Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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08/15/1989
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Application #:
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07163002
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Filing Dt:
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03/02/1988
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Inventors:
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DAVID C. LOOK, EILEEN PIMENTEL
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Title:
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METHOD AND APPARATUS FOR MEASURING AVERAGE RESISTIVITY AND HALL- EFFECT OF SEMICONDUCTOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| COLONEL GLENN HIGHWAY |
| DAYTON, OHIO 45435 |
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| KILLWORTH, GOTTMAN, HAGAN, ET AL |
| 2050 ONE FIRST NATIONAL PLAZA |
| DAYTON, OHIO 45402 |
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Assignment:
2
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CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
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| ROOM 100 |
| 2240 B STREET |
| WRIGHT-PATTERSON AFB, OHIO 45433 |
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| AFMC LO/JAZ |
| FREDRIC L. SINDER |
| 2240 B STREET |
| ROOM 100 |
| WRIGHT-PATTERSON AFB, OH 45433-7109 |
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