Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/19/1993
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Application #:
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07382190
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Filing Dt:
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07/20/1989
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Inventors:
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FRED H. POLLAK, HONG-EN SHEN, GERALD LUCOVSKY
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Title:
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METHOD FOR DETERMINING INTERFACE PROPERTIES OF SEMICONDUCTOR MATERIALS BY PHOTOREFLECTANCE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| DOW LOHNES ALBERTSON |
| 1255 TWENTY-THIRD ST., |
| WASHINGTON, DC 20037 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| AND DEVELOPMENT FOUNDATION |
| 2900 BEDFORD AVENUE |
| BROOKLYN, NEW YORK 11210 |
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| PAUL M. CRAIG, JR. |
| SUITE 500 |
| 1255 23RD STREET, N.W. |
| WASHINGTON, DC 20037 |
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