Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/06/2019
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Application #:
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15969247
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Filing Dt:
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05/02/2018
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Publication #:
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Pub Dt:
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09/06/2018
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Inventors:
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Choonshik LEEM, Jihye Lee, Deokyong Kim, Soobok Chin
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Title:
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METHOD AND SYSTEM OF MEASURING SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
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Assignment:
1
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LICENSE (SEE DOCUMENT FOR DETAILS).
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| 2711 CENTERVILLE ROAD |
| SUITE 400 |
| CITY OF WILMINGTON, COUNTY OF NEW CASTLE, DELAWARE 19808 |
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| SUGHRUE MION, PLLC |
| 2000 PENNSYLVANIA AVE N.W. |
| SUITE 900 |
| WASHINGTON, DC 20006 |
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