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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
13273645
Filing Dt:
10/14/2011
Publication #:
Pub Dt:
04/12/2012
Inventors:
Jeffrey O'Dell, Thomas Verburgt, Mark Harless, Cory Watkins
Title:
AUTOMATED WAFER DEFECT INSPECTION SYSTEM AND A PROCESS OF PERFORMING SUCH INSPECTION
Assignment: 1
Reel/Frame:
029426/0301Recorded: 12/07/2012Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/05/2000
Exec Dt:
05/05/2000
Exec Dt:
05/05/2000
Exec Dt:
05/05/2000
Assignee:
4900 WEST 78TH STREET
BLOOMINGTON, MINNESOTA 55435
Correspondent:
DICKE, BILLIG & CZAJA, PLLC ATTN: CHRIS
100 SOUTH FIFTH STREET
FIFTH STREET TOWERS, SUITE 2250
MINNEAPOLIS, MN 55402
Assignment: 2
Reel/Frame:
029583/0982Recorded: 12/20/2012Pages: 16
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/19/2012
Assignee:
ONE RUDOLPH ROAD
FLANDERS, NEW JERSEY 07836
Correspondent:
DICKE, BILLIG & CZAJA, PLLC
SUITE 2250
100 SOUTH FIFTH STREET
MINNEAPOLIS, MINNESOTA 55402

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