Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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08/12/2014
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Application #:
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13279390
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Filing Dt:
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10/24/2011
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Publication #:
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Pub Dt:
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11/08/2012
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Inventors:
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CHIH-CHENG KU, Shan-Cheng Sun, You-Kuo Wu
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Title:
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INTEGRATED CIRCUIT CHIP AND TESTING METHOD CAPABLE OF DETECTING CONNECTION ERROR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4F-1, NO. 26, TAI-YUAN STREET, CHUPEI |
| HSINCHU, TAIWAN 302 |
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| WPAT, PC INTELLECTUAL PROPERTY ATTORNEYS |
| 1940 DUKE STREET, SUITE 200 |
| ALEXANDRIA, VA 22314 |
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Assignment:
2
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MERGER (SEE DOCUMENT FOR DETAILS).
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| NO. 1, DUSING 1ST RD., HSINCHU SCIENCE PARK |
| HSINCHU CITY, TAIWAN 30078 |
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| MCCLURE, QUALEY & RODACK LLP |
| 280 INTERSTATE NORTH CIRCLE |
| SUITE 550 |
| ATLANTA, GA 30339 |
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