Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
Total Assignments:
1
|
Patent #:
|
|
Issue Dt:
|
04/30/2019
|
Application #:
|
15356450
|
Filing Dt:
|
11/18/2016
|
Publication #:
|
|
Pub Dt:
|
05/24/2018
| | | | |
Inventors:
|
Hung-Wen Cho, Chaos Tsai, Wen-Chen Lu, Feng-Jia Shiu
|
Title:
|
ASSISTANT PATTERN FOR MEASURING CRITICAL DIMENSION OF MAIN PATTERN IN SEMICONDUCTOR MANUFACTURING
|
|
Assignment:
1
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
NO. 8, LI-HSIN RD. 6 |
SCIENCE-BASED INDUSTRIAL PARK |
HSIN-CHU, TAIWAN 300-77 |
|
|
|
HAYNES AND BOONE, LLP IP SECTION |
2323 VICTORY AVENUE |
SUITE 700 |
DALLAS, TX 75219 |
|
|
Search Results as of:
05/23/2024 05:27 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|