Issue Dt:	06/21/2016	Application #:	13484548	Filing Dt:	05/31/2012
Publication #:	US20120306587	Pub Dt:	12/06/2012
Title:	HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT UTILIZE HIGH FREQUENCY INTERCONNECT STRUCTURES, AND METHODS OF OPERATING THE SAME

47

Patent #:	9121868	Issue Dt:	09/01/2015	Application #:	13526759	Filing Dt:	06/19/2012
Publication #:	US20120313660	Pub Dt:	12/13/2012
Title:	PROBES WITH OFFSET ARM AND SUSPENSION STRUCTURE

48

Patent #:	9250266	Issue Dt:	02/02/2016	Application #:	13557879	Filing Dt:	07/25/2012
Publication #:	US20120313621	Pub Dt:	12/13/2012
Title:	PROBE BONDING METHOD HAVING IMPROVED CONTROL OF BONDING MATERIAL

49

Patent #:	9435858	Issue Dt:	09/06/2016	Application #:	13634009	Filing Dt:	09/11/2012
Publication #:	US20130010099	Pub Dt:	01/10/2013
Title:	FOCUSING OPTICAL SYSTEMS AND METHODS FOR TESTING SEMICONDUCTORS

50

Patent #:	9110131	Issue Dt:	08/18/2015	Application #:	13640432	Filing Dt:	10/10/2012
Publication #:	US20130027070	Pub Dt:	01/31/2013
Title:	METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE TIPS

51

Patent #:	10359447	Issue Dt:	07/23/2019	Application #:	13665247	Filing Dt:	10/31/2012
Publication #:	US20140118016	Pub Dt:	05/01/2014
Title:	Probes With Spring Mechanisms For Impeding Unwanted Movement In Guide Holes

52

Patent #:	9229029	Issue Dt:	01/05/2016	Application #:	13681896	Filing Dt:	11/20/2012
Publication #:	US20130135001	Pub Dt:	05/30/2013
Title:	Hybrid Electrical Contactor

53

Patent #:	10266402	Issue Dt:	04/23/2019	Application #:	13681967	Filing Dt:	11/20/2012
Publication #:	US20140139250	Pub Dt:	05/22/2014
Title:	Contactor Devices With Carbon Nanotube Probes Embedded In A Flexible Film And Processes Of Making Such

54

Patent #:	NONE	Issue Dt:		Application #:	13693338	Filing Dt:	12/04/2012
Publication #:	US20130096866	Pub Dt:	04/18/2013
Title:	Method And Apparatus For Designing A Custom Test System

55

Patent #:	9274143	Issue Dt:	03/01/2016	Application #:	13693971	Filing Dt:	12/04/2012
Publication #:	US20130093450	Pub Dt:	04/18/2013
Title:	VERTICAL PROBE ARRAY ARRANGED TO PROVIDE SPACE TRANSFORMATION

56

Patent #:	9506973	Issue Dt:	11/29/2016	Application #:	13702054	Filing Dt:	12/04/2012
Publication #:	US20130075982	Pub Dt:	03/28/2013
Title:	HIGH VOLTAGE CHUCK FOR A PROBE STATION

57

Patent #:	8756802	Issue Dt:	06/24/2014	Application #:	13731259	Filing Dt:	12/31/2012
Publication #:	US20130140057	Pub Dt:	06/06/2013
Title:	Carbon Nanotube Contact Structures For Use With Semiconductor Dies And Other Electronic Devices

58

Patent #:	10006938	Issue Dt:	06/26/2018	Application #:	13732922	Filing Dt:	01/02/2013
Publication #:	US20130169301	Pub Dt:	07/04/2013
Title:	Probes With Programmable Motion

59

Patent #:	9194885	Issue Dt:	11/24/2015	Application #:	13820098	Filing Dt:	09/23/2013
Publication #:	US20140145743	Pub Dt:	05/29/2014
Title:	MODULAR PROBER AND METHOD FOR OPERATING SAME

60

Patent #:	NONE	Issue Dt:		Application #:	13822611	Filing Dt:	03/12/2013
Publication #:	US20130183898	Pub Dt:	07/18/2013
Title:	SYSTEMS AND METHODS FOR NON-CONTACT POWER AND DATA TRANSFER IN ELECTRONIC DEVICES

61

Patent #:	9523715	Issue Dt:	12/20/2016	Application #:	13856091	Filing Dt:	04/03/2013
Publication #:	US20130271175	Pub Dt:	10/17/2013
Title:	Wiring Substrate With Filled Vias To Accommodate Custom Terminals

62

Patent #:	9395411	Issue Dt:	07/19/2016	Application #:	13953545	Filing Dt:	07/29/2013
Publication #:	US20140028337	Pub Dt:	01/30/2014
Title:	METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITIONS AND THERMALLY CONDITIONABLE PROBER

63

Patent #:	NONE	Issue Dt:		Application #:	13963402	Filing Dt:	08/09/2013
Publication #:	US20140044985	Pub Dt:	02/13/2014
Title:	PROBE FABRICATION USING COMBINED LASER AND MICRO-FABRICATION TECHNOLOGIES

64

Patent #:	NONE	Issue Dt:		Application #:	13963567	Filing Dt:	08/09/2013
Publication #:	US20140043054	Pub Dt:	02/13/2014
Title:	VERTICAL PROBES FOR MULTI-PITCH FULL GRID CONTACT ARRAY

65

Patent #:	9470753	Issue Dt:	10/18/2016	Application #:	14071388	Filing Dt:	11/04/2013
Publication #:	US20140125363	Pub Dt:	05/08/2014
Title:	SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW POWER OUTPUT DRIVERS

66

Patent #:	9377423	Issue Dt:	06/28/2016	Application #:	14141781	Filing Dt:	12/27/2013
Publication #:	US20140185649	Pub Dt:	07/03/2014
Title:	SYSTEMS AND METHODS FOR HANDLING SUBSTRATES AT BELOW DEW POINT TEMPERATURES

67

Patent #:	9373533	Issue Dt:	06/21/2016	Application #:	14141812	Filing Dt:	12/27/2013
Publication #:	US20140186145	Pub Dt:	07/03/2014
Title:	SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSING SYSTEM

68

Patent #:	9632108	Issue Dt:	04/25/2017	Application #:	14243640	Filing Dt:	04/02/2014
Publication #:	US20140239991	Pub Dt:	08/28/2014
Title:	METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THERMAL CONDITIONS

69

Patent #:	9588139	Issue Dt:	03/07/2017	Application #:	14270235	Filing Dt:	05/05/2014
Publication #:	US20140327461	Pub Dt:	11/06/2014
Title:	Probe Card Assembly For Testing Electronic Devices

70

Patent #:	9689915	Issue Dt:	06/27/2017	Application #:	14274889	Filing Dt:	05/12/2014
Publication #:	US20140340103	Pub Dt:	11/20/2014
Title:	AUTOMATED ATTACHING AND DETACHING OF AN INTERCHANGEABLE PROBE HEAD

71

Patent #:	10132833	Issue Dt:	11/20/2018	Application #:	14327254	Filing Dt:	07/09/2014
Publication #:	US20150015289	Pub Dt:	01/15/2015
Title:	MULTIPATH ELECTRICAL PROBE AND PROBE ASSEMBLIES WITH SIGNAL PATHS THROUGH SECONDARY PATHS BETWEEN ELECTRICALLY CONDUCTIVE GUIDE PLATES

72

Patent #:	9983232	Issue Dt:	05/29/2018	Application #:	14491606	Filing Dt:	09/19/2014
Publication #:	US20150008948	Pub Dt:	01/08/2015
Title:	PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

73

Patent #:	9310428	Issue Dt:	04/12/2016	Application #:	14564991	Filing Dt:	12/09/2014
Publication #:	US20150091596	Pub Dt:	04/02/2015
Title:	PROBE RETENTION ARRANGEMENT

74

Patent #:	9099449	Issue Dt:	08/04/2015	Application #:	14592749	Filing Dt:	01/08/2015
Publication #:	US20150114925	Pub Dt:	04/30/2015
Title:	RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOSERS, AND METHODS FOR USING AND FORMING THE SAME

75

Patent #:	10281518	Issue Dt:	05/07/2019	Application #:	14625385	Filing Dt:	02/18/2015
Publication #:	US20150241472	Pub Dt:	08/27/2015
Title:	SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES

76

Patent #:	9991152	Issue Dt:	06/05/2018	Application #:	14631131	Filing Dt:	02/25/2015
Publication #:	US20150255322	Pub Dt:	09/10/2015
Title:	WAFER-HANDLING END EFFECTORS WITH WAFER-CONTACTING SURFACES AND SEALING STRUCTURES

77

Patent #:	9316670	Issue Dt:	04/19/2016	Application #:	14664220	Filing Dt:	03/20/2015
Publication #:	US20150192615	Pub Dt:	07/09/2015
Title:	MULTIPLE CONTACT PROBES

78

Patent #:	9874585	Issue Dt:	01/23/2018	Application #:	14788288	Filing Dt:	06/30/2015
Publication #:	US20150301082	Pub Dt:	10/22/2015
Title:	RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOSERS, AND METHODS FOR USING AND FORMING THE SAME

79

Patent #:	9989558	Issue Dt:	06/05/2018	Application #:	14972705	Filing Dt:	12/17/2015
Publication #:	US20160103153	Pub Dt:	04/14/2016
Title:	PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING THE SAME, AND METHODS OF OPERATING THE SAME

Assignors

1

FORMFACTOR, INC.

Exec Dt:

06/24/2016

2

ASTRIA SEMICONDUCTOR HOLDINGS, INC.

Exec Dt:

06/24/2016

3

CASCADE MICROTECH, INC.

Exec Dt:

06/24/2016

4

MICRO-PROBE INCORPORATED

Exec Dt:

06/24/2016

Assignee

1

HSBC BANK USA, NATIONAL ASSOCIATION

601 MONTGOMERY STREET, SUITE 1500

SAN FRANCISCO, CALIFORNIA 94111

Correspondence name and address
	STEWART WALSH
	1025 VERMONT AVE NW, SUITE 1130
	NATIONAL CORPORATE RESEARCH, LTD
	WASHINGTON, DC 20005

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