Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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02/20/2007
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Application #:
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11021393
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Filing Dt:
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12/23/2004
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Publication #:
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Pub Dt:
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05/26/2005
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Inventors:
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Gad Neumann, Noam Dotan
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Title:
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SYSTEM FOR DETECTION OF WAFER DEFECTS
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Assignment:
1
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47 ESPLANADE |
ST. HELIER, JERSEY JE1 0BD |
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MICHAEL J. BEVILACQUA, ESQUIRE |
WILMER CUTLER PICKERING HALE AND DORRLLP |
60 STATE STREET |
BOSTON, MA 02109 |
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Assignment:
2
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16 ABBA EBEN AVENUES |
HERZELIYA PITUACH, ISRAEL 46726 |
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16 ABBA EBEN AVENUES |
HERZELIYA PITUACH, ISRAEL 46726 |
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MICHAEL J. BEVILACQUA, ESQUIRE |
WILMER CUTLER PICKERING HALE AND DORRLLP |
60 STATE STREET |
BOSTON, MA 02109 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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3 CHANGI BUSINESS PARK VISTA |
SINGAPORE, SINGAPORE 486051 |
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SONNENSCHEIN NATH & ROSENTHAL LLP |
POST OFFICE BOX 061080 |
WACKER DRIVE STATION, SEARS TOWER |
CHICAGO, IL 60606 |
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