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Total properties:
17
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Patent #:
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Issue Dt:
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02/03/2004
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Application #:
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09275726
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Filing Dt:
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03/24/1999
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Title:
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ON-CHIP SERVICE PROCESSOR FOR TEST AND DEBUG OF INTEGRATED CIRCUITS
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Patent #:
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Issue Dt:
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03/27/2007
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Application #:
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10750949
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Filing Dt:
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01/05/2004
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Publication #:
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Pub Dt:
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07/29/2004
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Title:
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ACCELERATED SCAN CIRCUITRY AND METHOD FOR REDUCING SCAN TEST DATA VOLUME AND EXECUTION TIME
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Patent #:
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Issue Dt:
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11/08/2005
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Application #:
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10767265
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Filing Dt:
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01/30/2004
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Publication #:
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Pub Dt:
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09/23/2004
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Title:
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ON-CHIP SERVICE PROCESSOR
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Patent #:
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Issue Dt:
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03/06/2007
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Application #:
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10931079
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Filing Dt:
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09/01/2004
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Publication #:
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Pub Dt:
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02/03/2005
| | | | |
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Title:
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ACCELERATED SCAN CIRCUITRY AND METHOD FOR REDUCING SCAN TEST DATA VOLUME AND EXECUTION TIME
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Patent #:
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Issue Dt:
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04/03/2007
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Application #:
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10931191
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Filing Dt:
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09/01/2004
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Publication #:
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Pub Dt:
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07/14/2005
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Title:
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ACCELERATED SCAN CIRCUITRY AND METHOD FOR REDUCING SCAN TEST DATA VOLUME AND EXECUTION TIME
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Patent #:
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Issue Dt:
|
04/01/2008
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Application #:
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11182809
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Filing Dt:
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07/18/2005
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Publication #:
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Pub Dt:
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08/31/2006
| | | | |
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Title:
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VARIABLE CLOCKED SCAN TEST IMPROVEMENTS
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Patent #:
|
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Issue Dt:
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09/02/2008
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Application #:
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11208882
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Filing Dt:
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08/23/2005
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Publication #:
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Pub Dt:
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03/01/2007
| | | | |
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Title:
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HASHING AND SERIAL DECODING TECHNIQUES
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Patent #:
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Issue Dt:
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08/12/2008
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Application #:
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11208883
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Filing Dt:
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08/23/2005
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Publication #:
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Pub Dt:
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07/19/2007
| | | | |
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Title:
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SCAN STRING SEGMENTATION FOR DIGITAL TEST COMPRESSION
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Patent #:
|
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Issue Dt:
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07/18/2006
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Application #:
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11261762
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Filing Dt:
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10/31/2005
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Publication #:
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Pub Dt:
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03/23/2006
| | | | |
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Title:
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ON-CHIP SERVICE PROCESSOR
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Patent #:
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Issue Dt:
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11/16/2010
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Application #:
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11424610
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Filing Dt:
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06/16/2006
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Publication #:
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Pub Dt:
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07/10/2008
| | | | |
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Title:
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ON-CHIP SERVICE PROCESSOR
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Patent #:
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Issue Dt:
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07/06/2010
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Application #:
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11680684
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Filing Dt:
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03/01/2007
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Publication #:
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Pub Dt:
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07/12/2007
| | | | |
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Title:
|
ACCELERATED SCAN CIRCUITRY AND METHOD FOR REDUCING SCAN TEST DATA VOLUME AND EXECUTION TIME
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|
|
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Patent #:
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|
Issue Dt:
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02/15/2011
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Application #:
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12046336
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Filing Dt:
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03/11/2008
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Publication #:
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Pub Dt:
|
07/03/2008
| | | | |
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Title:
|
VARIABLE CLOCKED SCAN TEST IMPROVEMENTS
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|
|
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Patent #:
|
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Issue Dt:
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03/30/2010
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Application #:
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12047408
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Filing Dt:
|
03/13/2008
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Title:
|
VARIABLE CLOCKED SCAN TEST CIRCUITRY AND METHOD
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|
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Patent #:
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|
Issue Dt:
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11/17/2009
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Application #:
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12120787
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Filing Dt:
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05/15/2008
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Publication #:
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Pub Dt:
|
10/02/2008
| | | | |
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Title:
|
SCAN STRING SEGMENTATION FOR DIGITAL TEST COMPRESSION
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|
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Patent #:
|
|
Issue Dt:
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10/19/2010
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Application #:
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12199024
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Filing Dt:
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08/27/2008
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Publication #:
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Pub Dt:
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12/25/2008
| | | | |
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Title:
|
HASHING AND SERIAL DECODING TECHNIQUES
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|
|
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Patent #:
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Issue Dt:
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08/07/2012
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Application #:
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12717391
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Filing Dt:
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03/04/2010
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Publication #:
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Pub Dt:
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06/24/2010
| | | | |
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Title:
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ON-CHIP SERVICE PROCESSOR
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|
|
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Patent #:
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Issue Dt:
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04/24/2012
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Application #:
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12906285
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Filing Dt:
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10/18/2010
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Publication #:
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Pub Dt:
|
02/10/2011
| | | | |
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Title:
|
HASHING AND SERIAL DECODING TECHNIQUES
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