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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
7751046
Issue Dt:
07/06/2010
Application #:
10401242
Filing Dt:
03/27/2003
Publication #:
20040235205
Pub Dt:
11/25/2004
Inventors:
Ady Levy, Rodney Smedt, Gary Bultman, Mehrdad Nikoonahad, Dan Wack, John Fielden et al
Title:
METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLAY OF A SPECIMEN
Assignment: 1
Reel/Frame:
014561/0469Recorded: 09/30/2003Pages: 21
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
LEVY, ADY
Exec Dt:
07/25/2003
SMEDT, RODNEY
Exec Dt:
08/29/2003
BROWN, KYLE A.
Exec Dt:
07/22/2003
BULTMAN, GARY
Exec Dt:
07/18/2003
WACK, DAN
Exec Dt:
07/21/2003
FIELDEN, JOHN
Exec Dt:
07/18/2003
ABDUL-HALIM, IBRAHIM
Exec Dt:
05/08/2003
Assignee:
KLA-TENCOR TECHNOLOGIES CORP.
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
CONLEY ROSE, P.C.
ANN MARIE MEWHERTER
P.O. BOX 684908
AUSTIN, TX 78768-4908

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