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Patent Assignment Details

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Reel/Frame:	022878/0815			Pages:	6
		Recorded:	06/29/2009
Attorney Dkt #:	40006317-1000
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 26

Patent #:	7525659	Issue Dt:	04/28/2009	Application #:	10345097	Filing Dt:	01/15/2003
Publication #:	US20040146295	Pub Dt:	07/29/2004
Title:	SYSTEM FOR DETECTION OF WAFER DEFECTS

Patent #:	7180586	Issue Dt:	02/20/2007	Application #:	11021393	Filing Dt:	12/23/2004
Publication #:	US20050110987	Pub Dt:	05/26/2005
Title:	SYSTEM FOR DETECTION OF WAFER DEFECTS

Patent #:	7804993	Issue Dt:	09/28/2010	Application #:	11068711	Filing Dt:	02/28/2005
Publication #:	US20060193506	Pub Dt:	08/31/2006
Title:	METHOD AND APPARATUS FOR DETECTING DEFECTS IN WAFERS INCLUDING ALIGNMENT OF THE WAFER IMAGES SO AS TO INDUCE THE SAME SMEAR IN ALL IMAGES

Patent #:	7813541	Issue Dt:	10/12/2010	Application #:	11069712	Filing Dt:	02/28/2005
Publication #:	US20060193507	Pub Dt:	08/31/2006
Title:	METHOD AND APPARATUS FOR DETECTING DEFECTS IN WAFERS

Patent #:	7274444	Issue Dt:	09/25/2007	Application #:	11176844	Filing Dt:	07/06/2005
Publication #:	US20060007434	Pub Dt:	01/12/2006
Title:	MULTI MODE INSPECTION METHOD AND APPARATUS

Patent #:	8031931	Issue Dt:	10/04/2011	Application #:	11410276	Filing Dt:	04/24/2006
Publication #:	US20070247668	Pub Dt:	10/25/2007
Title:	PRINTED FOURIER FILTERING IN OPTICAL INSPECTION TOOLS

Patent #:	7477383	Issue Dt:	01/13/2009	Application #:	11476322	Filing Dt:	06/28/2006
Publication #:	US20060244956	Pub Dt:	11/02/2006
Title:	SYSTEM FOR DETECTION OF WAFER DEFECTS

Patent #:	7961763	Issue Dt:	06/14/2011	Application #:	11476342	Filing Dt:	06/28/2006
Publication #:	US20070019856	Pub Dt:	01/25/2007
Title:	SYSTEM FOR DETECTION OF WAFER DEFECTS

Patent #:	NONE	Issue Dt:		Application #:	11476356	Filing Dt:	06/28/2006
Publication #:	US20060244957	Pub Dt:	11/02/2006
Title:	System for detection of wafer defects

Patent #:	7843559	Issue Dt:	11/30/2010	Application #:	11476358	Filing Dt:	06/28/2006
Publication #:	US20060244958	Pub Dt:	11/02/2006
Title:	SYSTEM FOR DETECTION OF WAFER DEFECTS

Patent #:	NONE	Issue Dt:		Application #:	11503859	Filing Dt:	08/14/2006
Publication #:	US20080037933	Pub Dt:	02/14/2008
Title:	Speckle reduction using a fiber bundle and light guide

Patent #:	7633041	Issue Dt:	12/15/2009	Application #:	11524684	Filing Dt:	09/21/2006
Publication #:	US20070013903	Pub Dt:	01/18/2007
Title:	APPARATUS FOR DETERMINING OPTIMUM POSITION OF FOCUS OF AN IMAGING SYSTEM

Patent #:	7369236	Issue Dt:	05/06/2008	Application #:	11590650	Filing Dt:	10/31/2006
Publication #:	US20080100844	Pub Dt:	05/01/2008
Title:	DEFECT DETECTION THROUGH IMAGE COMPARISON USING RELATIVE MEASURES

Patent #:	7659973	Issue Dt:	02/09/2010	Application #:	11684191	Filing Dt:	03/09/2007
Publication #:	US20070273945	Pub Dt:	11/29/2007
Title:	WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION

Patent #:	7869643	Issue Dt:	01/11/2011	Application #:	11700408	Filing Dt:	01/31/2007
Publication #:	US20080181484	Pub Dt:	07/31/2008
Title:	ADVANCED CELL-TO-CELL INSPECTION

Patent #:	7924420	Issue Dt:	04/12/2011	Application #:	11764296	Filing Dt:	06/18/2007
Publication #:	US20080307908	Pub Dt:	12/18/2008
Title:	OPTICAL INSPECTION INCLUDING PARTIAL SCANNING OF WAFERS

Patent #:	8098372	Issue Dt:	01/17/2012	Application #:	11781454	Filing Dt:	07/23/2007
Publication #:	US20090030630	Pub Dt:	01/29/2009
Title:	OPTICAL INSPECTION TOOL FEATURING MULTIPLE SPEED MODES

Patent #:	7480039	Issue Dt:	01/20/2009	Application #:	11895204	Filing Dt:	08/22/2007
Publication #:	US20070291256	Pub Dt:	12/20/2007
Title:	MULTI MODE INSPECTION METHOD AND APPARATUS

Patent #:	7719674	Issue Dt:	05/18/2010	Application #:	11944677	Filing Dt:	11/26/2007
Publication #:	US20080137073	Pub Dt:	06/12/2008
Title:	IMAGE SPLITTING IN OPTICAL INSPECTION SYSTEMS

Patent #:	7714998	Issue Dt:	05/11/2010	Application #:	11944684	Filing Dt:	11/26/2007
Publication #:	US20080137074	Pub Dt:	06/12/2008
Title:	IMAGE SPLITTING IN OPTICAL INSPECTION SYSTEMS

Patent #:	7916286	Issue Dt:	03/29/2011	Application #:	11958731	Filing Dt:	12/18/2007
Publication #:	US20080101686	Pub Dt:	05/01/2008
Title:	DEFECT DETECTION THROUGH IMAGE COMPARISON USING RELATIVE MEASURES

Patent #:	7826049	Issue Dt:	11/02/2010	Application #:	12142416	Filing Dt:	06/19/2008
Publication #:	US20090201494	Pub Dt:	08/13/2009
Title:	INSPECTION TOOLS SUPPORTING MULTIPLE OPERATING STATES FOR MULTIPLE DETECTOR ARRANGEMENTS

Patent #:	8135207	Issue Dt:	03/13/2012	Application #:	12145701	Filing Dt:	06/25/2008
Publication #:	US20090324057	Pub Dt:	12/31/2009
Title:	OPTICAL INSPECTION TOOLS FEATURING PARALLEL POST-INSPECTION ANALYSIS

Patent #:	7973921	Issue Dt:	07/05/2011	Application #:	12145708	Filing Dt:	06/25/2008
Publication #:	US20090323052	Pub Dt:	12/31/2009
Title:	DYNAMIC ILLUMINATION IN OPTICAL INSPECTION SYSTEMS

Patent #:	7843558	Issue Dt:	11/30/2010	Application #:	12145712	Filing Dt:	06/25/2008
Publication #:	US20090323053	Pub Dt:	12/31/2009
Title:	OPTICAL INSPECTION TOOLS FEATURING LIGHT SHAPING DIFFUSERS

Patent #:	7804590	Issue Dt:	09/28/2010	Application #:	12316302	Filing Dt:	12/10/2008
Publication #:	US20090091749	Pub Dt:	04/09/2009
Title:	MULTI MODE INSPECTION METHOD AND APPARATUS

Assignor

Exec Dt:

06/11/2009

Assignee

3 CHANGI BUSINESS PARK VISTA

SINGAPORE, SINGAPORE 486051

Correspondence name and address
	SONNENSCHEIN NATH & ROSENTHAL LLP
	POST OFFICE BOX 061080
	WACKER DRIVE STATION, SEARS TOWER
	CHICAGO, IL 60606

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