Patent Assignment Abstract of Title
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Total Assignments:
5
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Patent #:
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Issue Dt:
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11/30/1993
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Application #:
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07905596
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Filing Dt:
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06/26/1992
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Inventors:
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CEVAT KUMBASAR, JONATHAN A. LEVI, RICHARD J. PETSCHAUER, ROY R. SHANKS, STEVEN S. WEI
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Title:
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TEST WAFER FOR DIAGNOSING FLAWS IN AN INTEGRATED CIRCUIT FABRICATION PROCESS THAT CAUSE A-C DEFECTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| UNISYS CORP. |
| CHARLES J. FASSBENDER |
| MS 1000, LAW DEPT. |
| 10850 VIA FRONTERA |
| SAN DIEGO, CA 92127 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| UNISYS CORP. |
| CHARLES J. FASSBENDER |
| MS 1000, LAW DEPT. |
| 10850 VIA FRONTERA |
| SAN DIEGO, CA 92127 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| UNISYS CORP. |
| CHARLES J. FASSBENDER |
| MS 1000, LAW DEPT. |
| 10850 VIA FRONTERA |
| SAN DIEGO, CA 92127 |
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Assignment:
4
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| UNISYS CORP. |
| CHARLES J. FASSBENDER |
| MS 1000, LAW DEPT. |
| 10850 VIA FRONTERA |
| SAN DIEGO, CA 92127 |
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Assignment:
5
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ASSIGNMENT OF ASSIGNORS INTEREST.
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| UNISYS CORP. |
| CHARLES J. FASSBENDER |
| 10850 VIA FRONTERA, MS 1000 |
| SAN DIEGO, CA 92127 |
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