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Reel/Frame:017574/0828   Pages: 5
Recorded: 05/04/2006
Attorney Dkt #:24061.725
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 1
1
Patent #:
Issue Dt:
04/15/2008
Application #:
11378833
Filing Dt:
03/17/2006
Publication #:
Pub Dt:
05/03/2007
Title:
METHOD AND SYSTEM FOR VIRTUAL METROLOGY IN SEMICONDUCTOR MANUFACTURING
Assignors
1
Exec Dt:
03/02/2006
2
Exec Dt:
03/02/2006
3
Exec Dt:
03/02/2006
4
Exec Dt:
03/02/2006
Assignee
1
NO. 8, LI-HSIN RD. 6
SCIENCE-BASED INDUSTRIAL PARK
HSIN-CHU, TAIWAN 300-77
Correspondence name and address
HAYNES AND BOONE, LLP
901 MAIN STREET, SUITE 3100
DALLAS, TX 75202

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