Patent Assignment Details
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Reel/Frame: | 044509/0403 | |
| Pages: | 18 |
| | Recorded: | 12/30/2017 | | |
Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/05/2019
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Application #:
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15857691
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Filing Dt:
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12/29/2017
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Title:
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Method for Processing a Semiconductor Wafer Using Non-Contact Electrical Measurements Indicative of a Resistance Through a Stitch, Where Such Measurements Are Obtained by Scanning a Pad Comprised of at Least Three Parallel Conductive Stripes Using a Moving Stage with Beam Deflection to Account for Motion of the Stage
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Assignee
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333 W. SAN CARLOS ST. |
STE 1000 |
SAN JOSE, CALIFORNIA 95110 |
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Correspondence name and address
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DAVID GARROD, PH.D., ESQ.
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711 IVY STREET
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PITTSBURGH, PA 15232
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05/29/2024 03:43 PM
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