Patent Assignment Details
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| Reel/Frame: | 016414/0601 | |
| Pages: | 4 |
| | Recorded: | 04/01/2005 | | |
| Attorney Dkt #: | TWI-27010 |
| Conveyance: | ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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02/12/2008
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Application #:
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11067961
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Filing Dt:
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02/28/2005
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Publication #:
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Pub Dt:
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09/08/2005
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Title:
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METHOD FOR MEASURING ION-IMPLANTED SEMICONDUCTORS WITH IMPROVED REPEATABILITY
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Assignee
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| 1250 RELIANCE WAY |
| FREMONT, CALIFORNIA 94539 |
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Correspondence name and address
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STALLMAN & POLLOCK LLP
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ATTN: MICHAEL A. STALLMAN
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353 SACRAMENTO STREET, SUITE 2200
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SAN FRANCISCO, CA 94111
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