Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/01/2020
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Application #:
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16400833
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Filing Dt:
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05/01/2019
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Publication #:
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Pub Dt:
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08/22/2019
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Inventors:
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Peng-Ren CHEN, Wen-Hao CHENG, Wei-Chung HU, Jyun-Hong CHEN, Shiang-Bau WANG et al
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Title:
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SEMICONDUCTOR WAFER MEASUREMENT METHOD AND SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 8, LI-HSIN RD. 6, HSINCHU SCIENCE PARK |
| HSINCHU, TAIWAN 300 |
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| HAUPTMAN HAM, LLP (TSMC) |
| 2318 MILL ROAD |
| SUITE 1400 |
| ALEXANDRIA, VA 22314 |
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