Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11679619
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Filing Dt:
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02/27/2007
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Publication #:
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Pub Dt:
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08/28/2008
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Inventor:
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Chih-Wei Chen
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Title:
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METHOD AND SYSTEM FOR TESTING RELIABILITY OF DATA STORED IN RAID
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| INVENTEC BLDG. |
| 66 HOU-KANG ST., SHIH-LIN DISTRICT |
| TAIPEI, TAIWAN |
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| MIKIO ISHIMARU |
| ISHIMARU & ZAHRT LLP |
| 333 W. EL CAMINO REAL, SUITE # 330 |
| SUNNYVALE, CA 94087 |
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