Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/17/2014
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Application #:
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13207485
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Filing Dt:
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08/11/2011
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Publication #:
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Pub Dt:
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02/14/2013
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Inventors:
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David G. Brochu JR., Fen Chen, Roger A. Dufresne, Travis S. Merrill et al
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Title:
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TEST STRUCTURE, METHOD AND CIRCUIT FOR SIMULTANEOUSLY TESTING TIME DEPENDENT DIELECTRIC BREAKDOWN AND ELECTROMIGRATION OR STRESS MIGRATION
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NEW ORCHARD ROAD |
| ARMONK, NEW YORK 10504 |
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| SCHMEISER, OLSEN & WATTS |
| 22 CENTURY HILL DRIVE |
| SUITE 302 |
| LATHAM, NY 12110 |
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