Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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07/15/2008
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Application #:
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10539247
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Filing Dt:
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06/16/2005
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Publication #:
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Pub Dt:
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04/06/2006
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PCT #:
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US0305314
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Inventors:
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Anne E. Gattiker, David A. Grosch, Marc D. Knox, Franco Motika, Phil Nigh et al
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Title:
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INTEGRATED CIRCUIT TESTING METHODS USING WELL BIAS MODIFICATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NEW ORCHARD ROAD |
| ARMONK, NEW YORK 10504 |
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| IBM CORPORATION |
| STEVEN J. SOUCAR |
| 2070 ROUTE 52, DEPT. 18G/BLDG. 300-482 |
| INTELLECTUAL PROPERTY LAW DEPT. |
| HOPEWELL JUNCTION, NY 12533-6531 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NEW ORCHARD ROAD |
| ARMONK, NEW YORK 10504 |
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| INTERNATIONAL BUSINESS MACHINES CORP. |
| ATTN: JOSEPH P. ABATE |
| 2070 ROUTE 52 |
| HOPEWELL JUNCTION, NY 12533 |
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