Patent Assignment Abstract of Title
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For pending or abandoned applications please consult USPTO staff.
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/01/1997
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Application #:
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08347138
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Filing Dt:
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11/23/1994
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Inventors:
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SATOSHI SAITOH, AKIHIRO TERADA
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Title:
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PROBE APPARATUS FOR INSPECTING ELECTRICAL CHARACTERISTICS OF A MICROELECTRONIC ELEMENT
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Assignment:
1
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ASSIGNS ONE HALF OF ENTIRE INTEREST.
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| 3-6 AKASAKA 5-CHOME, MINATO-KU |
| TOKYO 170, JAPAN |
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| FUCHU NH BUILDING |
| 2-30-7 SUMIYOSHI-CHO, FUCHU |
| TOKYO 183, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND, MAIER |
| & NEUSTADT, P.C. - MARVIN J. SPIVAK |
| 1755 JEFFERSON DAVIS HWY., FOURTH FLOOR |
| ARLINGTON, VIRGINIA 22202 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-6 AKASAKA 5-CHOME MINATO-KU |
| TOKYO 107, JAPAN |
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| OBLON, SPIVAK ET AL. |
| MARVIN J. SPIVAK |
| 1755 JEFFERSON DAVIS HIGHWAY 4TH FLOOR |
| ARLINGTON, VA 22202 |
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