Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/09/2002
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Application #:
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09413768
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Filing Dt:
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10/07/1999
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Inventor:
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YUKIO ISHIGAKI
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Title:
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METHOD OF MEASURING A PROPAGATION DELAY TIME THROUGH A TRANSMISSION PATH IN A SEMICONDUCTOR INTEGRATED CIRCUIT TESTING APPARATUS AND SEMICONDUCTOR INTEGRATED CIRCUIT TESTING APPARATUS USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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32-1, ASAHICHO 1-CHOME |
NERIMA-KU, TOKYO 179-0071, JAPAN |
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GALLAGHER & LATHROP |
DAVID N. LATHROP, ESQUIRE |
601 CALIFORNIA STREET, SUITE 1111 |
SAN FRANCISCO, CA 94108-2805 |
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Assignment:
2
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1-6-2, MARUNOUCHI, CHIYODA-KU |
TOKYO, JAPAN 100-0005 |
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ADVANTEST C/O MURABITO HAO & BARNES LLP |
TWO NORTH MARKET STREET |
THIRD FLOOR |
SAN JOSE, CA 95113 |
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