Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/13/2004
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Application #:
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10366157
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Filing Dt:
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02/13/2003
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Inventors:
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David M. Audette, David L. Gardell, John F. Hagios
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Title:
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METHOD FOR WAFER TEST AND WAFER TEST SYSTEM FOR IMPLEMENTING THE METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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NEW ORCHARD ROAD |
ARMONK, NEW YORK 10504 |
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SCULLY, SCOTT, MURPHY ET.AL. |
STEVEN FISCHMAN |
400 GARDEN CITY PLAZA |
GARDEN CITY, NY 11530 |
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