Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/11/2014
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Application #:
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13410506
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Filing Dt:
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03/02/2012
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Publication #:
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Pub Dt:
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11/29/2012
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Inventors:
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Chien-Huei CHEN, Peter WHITE, Michael J. VAN RIET, Sankar VENKATARAMAN, Hai JIANG et al
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Title:
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CONTOUR-BASED DEFECT DETECTION USING AN INSPECTION APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1 TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| OKAMOTO & BENEDICTO LLP |
| P.O. BOX 641330 |
| SAN JOSE, CA 95164-1330 |
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