Total properties:
25
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Patent #:
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Issue Dt:
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05/03/1994
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Application #:
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07991776
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Filing Dt:
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12/16/1992
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Title:
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PROCESS FOR THE MANUFACTURE OF A HIGH DENSITY CELL ARRAY OF GAIN MEMORY CELLS
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Patent #:
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Issue Dt:
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08/22/1995
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Application #:
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07995639
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Filing Dt:
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12/17/1992
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Title:
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DECODED-SOURCE SENSE AMPLIFIER WITH SPECIAL COLUMN SELECT DRIVER VOLTAGE
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Patent #:
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Issue Dt:
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12/08/1998
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Application #:
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08829256
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Filing Dt:
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03/31/1997
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Title:
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VOLTAGE DETECTION CIRCUIT AND INTERNAL VOLTAGE CLAMP CIRCUIT
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Patent #:
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Issue Dt:
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08/03/1999
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Application #:
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08856336
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Filing Dt:
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05/14/1997
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Title:
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MOSFETS WITH IMPROVED SHORT CHANNEL EFFECTS
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Patent #:
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Issue Dt:
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11/09/1999
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Application #:
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09034517
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Filing Dt:
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03/04/1998
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Title:
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METHOD AND APPARATUS FOR EVALUATING INTERNAL FILM STRESS AT HIGH LATERAL RESOLUTION
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Patent #:
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Issue Dt:
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05/06/2003
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Application #:
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09801413
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Filing Dt:
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03/08/2001
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Publication #:
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Pub Dt:
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09/12/2002
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Title:
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APPARATUS AND METHOD FOR PATTERNING A SEMICONDUCTOR WAFER
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Patent #:
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Issue Dt:
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03/04/2003
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Application #:
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09876706
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Filing Dt:
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06/07/2001
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Publication #:
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Pub Dt:
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12/20/2001
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Title:
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INTEGRATED CIRCUIT CONFIGURATION FOR TESTING TRANSISTORS, AND A SEMICONDUCTOR WAFER HAVING SUCH A CIRCUIT CONFIGURATION
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Patent #:
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Issue Dt:
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04/29/2003
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Application #:
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09907695
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Filing Dt:
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07/18/2001
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Publication #:
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Pub Dt:
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01/31/2002
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Title:
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SYSTEM FOR TESTING FAST SYNCHRONOUS SEMICONDUCTOR CIRCUITS
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Patent #:
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Issue Dt:
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03/16/2004
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Application #:
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09914749
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Filing Dt:
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01/14/2002
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Title:
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METHOD FOR IMPROVING THERMAL PROCESS STEPS
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Patent #:
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Issue Dt:
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06/15/2004
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Application #:
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09915984
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Filing Dt:
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07/25/2001
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Publication #:
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Pub Dt:
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02/21/2002
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Title:
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APPARATUS FOR TESTING SEMICONDUCTOR DEVICES
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Patent #:
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Issue Dt:
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09/02/2003
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Application #:
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09947295
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Filing Dt:
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09/05/2001
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Publication #:
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Pub Dt:
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07/04/2002
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Title:
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MEASUREMENT PROBE FOR DETECTING ELECTRICAL SIGNALS IN AN INTEGRATED SEMICONDUCTOR CIRCUIT
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Patent #:
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Issue Dt:
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04/20/2004
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Application #:
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09992290
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Filing Dt:
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11/16/2001
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Publication #:
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Pub Dt:
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06/20/2002
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Title:
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METHOD OF CALIBRATING A TEST SYSTEM FOR SEMICONDUCTOR COMPONENTS, AND TEST SUBSTRATE
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Patent #:
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Issue Dt:
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07/13/2004
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Application #:
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10010504
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Filing Dt:
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12/05/2001
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Publication #:
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Pub Dt:
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07/11/2002
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Title:
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TEST CONFIGURATION AND TEST METHOD FOR TESTING A PLURALITY OF INTEGRATED CIRCUITS IN PARALLEL
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Patent #:
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Issue Dt:
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08/10/2004
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Application #:
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10105590
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Filing Dt:
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03/25/2002
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Publication #:
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Pub Dt:
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09/26/2002
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Title:
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METHOD FOR RELEASABLE CONTACT-CONNECTION OF A PLURALITY OF INTEGRATED SEMICONDUCTOR MODULES ON A WAFER
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Patent #:
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Issue Dt:
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08/31/2004
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Application #:
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10131374
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Filing Dt:
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04/24/2002
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Publication #:
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Pub Dt:
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10/24/2002
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Title:
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CIRCUIT CONFIGURATION FOR SELECTIVELY TRANSMITTING INFORMATION ITEMS FROM A MEASURING DEVICE TO CHIPS ON A WAFER DURING CHIP FABRICATION
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Patent #:
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Issue Dt:
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01/13/2004
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Application #:
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10134132
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Filing Dt:
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04/29/2002
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Publication #:
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Pub Dt:
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10/31/2002
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Title:
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TEST APPARATUS FOR PARALLEL TESTING A NUMBER OF ELECTRONIC COMPONENTS AND A METHOD FOR CALIBRATING THE TEST APPARATUS
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Patent #:
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Issue Dt:
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07/01/2003
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Application #:
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10177945
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Filing Dt:
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06/20/2002
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Publication #:
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Pub Dt:
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01/16/2003
| | | | |
Title:
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DELAY LOCKED LOOP
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Patent #:
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Issue Dt:
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09/02/2003
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Application #:
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10186659
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Filing Dt:
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07/01/2002
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Publication #:
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Pub Dt:
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01/02/2003
| | | | |
Title:
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TESTER APPARATUS FOR ELECTRONIC COMPONENTS
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Patent #:
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Issue Dt:
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05/04/2004
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Application #:
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10206299
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Filing Dt:
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07/26/2002
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Publication #:
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Pub Dt:
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01/30/2003
| | | | |
Title:
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INTEGRATED DYNAMIC MEMORY AND OPERATING METHOD
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Patent #:
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Issue Dt:
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08/24/2004
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Application #:
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10208252
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Filing Dt:
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07/30/2002
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Publication #:
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Pub Dt:
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02/20/2003
| | | | |
Title:
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CIRCUIT FOR TESTING AN INTEGRATED CIRCUIT
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Patent #:
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Issue Dt:
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03/09/2004
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Application #:
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10223899
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Filing Dt:
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08/20/2002
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Publication #:
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Pub Dt:
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02/20/2003
| | | | |
Title:
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METHOD FOR DETERMINING THE TRANSIT TIME OF ELECTRICAL SIGNALS ON PRINTED CIRCUIT BOARDS USING AUTOMATIC STANDARD TEST EQUIPMENT
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Patent #:
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Issue Dt:
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02/01/2005
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Application #:
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10386148
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Filing Dt:
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03/11/2003
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Publication #:
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Pub Dt:
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11/20/2003
| | | | |
Title:
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TEMPERATURE-DEPENDENT REFRESH CYCLE FOR DRAM
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Patent #:
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Issue Dt:
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02/08/2005
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Application #:
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10736356
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Filing Dt:
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12/15/2003
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Publication #:
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Pub Dt:
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07/01/2004
| | | | |
Title:
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METHOD AND PROBE CARD CONFIGURATION FOR TESTING A PLURALITY OF INTEGRATED CIRCUITS IN PARALLEL
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Patent #:
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Issue Dt:
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12/06/2005
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Application #:
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10834416
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Filing Dt:
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04/29/2004
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Publication #:
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Pub Dt:
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01/06/2005
| | | | |
Title:
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APPARATUS FOR FLEXIBLE DEACTIVATION OF WORD LINES OF DYNAMIC MEMORY MODULES AND METHOD THEREFOR
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|
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Patent #:
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|
Issue Dt:
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11/29/2005
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Application #:
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10965513
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Filing Dt:
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10/14/2004
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Publication #:
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Pub Dt:
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03/03/2005
| | | | |
Title:
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APPARATUS FOR THE AUTOMATED TESTING, CALIBRATION AND CHARACTERIZATION OF TEST ADAPTERS
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