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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
01/11/1994
Application #:
07836870
Filing Dt:
02/19/1992
Inventor:
TADASHI OBIGANE
Title:
WAFER PROBING TEST MACHINE
Assignment: 1
Reel/Frame:
006687/0243Recorded: 09/13/1993Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/05/1992
Assignee:
2381-1 KITAGEJO, FUJII-MACHI, NIRASAKI-SHI
YAMANASHI 407, JAPAN
Correspondent:
C. IRVIN MCCLELLAND
OBLON, SPIVAK, MCCLELLAND, MAIER
& NEUSTADT, P.C.
1755 JEFFERSON DAVIS HIGHWAY, 4TH FLOOR
ARLINGTON, VA 22202
Assignment: 2
Reel/Frame:
008677/0214Recorded: 08/05/1997Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/21/1997
Assignee:
3-6 AKASAKA 5-CHOME
MINATO-KU, JAPAN
Correspondent:
OBLON, SPIVAK, MCCLELLAND,
MAIER & NEUSTADT, P.C.
MARVIN J. SPIVAK
1755 JEFFERSON DAVIS HIGHWAY, 4TH FLOOR
ARLINGTON, VA 22202

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