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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/28/2023
Application #:
16662158
Filing Dt:
10/24/2019
Publication #:
Pub Dt:
04/29/2021
Inventors:
Hongqing Zhang, David J. Lewison, Yu Luo, Jay A. Bunt, Joyce Molinelli Acocella
Title:
NON-DESTRUCTIVE BOND LINE THICKNESS MEASUREMENT OF THERMAL INTERFACE MATERIAL ON SILICON PACKAGES
Assignment: 1
Reel/Frame:
050813/0247Recorded: 10/24/2019Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/17/2019
Exec Dt:
10/17/2019
Exec Dt:
10/17/2019
Exec Dt:
10/18/2019
Exec Dt:
10/20/2019
Assignee:
NEW ORCHARD ROAD
ARMONK, NEW YORK 10504
Correspondent:
CANTOR COLBURN LLP POUGHKEEPSIE
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103

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