Patent Assignment Details
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Reel/Frame: | 027153/0624 | |
| Pages: | 4 |
| | Recorded: | 11/01/2011 | | |
Attorney Dkt #: | A 051213US |
Conveyance: | CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). |
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Total properties:
1
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Patent #:
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Issue Dt:
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12/30/2003
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Application #:
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09425834
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Filing Dt:
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10/21/1999
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Title:
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METHOD FOR DETERMINING WAFER MISALIGNMENT USING A PATTERN ON A FINE ALIGNMENT TARGET
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Assignee
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1251 AVENUE OF THE AMERICAS |
NEW YORK, NEW YORK 10020 |
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Correspondence name and address
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PETER STEPHEN ZAWILSKI
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NXP INTELLECTUAL PROPERTY & LICENSING
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411 PLUMERIA DRIVE M/S-41
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SAN JOSE, CA 95134
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