Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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06/27/2006
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Application #:
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10953195
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Filing Dt:
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09/29/2004
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Publication #:
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Pub Dt:
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03/31/2005
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Inventors:
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Murti V. Salapaka, Abu Sebastian, Deepak Ranjan Sahoo
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Title:
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METHOD TO TRANSIENTLY DETECT SAMPLES IN ATOMIC FORCE MICROSCOPES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 310 LAB OF MECHANICS |
| AMES, IOWA 50011-2131 |
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| LEYDIG, VOIT & MAYER LTD. |
| KEVIN L. WINGATY |
| 6815 WEAVER ROAD, SUITE 300 |
| ROCKFORD, IL 61114-8018 |
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Assignment:
2
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CONFIRMATORY LICENSE (SEE DOCUMENT FOR DETAILS).
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| 4201 WILSON BLVD |
| ROOM 1265 |
| ARLINGTON, VIRGINIA 22230 |
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| NATIONAL SCIENCE FOUNDATION |
| 4201 WILSON BLVD |
| ROOM 1265 |
| ARLINGTON, VA 22230 |
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