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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
04/22/2003
Application #:
09930011
Filing Dt:
08/14/2001
Publication #:
Pub Dt:
01/03/2002
Inventor:
Eungjoon Park
Title:
TESTING DIES ON A SEMICONDUCTOR WAFER IN A SEQUENTIAL AND OVERLAPPING MANNER
Assignment: 1
Reel/Frame:
020166/0683Recorded: 11/28/2007Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/04/2000
Assignee:
3080 OLCOTT DRIVE, SUITE 130-D
SANTA CLARA, CALIFORNIA 95054
Correspondent:
ROBERT J. IRVINE
300 SOUTH WACKER SUITE 3100
CHICAGO, IL 60606-6709
Assignment: 2
Reel/Frame:
015494/0256Recorded: 12/23/2004Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/09/2004
Assignee:
2215-B RENAISSANCE DRIVE, SUITE 5
LAS VEGAS, NEVADA 89119
Correspondent:
TOWNSEND AND TOWNSEND AND CREW LLP
PATRICK R. JEWIK
TWO EMBARCADERO CENTER, EIGHTH FLOOR
SAN FRANCISCO, CALIFORNIA 94111-3834
Assignment: 3
Reel/Frame:
030488/0799Recorded: 05/27/2013Pages: 10
Conveyance:
MERGER (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
02/12/2013
Assignee:
2711 CENTERVILLE RD
SUITE 400
WILMINGTON, DELAWARE 19808
Correspondent:
FOLEY & LARDNER LLP
150 EAST GILMAN ST.
VEREX PLAZA
MADISON, WI 53701-1497

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