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Patent Assignment Details
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Reel/Frame:014836/0941   Pages: 3
Recorded: 12/30/2003
Conveyance: ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Total properties: 4
1
Patent #:
Issue Dt:
04/06/1999
Application #:
08789955
Filing Dt:
01/30/1997
Title:
METHOD AND APPARATUS FOR FEATURE DETECTION IN A WORKPIECE
2
Patent #:
Issue Dt:
04/15/2003
Application #:
09759792
Filing Dt:
01/12/2001
Publication #:
Pub Dt:
07/18/2002
Title:
METHOD AND APPARATUS FOR ILLUMINATING PROJECTING FEATURES ON THE SURFACE OF A SEMICONDUCTOR WAFER
3
Patent #:
NONE
Issue Dt:
Application #:
10047980
Filing Dt:
01/11/2002
Publication #:
Pub Dt:
10/31/2002
Title:
Method and apparatus for generating values for selected pixels used in evaluating semiconductor wafer bumps
4
Patent #:
NONE
Issue Dt:
Application #:
10194951
Filing Dt:
07/11/2002
Publication #:
Pub Dt:
02/06/2003
Title:
Method and apparatus for determining the location of an alignment mark on a wafer
Assignor
1
Exec Dt:
11/06/2003
Assignee
1
2121 NE JACK LONDON STREET
CORVALLIS, OREGON 97330
Correspondence name and address
LORELEI G. GRAHAM
20 QUEEN STREET WEST
SUITE 2500
TORONTO, ON M5H 3S1

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