Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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02/06/2007
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Application #:
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10340558
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Filing Dt:
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01/09/2003
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Publication #:
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Pub Dt:
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11/27/2003
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Inventors:
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Ali Pourkeramati, Eungjoon Park
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Title:
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STRUCTURE AND METHOD FOR PARALLEL TESTING OF DIES ON A SEMICONDUCTOR WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3080 OLCOTT DRIVE, SUITE 215-D |
| SANTA CLARA, CALIFORNIA 95054 |
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| TOWNSEND AND TOWNSEND AND CREW LLP |
| BARMAK SANI |
| TWO EMBARCADERO CENTER, 8TH FLOOR |
| SAN FRANCISCO, CA 94111-3834 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2215-B RENAISSANCE DRIVE, SUITE 5 |
| LAS VEGAS, NEVADA 89119 |
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| TOWNSEND AND TOWNSEND AND CREW LLP |
| PATRICK R. JEWIK |
| TWO EMBARCADERO CENTER, EIGHTH FLOOR |
| SAN FRANCISCO, CALIFORNIA 94111-3834 |
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Assignment:
3
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MERGER (SEE DOCUMENT FOR DETAILS).
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| 2711 CENTERVILLE RD |
| SUITE 400 |
| WILMINGTON, DELAWARE 19808 |
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| FOLEY & LARDNER LLP |
| 150 EAST GILMAN ST. |
| VEREX PLAZA |
| MADISON, WI 53701-1497 |
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