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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
12/13/1983
Application #:
06295417
Filing Dt:
08/24/1981
Inventor:
ANDREW C. TICKLE
Title:
METHOD OF DETECTING AND REPAIRING LATENT DEFECTS IN A SEMICONDUCTOR DIELECTRIC LAYER
Assignment: 1
Reel/Frame:
003912/0927Recorded: 08/24/1981Pages: 1
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignor:
Exec Dt:
08/07/1981
Assignee:
Correspondent:
MICHAEL J. POLLOCK
464 ELLIS ST., MS 20-2486
MT. VIEW, CA 94042
Assignment: 2
Reel/Frame:
008059/0846Recorded: 08/05/1996Pages: 19
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
07/26/1996
Assignee:
M/S D3-579
2900 SEMICONDUCTOR DRIVE
SANTA CLARA, CALIFORNIA 95051
Correspondent:
LIMBACH & LIMBACH L.L.P.
MICHAEL J. POLLOCK
2001 FERRY BUILDING
SAN FRANCISCO, CALIFORNIA 94111

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