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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
11525581
Filing Dt:
09/22/2006
Publication #:
20080018350
Pub Dt:
01/24/2008
Inventors:
Chih-Hsien Chang, John C.Y. Chiang, Clinton Chao, Hua-Shu Wu, Kim Chen, Mark Shane Peng et al
Title:
Test probe for integrated circuits with ultra-fine pitch terminals
Assignment: 1
Reel/Frame:
018402/0944Recorded: 10/17/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
CHAO, CLINTON
Exec Dt:
09/14/2006
CHANG, CHIH-HSIEN
Exec Dt:
09/19/2006
CHIANG, JOHN C.Y.
Exec Dt:
09/19/2006
PENG, MARK SHANE
Exec Dt:
09/14/2006
WU, HUA-SHU
Exec Dt:
09/18/2006
CHEN, KIM
Exec Dt:
09/18/2006
WU, WEN-HUNG
Exec Dt:
09/19/2006
KARTA, TJANDRA WINADA
Exec Dt:
09/20/2006
Assignee:
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
NO. 8, LI-HSIN RD. 6
SCIENCE-BASED INDUSTRIAL PARK
HSIN-CHU, TAIWAN 300-77
Correspondent:
SLATER & MATSIL, L.L.P.
17950 PRESTON ROAD, SUITE 1000
DALLAS, TX 75252

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