Patent Assignment Details
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
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| Reel/Frame: | 010514/0523 | |
| Pages: | 20 |
| | Recorded: | 01/04/2000 | | |
| Conveyance: | SECURITY AGREEMENT |
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Total properties:
9
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Patent #:
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Issue Dt:
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07/17/1979
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Application #:
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05816337
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Filing Dt:
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07/18/1977
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Title:
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PROBE DEVICE FOR INTEGRATED CIRCUIT WAFERS
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Patent #:
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Issue Dt:
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11/19/1991
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Application #:
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07475820
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Filing Dt:
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02/06/1990
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Title:
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PROBE SYSTEM FOR DEVICE AND CIRCUIT TESTING
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Patent #:
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Issue Dt:
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05/28/1996
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Application #:
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07775914
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Filing Dt:
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10/15/1991
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Title:
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PROBE CARD APPARATUS
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Patent #:
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Issue Dt:
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01/17/1995
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Application #:
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07947935
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Filing Dt:
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09/21/1992
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Title:
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HIGH DENSITY PROBE CARD FOR TESTING ELECTRICAL CIRCUITS
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Patent #:
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Issue Dt:
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12/31/1996
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Application #:
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08060757
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Filing Dt:
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05/12/1993
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Title:
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DIE CARRIER APPARATUS
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Patent #:
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Issue Dt:
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10/27/1998
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Application #:
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08746117
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Filing Dt:
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11/06/1996
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Title:
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PROBE CARD ASSEMBLY FOR HIGH DENSITY INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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07/13/1999
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Application #:
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08837399
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Filing Dt:
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04/17/1997
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Title:
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PROBE ASSEMBLY AND METHOD FOR SWITCHABLE MULTI-DUT TESTING OF INTEGRATED CIRCUIT WAFERS
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Patent #:
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Issue Dt:
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12/14/1999
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Application #:
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08887073
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Filing Dt:
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07/02/1997
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Title:
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INVERTED ALIGNMENT STATION AND METHOD FOR CALIBRATING NEEDLES OF PROBE CARD FOR PROBE TESTING OF INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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09/05/2000
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Application #:
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09082896
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Filing Dt:
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05/21/1998
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Title:
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METHOD AND APPARATUS FOR INTERFACING BETWEEN AUTOMATIC WAFER PROBE MACHINES, AUTOMATIC TESTERS, AND PROBE CARDS
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Assignee
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| 55 SOUTH LAKE AVENUE |
| PASADENA, CALIFORNIA 91101 |
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Correspondence name and address
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LATHAM & WATKINS
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BRETT ROSENBLATT, ESQ.
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633 WEST FIFTH STREET
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SUITE 4000
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LOS ANGELES, CA 90071
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