Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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01/13/2009
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Application #:
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11476322
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Filing Dt:
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06/28/2006
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Publication #:
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Pub Dt:
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11/02/2006
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Inventors:
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Dov Furman, Gad Neumann, Mark Wagner, Noam Dotan, Ram Segal, Shai Silberstein
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Title:
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SYSTEM FOR DETECTION OF WAFER DEFECTS
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Assignment:
1
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| 47 ESPLANADE |
| ST. HELIER, JERSEY JE1 0BD |
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| MICHAEL J. BEVILACQUA, ESQUIRE |
| WILMER CUTLER PICKERING HALE AND DORRLLP |
| 60 STATE STREET |
| BOSTON, MA 02109 |
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Assignment:
2
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| 16 ABBA EBEN AVENUES |
| HERZELIYA PITUACH, ISRAEL 46726 |
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| 16 ABBA EBEN AVENUES |
| HERZELIYA PITUACH, ISRAEL 46726 |
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| MICHAEL J. BEVILACQUA, ESQUIRE |
| WILMER CUTLER PICKERING HALE AND DORRLLP |
| 60 STATE STREET |
| BOSTON, MA 02109 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3 CHANGI BUSINESS PARK VISTA |
| SINGAPORE, SINGAPORE 486051 |
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| SONNENSCHEIN NATH & ROSENTHAL LLP |
| POST OFFICE BOX 061080 |
| WACKER DRIVE STATION, SEARS TOWER |
| CHICAGO, IL 60606 |
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