Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/09/2003
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Application #:
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09953742
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Filing Dt:
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09/11/2001
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Publication #:
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Pub Dt:
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01/31/2002
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Inventors:
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Bruce W. Worster, Ken K. Lee
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Title:
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METHOD FOR CHARACTERIZING DEFECTS ON SEMICONDUCTOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 160 RIO ROBLES |
| SAN JSOE, CALIFORNIA 95134 |
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| PARSON HSUE & DE RUNTZ LLP |
| JAMES S. HSUE |
| 855 MONTGOMERY STREET |
| SUITE 1800 |
| SAN FRANCISCO, CA 94111 |
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