Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11590183
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Filing Dt:
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10/31/2006
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Publication #:
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Pub Dt:
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05/01/2008
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Inventors:
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Jun Zhai, Richard C. Blish II, Fei Wang
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Title:
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Method and semiconductor structure for reliability characterization
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE AMD PLACE, P.O. BOX 3453 |
SUNNYVALE, CALIFORNIA 94088-3453 |
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MICHAEL FARJAMI, ESQ. |
FARJAMI & FARJAMI LLP |
26522 LA ALAMEDA AVE., SUITE 360 |
MISSION VIEJO, CALIFORNIA 92691 |
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