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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
5008542
Issue Dt:
04/16/1991
Application #:
07456924
Filing Dt:
12/20/1989
Inventors:
DAVID C. LOOK, JAMES S. SEWELL, MILLARD G. MIER, JOHN R. SIZELOVE, DENNIS C. WALTERS et al
Title:
METHOD AND SYSTEM FOR AUTOMATED MEASUREMENT OF WHOLE-WAFER ETCH PIT DENSITY IN GAAS
Assignment: 1
Reel/Frame:
005219/0982Recorded: 02/01/1990Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST. SUBJECTED TO THE LICENSE REICTED.
Assignors:
LOOK, DAVID C.
Exec Dt:
12/15/1989
WALTERS, DENNIS C.
Exec Dt:
12/15/1989
WRIGHT STATE UNIVERSITY
Exec Dt:
12/27/1989
Assignee:
UNITED STATES OF AMERICA, THE, AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE
Correspondent:
DONALD J. SINGER
HQ USAF/JACP
1900 HALF ST., S. W.
WASHINGTON, DC 20324
Assignment: 2
Reel/Frame:
005219/0984Recorded: 02/01/1990Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST.
Assignors:
SEWELL, JAMES S.
Exec Dt:
12/15/1989
MIER, MILLARD G.
Exec Dt:
12/15/1989
SIZELOVE, JOHN R.
Exec Dt:
12/15/1989
DUDLEY, SCOTT C.
Exec Dt:
12/19/1989
Assignee:
UNITED STATES OF AMERICA, THE, AS REPRESENTED BY THE SECRETARY OF THE AIR FORCE
Correspondent:
DONALD J. SINGER
HQ USAF/JACP
1900 HALF ST., S. W.
WASHINGTON, DC 20324

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