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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/28/2019
Application #:
14858049
Filing Dt:
09/18/2015
Publication #:
Pub Dt:
03/23/2017
Inventors:
Peng-Ren CHEN, Shiang-Bau WANG, Wen-Hao CHENG, Yung-Jung CHANG, Wei-Chung HU, Yi-An HUANG et al
Title:
METHOD AND SYSTEM FOR DIAGNOSING A SEMICONDUCTOR WAFER
Assignment: 1
Reel/Frame:
036668/0127Recorded: 09/28/2015Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/10/2015
Exec Dt:
09/10/2015
Exec Dt:
09/10/2015
Exec Dt:
09/16/2015
Exec Dt:
09/10/2015
Exec Dt:
09/10/2015
Exec Dt:
09/10/2015
Assignee:
NO. 8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK
HSINCHU, TAIWAN 300-78
Correspondent:
MCCLURE, QUALEY & RODACK, LLP
3100 INTERSTATE NORTH CIRCLE
SUITE 150
ATLANTA, GA 30339

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