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Reel/Frame:	057393/0609			Pages:	7
		Recorded:	09/01/2021
Attorney Dkt #:	FFP-000/US
Conveyance:	ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Total properties: 83

Patent #:	6838890	Issue Dt:	01/04/2005	Application #:	09637527	Filing Dt:	11/29/2000
Publication #:	US20030132767	Pub Dt:	07/17/2003
Title:	MEMBRANE PROBING SYSTEM

Patent #:	6914423	Issue Dt:	07/05/2005	Application #:	09881312	Filing Dt:	06/12/2001
Publication #:	US20020027434	Pub Dt:	03/07/2002
Title:	PROBE STATION

Patent #:	6864676	Issue Dt:	03/08/2005	Application #:	10139735	Filing Dt:	05/06/2002
Publication #:	US20020163350	Pub Dt:	11/07/2002
Title:	SUBSTRATE-HOLDING DEVICE FOR TESTING CIRCUIT ARRANGEMENTS ON SUBSTRATES

Patent #:	6861856	Issue Dt:	03/01/2005	Application #:	10319287	Filing Dt:	12/13/2002
Publication #:	US20040113639	Pub Dt:	06/17/2004
Title:	GUARDED TUB ENCLOSURE

Patent #:	6847219	Issue Dt:	01/25/2005	Application #:	10666219	Filing Dt:	09/18/2003
Title:	PROBE STATION WITH LOW NOISE CHARACTERISTICS

Patent #:	7250779	Issue Dt:	07/31/2007	Application #:	10672655	Filing Dt:	09/25/2003
Publication #:	US20050099192	Pub Dt:	05/12/2005
Title:	PROBE STATION WITH LOW INDUCTANCE PATH

Patent #:	7038441	Issue Dt:	05/02/2006	Application #:	10677524	Filing Dt:	10/02/2003
Publication #:	US20040108847	Pub Dt:	06/10/2004
Title:	TEST APPARATUS WITH LOADING DEVICE

Patent #:	7250626	Issue Dt:	07/31/2007	Application #:	10794246	Filing Dt:	03/05/2004
Publication #:	US20050088191	Pub Dt:	04/28/2005
Title:	PROBE TESTING STRUCTURE

Patent #:	7161363	Issue Dt:	01/09/2007	Application #:	10848777	Filing Dt:	05/18/2004
Publication #:	US20040232927	Pub Dt:	11/25/2004
Title:	PROBE FOR TESTING A DEVICE UNDER TEST

Patent #:	7057408	Issue Dt:	06/06/2006	Application #:	10879622	Filing Dt:	06/29/2004
Publication #:	US20050007135	Pub Dt:	01/13/2005
Title:	METHOD AND PROBER FOR CONTACTING A CONTACT AREA WITH A CONTACT TIP

Patent #:	7196507	Issue Dt:	03/27/2007	Application #:	10928975	Filing Dt:	08/27/2004
Publication #:	US20050083036	Pub Dt:	04/21/2005
Title:	APPARATUS FOR TESTING SUBSTRATES

Patent #:	7176705	Issue Dt:	02/13/2007	Application #:	11123687	Filing Dt:	05/06/2005
Publication #:	US20050270056	Pub Dt:	12/08/2005
Title:	THERMAL OPTICAL CHUCK

Patent #:	7368927	Issue Dt:	05/06/2008	Application #:	11175600	Filing Dt:	07/05/2005
Publication #:	US20060006889	Pub Dt:	01/12/2006
Title:	PROBE HEAD HAVING A MEMBRANE SUSPENDED PROBE

Patent #:	7235990	Issue Dt:	06/26/2007	Application #:	11299487	Filing Dt:	12/12/2005
Publication #:	US20070132465	Pub Dt:	06/14/2007
Title:	PROBE STATION COMPRISING A BELLOWS WITH EMI SHIELDING CAPABILITIES

Patent #:	7535247	Issue Dt:	05/19/2009	Application #:	11335037	Filing Dt:	01/18/2006
Publication #:	US20060170441	Pub Dt:	08/03/2006
Title:	INTERFACE FOR TESTING SEMICONDUCTORS

Patent #:	7656172	Issue Dt:	02/02/2010	Application #:	11335069	Filing Dt:	01/18/2006
Publication #:	US20060184041	Pub Dt:	08/17/2006
Title:	SYSTEM FOR TESTING SEMICONDUCTORS

Patent #:	7449899	Issue Dt:	11/11/2008	Application #:	11410783	Filing Dt:	04/24/2006
Publication #:	US20060279299	Pub Dt:	12/14/2006
Title:	PROBE FOR HIGH FREQUENCY SIGNALS

Patent #:	7859278	Issue Dt:	12/28/2010	Application #:	11674205	Filing Dt:	02/13/2007
Publication #:	US20080122465	Pub Dt:	05/29/2008
Title:	PROBE HOLDER FOR A PROBE FOR TESTING SEMICONDUCTOR COMPONENTS

Patent #:	7573283	Issue Dt:	08/11/2009	Application #:	11765019	Filing Dt:	06/19/2007
Publication #:	US20080315903	Pub Dt:	12/25/2008
Title:	METHOD FOR MEASUREMENT OF A DEVICE UNDER TEST

Patent #:	7908107	Issue Dt:	03/15/2011	Application #:	11879865	Filing Dt:	07/18/2007
Publication #:	US20080018343	Pub Dt:	01/24/2008
Title:	LINE-REFLECT-REFLECT MATCH CALIBRATION

Patent #:	7394269	Issue Dt:	07/01/2008	Application #:	11888957	Filing Dt:	08/03/2007
Publication #:	US20070273399	Pub Dt:	11/29/2007
Title:	PROBE FOR TESTING A DEVICE UNDER TEST

Patent #:	7652491	Issue Dt:	01/26/2010	Application #:	11940354	Filing Dt:	11/15/2007
Publication #:	US20080116917	Pub Dt:	05/22/2008
Title:	PROBE SUPPORT WITH SHIELD FOR THE EXAMINATION OF TEST SUBSTRATES UNDER USE OF PROBE SUPPORTS

Patent #:	8278951	Issue Dt:	10/02/2012	Application #:	11940355	Filing Dt:	11/15/2007
Publication #:	US20080116918	Pub Dt:	05/22/2008
Title:	PROBE STATION FOR TESTING SEMICONDUCTOR SUBSTRATES AND COMPRISING EMI SHIELDING

Patent #:	7579854	Issue Dt:	08/25/2009	Application #:	11943975	Filing Dt:	11/21/2007
Publication #:	US20080143365	Pub Dt:	06/19/2008
Title:	PROBE STATION AND METHOD FOR MEASUREMENTS OF SEMICONDUCTOR DEVICES UNDER DEFINED ATMOSPHERE

Patent #:	7489149	Issue Dt:	02/10/2009	Application #:	11977280	Filing Dt:	10/24/2007
Publication #:	US20080054929	Pub Dt:	03/06/2008
Title:	SHIELDED PROBE FOR TESTING A DEVICE UNDER TEST

Patent #:	8240650	Issue Dt:	08/14/2012	Application #:	12048323	Filing Dt:	03/14/2008
Publication #:	US20080224426	Pub Dt:	09/18/2008
Title:	CHUCK WITH TRIAXIAL CONSTRUCTION

Patent #:	7741860	Issue Dt:	06/22/2010	Application #:	12145090	Filing Dt:	06/24/2008
Publication #:	US20090058442	Pub Dt:	03/05/2009
Title:	PROBER FOR TESTING MAGNETICALLY SENSITIVE COMPONENTS

Patent #:	7888957	Issue Dt:	02/15/2011	Application #:	12287213	Filing Dt:	10/06/2008
Publication #:	US20100085069	Pub Dt:	04/08/2010
Title:	PROBING APPARATUS WITH IMPEDANCE OPTIMIZED INTERFACE

Patent #:	7898281	Issue Dt:	03/01/2011	Application #:	12316511	Filing Dt:	12/12/2008
Publication #:	US20090134896	Pub Dt:	05/28/2009
Title:	INTERFACE FOR TESTING SEMICONDUCTORS

Patent #:	7733108	Issue Dt:	06/08/2010	Application #:	12329968	Filing Dt:	12/08/2008
Publication #:	US20090085595	Pub Dt:	04/02/2009
Title:	METHOD AND ARRANGEMENT FOR POSITIONING A PROBE CARD

Patent #:	7932737	Issue Dt:	04/26/2011	Application #:	12345980	Filing Dt:	12/30/2008
Publication #:	US20090179658	Pub Dt:	07/16/2009
Title:	PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

Patent #:	7999563	Issue Dt:	08/16/2011	Application #:	12489913	Filing Dt:	06/23/2009
Publication #:	US20090315581	Pub Dt:	12/24/2009
Title:	CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATION SUBSTRATE

Patent #:	8319503	Issue Dt:	11/27/2012	Application #:	12590955	Filing Dt:	11/16/2009
Publication #:	US20100127714	Pub Dt:	05/27/2010
Title:	TEST APPARATUS FOR MEASURING A CHRACTERISTIC OF A DEVICE UNDER TEST

Patent #:	8410806	Issue Dt:	04/02/2013	Application #:	12592186	Filing Dt:	11/20/2009
Publication #:	US20100127725	Pub Dt:	05/27/2010
Title:	REPLACEABLE COUPON FOR A PROBING APPARATUS

Patent #:	8094925	Issue Dt:	01/10/2012	Application #:	12619327	Filing Dt:	11/16/2009
Publication #:	US20100111403	Pub Dt:	05/06/2010
Title:	METHOD FOR INCREASING THE ACCURACY OF THE POSITIONING OF A FIRST OBJECT RELATIVE TO A SECOND OBJECT

Patent #:	7940069	Issue Dt:	05/10/2011	Application #:	12653574	Filing Dt:	12/15/2009
Publication #:	US20100097467	Pub Dt:	04/22/2010
Title:	SYSTEM FOR TESTING SEMICONDUCTORS

Patent #:	8497693	Issue Dt:	07/30/2013	Application #:	12681806	Filing Dt:	08/02/2010
Publication #:	US20100289511	Pub Dt:	11/18/2010
Title:	METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITIONS AND THERMALLY CONDITIONABLE PROBER

Patent #:	8344744	Issue Dt:	01/01/2013	Application #:	12818442	Filing Dt:	06/18/2010
Publication #:	US20110227602	Pub Dt:	09/22/2011
Title:	PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING

Patent #:	8072586	Issue Dt:	12/06/2011	Application #:	12847723	Filing Dt:	07/30/2010
Publication #:	US20110013011	Pub Dt:	01/20/2011
Title:	ARRANGEMENT AND METHOD FOR FOCUSING A MULTIPLANE IMAGE ACQUISITION ON A PROBER

Patent #:	8167648	Issue Dt:	05/01/2012	Application #:	13030961	Filing Dt:	02/18/2011
Publication #:	US20110207370	Pub Dt:	08/25/2011
Title:	A LOW NOISE CONNECTOR WITH CABLES HAVING A CENTER, MIDDLE AND OUTER CONDUCTORS

Patent #:	8841932	Issue Dt:	09/23/2014	Application #:	13094604	Filing Dt:	04/26/2011
Publication #:	US20110316574	Pub Dt:	12/29/2011
Title:	PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

Patent #:	8692567	Issue Dt:	04/08/2014	Application #:	13119145	Filing Dt:	06/20/2011
Publication #:	US20110241711	Pub Dt:	10/06/2011
Title:	METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THERMAL CONDITIONS

Patent #:	8368413	Issue Dt:	02/05/2013	Application #:	13119916	Filing Dt:	05/26/2011
Publication #:	US20110221461	Pub Dt:	09/15/2011
Title:	METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UNDER DEFINED THERMAL CONDITIONS

Patent #:	8680879	Issue Dt:	03/25/2014	Application #:	13209171	Filing Dt:	08/12/2011
Publication #:	US20110291680	Pub Dt:	12/01/2011
Title:	CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATION SUBSTRATE

Patent #:	8823406	Issue Dt:	09/02/2014	Application #:	13275107	Filing Dt:	10/17/2011
Publication #:	US20120098559	Pub Dt:	04/26/2012
Title:	SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY OF DEVICES UNDER TEST

Patent #:	8970240	Issue Dt:	03/03/2015	Application #:	13287794	Filing Dt:	11/02/2011
Publication #:	US20120112779	Pub Dt:	05/10/2012
Title:	RESILIENT ELECTRICAL INTERPOSERS, SYSTEMS THAT INCLUDE THE INTERPOSERS, AND METHODS FOR USING AND FORMING THE SAME

Patent #:	8922229	Issue Dt:	12/30/2014	Application #:	13380484	Filing Dt:	03/06/2012
Publication #:	US20120146676	Pub Dt:	06/14/2012
Title:	METHOD FOR MEASUREMENT OF A POWER DEVICE

Patent #:	9244099	Issue Dt:	01/26/2016	Application #:	13463712	Filing Dt:	05/03/2012
Publication #:	US20120286817	Pub Dt:	11/15/2012
Title:	PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING THE SAME, AND METHODS OF OPERATING THE SAME

Patent #:	9372214	Issue Dt:	06/21/2016	Application #:	13484548	Filing Dt:	05/31/2012
Publication #:	US20120306587	Pub Dt:	12/06/2012
Title:	HIGH FREQUENCY INTERCONNECT STRUCTURES, ELECTRONIC ASSEMBLIES THAT UTILIZE HIGH FREQUENCY INTERCONNECT STRUCTURES, AND METHODS OF OPERATING THE SAME

Patent #:	9245317	Issue Dt:	01/26/2016	Application #:	13592220	Filing Dt:	08/22/2012
Publication #:	US20130044203	Pub Dt:	02/21/2013
Title:	OPTICALLY ENHANCED DIGITAL IMAGING SYSTEM

Patent #:	9435858	Issue Dt:	09/06/2016	Application #:	13634009	Filing Dt:	09/11/2012
Publication #:	US20130010099	Pub Dt:	01/10/2013
Title:	FOCUSING OPTICAL SYSTEMS AND METHODS FOR TESTING SEMICONDUCTORS

Patent #:	9110131	Issue Dt:	08/18/2015	Application #:	13640432	Filing Dt:	10/10/2012
Publication #:	US20130027070	Pub Dt:	01/31/2013
Title:	METHOD AND DEVICE FOR CONTACTING A ROW OF CONTACT AREAS WITH PROBE TIPS

Patent #:	9506973	Issue Dt:	11/29/2016	Application #:	13702054	Filing Dt:	12/04/2012
Publication #:	US20130075982	Pub Dt:	03/28/2013
Title:	HIGH VOLTAGE CHUCK FOR A PROBE STATION

Patent #:	9194885	Issue Dt:	11/24/2015	Application #:	13820098	Filing Dt:	09/23/2013
Publication #:	US20140145743	Pub Dt:	05/29/2014
Title:	MODULAR PROBER AND METHOD FOR OPERATING SAME

Patent #:	9429638	Issue Dt:	08/30/2016	Application #:	13854725	Filing Dt:	04/01/2013
Publication #:	US20130220513	Pub Dt:	08/29/2013
Title:	METHOD OF REPLACING AN EXISTING CONTACT OF A WAFER PROBING ASSEMBLY

Patent #:	9395411	Issue Dt:	07/19/2016	Application #:	13953545	Filing Dt:	07/29/2013
Publication #:	US20140028337	Pub Dt:	01/30/2014
Title:	METHOD FOR TESTING A TEST SUBSTRATE UNDER DEFINED THERMAL CONDITIONS AND THERMALLY CONDITIONABLE PROBER

Patent #:	9470753	Issue Dt:	10/18/2016	Application #:	14071388	Filing Dt:	11/04/2013
Publication #:	US20140125363	Pub Dt:	05/08/2014
Title:	SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES THAT INCLUDE LOW POWER OUTPUT DRIVERS

Patent #:	9377423	Issue Dt:	06/28/2016	Application #:	14141781	Filing Dt:	12/27/2013
Publication #:	US20140185649	Pub Dt:	07/03/2014
Title:	SYSTEMS AND METHODS FOR HANDLING SUBSTRATES AT BELOW DEW POINT TEMPERATURES

Patent #:	9373533	Issue Dt:	06/21/2016	Application #:	14141812	Filing Dt:	12/27/2013
Publication #:	US20140186145	Pub Dt:	07/03/2014
Title:	SYSTEMS AND METHODS FOR PROVIDING WAFER ACCESS IN A WAFER PROCESSING SYSTEM

Patent #:	9632108	Issue Dt:	04/25/2017	Application #:	14243640	Filing Dt:	04/02/2014
Publication #:	US20140239991	Pub Dt:	08/28/2014
Title:	METHOD FOR VERIFYING A TEST SUBSTRATE IN A PROBER UNDER DEFINED THERMAL CONDITIONS

Patent #:	9983232	Issue Dt:	05/29/2018	Application #:	14491606	Filing Dt:	09/19/2014
Publication #:	US20150008948	Pub Dt:	01/08/2015
Title:	PROBER FOR TESTING DEVICES IN A REPEAT STRUCTURE ON A SUBSTRATE

Patent #:	10281518	Issue Dt:	05/07/2019	Application #:	14625385	Filing Dt:	02/18/2015
Publication #:	US20150241472	Pub Dt:	08/27/2015
Title:	SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES

Patent #:	9991152	Issue Dt:	06/05/2018	Application #:	14631131	Filing Dt:	02/25/2015
Publication #:	US20150255322	Pub Dt:	09/10/2015
Title:	WAFER-HANDLING END EFFECTORS WITH WAFER-CONTACTING SURFACES AND SEALING STRUCTURES

Patent #:	9989558	Issue Dt:	06/05/2018	Application #:	14972705	Filing Dt:	12/17/2015
Publication #:	US20160103153	Pub Dt:	04/14/2016
Title:	PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING THE SAME, AND METHODS OF OPERATING THE SAME

Patent #:	10060950	Issue Dt:	08/28/2018	Application #:	14997345	Filing Dt:	01/15/2016
Publication #:	US20170205446	Pub Dt:	07/20/2017
Title:	SHIELDED PROBE SYSTEMS

Patent #:	9804196	Issue Dt:	10/31/2017	Application #:	14997371	Filing Dt:	01/15/2016
Publication #:	US20170205443	Pub Dt:	07/20/2017
Title:	PROBES WITH FIDUCIAL MARKS, PROBE SYSTEMS INCLUDING THE SAME, AND ASSOCIATED METHODS

Patent #:	9741599	Issue Dt:	08/22/2017	Application #:	15072170	Filing Dt:	03/16/2016
Publication #:	US20160195579	Pub Dt:	07/07/2016
Title:	HIGH VOLTAGE CHUCK FOR A PROBE STATION

Patent #:	10180486	Issue Dt:	01/15/2019	Application #:	15072204	Filing Dt:	03/16/2016
Publication #:	US20170269183	Pub Dt:	09/21/2017
Title:	TEST STANDARDS AND METHODS FOR IMPEDANCE CALIBRATION OF A PROBE SYSTEM, AND PROBE SYSTEMS THAT INCLUDE THE TEST STANDARDS OR UTILIZE THE METHODS

Patent #:	9784763	Issue Dt:	10/10/2017	Application #:	15094716	Filing Dt:	04/08/2016
Publication #:	US20170292974	Pub Dt:	10/12/2017
Title:	SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS

Patent #:	10161994	Issue Dt:	12/25/2018	Application #:	15181909	Filing Dt:	06/14/2016
Publication #:	US20170356957	Pub Dt:	12/14/2017
Title:	SYSTEMS AND METHODS FOR ELECTRICALLY TESTING ELECTROMIGRATION IN AN ELECTROMIGRATION TEST STRUCTURE

Patent #:	10120020	Issue Dt:	11/06/2018	Application #:	15184374	Filing Dt:	06/16/2016
Publication #:	US20170363681	Pub Dt:	12/21/2017
Title:	PROBE HEAD ASSEMBLIES AND PROBE SYSTEMS FOR TESTING INTEGRATED CIRCUIT DEVICES

Patent #:	10267848	Issue Dt:	04/23/2019	Application #:	15222113	Filing Dt:	07/28/2016
Publication #:	US20160334465	Pub Dt:	11/17/2016
Title:	METHOD OF ELECTRICALLY CONTACTING A BOND PAD OF A DEVICE UNDER TEST WITH A PROBE

Patent #:	10365323	Issue Dt:	07/30/2019	Application #:	15339419	Filing Dt:	10/31/2016
Publication #:	US20170146594	Pub Dt:	05/25/2017
Title:	PROBE SYSTEMS AND METHODS FOR AUTOMATICALLY MAINTAINING ALIGNMENT BETWEEN A PROBE AND A DEVICE UNDER TEST DURING A TEMPERATURE CHANGE

Patent #:	10060963	Issue Dt:	08/28/2018	Application #:	15471199	Filing Dt:	03/28/2017
Publication #:	US20170285083	Pub Dt:	10/05/2017
Title:	PROBE SYSTEMS, STORAGE MEDIA, AND METHODS FOR WAFER-LEVEL TESTING OVER EXTENDED TEMPERATURE RANGES

Patent #:	10062597	Issue Dt:	08/28/2018	Application #:	15670364	Filing Dt:	08/07/2017
Publication #:	US20170338142	Pub Dt:	11/23/2017
Title:	HIGH VOLTAGE CHUCK FOR A PROBE STATION

Patent #:	10459006	Issue Dt:	10/29/2019	Application #:	15708681	Filing Dt:	09/19/2017
Publication #:	US20180088149	Pub Dt:	03/29/2018
Title:	PROBE SYSTEMS AND METHODS

Patent #:	10281492	Issue Dt:	05/07/2019	Application #:	15725650	Filing Dt:	10/05/2017
Publication #:	US20180031608	Pub Dt:	02/01/2018
Title:	SHIELDED PROBE SYSTEMS WITH CONTROLLED TESTING ENVIRONMENTS

Patent #:	10571487	Issue Dt:	02/25/2020	Application #:	15821101	Filing Dt:	11/22/2017
Publication #:	US20180149674	Pub Dt:	05/31/2018
Title:	CONTACT ENGINES, PROBE HEAD ASSEMBLIES, PROBE SYSTEMS, AND ASSOCIATED METHODS FOR ON-WAFER TESTING OF THE WIRELESS OPERATION OF A DEVICE UNDER TEST

Patent #:	10330703	Issue Dt:	06/25/2019	Application #:	15934672	Filing Dt:	03/23/2018
Publication #:	US20180284155	Pub Dt:	10/04/2018
Title:	PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION

Patent #:	10698002	Issue Dt:	06/30/2020	Application #:	16143856	Filing Dt:	09/27/2018
Publication #:	US20190101567	Pub Dt:	04/04/2019
Title:	PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST

Patent #:	10877070	Issue Dt:	12/29/2020	Application #:	16249044	Filing Dt:	01/16/2019
Publication #:	US20190227102	Pub Dt:	07/25/2019
Title:	PROBES WITH FIDUCIAL TARGETS, PROBE SYSTEMS INCLUDING THE SAME, AND ASSOCIATED METHODS

Patent #:	10698025	Issue Dt:	06/30/2020	Application #:	16445719	Filing Dt:	06/19/2019
Publication #:	US20200025823	Pub Dt:	01/23/2020
Title:	PROBE SYSTEMS AND METHODS THAT UTILIZE A FLOW-REGULATING STRUCTURE FOR IMPROVED COLLECTION OF AN OPTICAL IMAGE OF A DEVICE UNDER TEST

Patent #:	10809048	Issue Dt:	10/20/2020	Application #:	16730584	Filing Dt:	12/30/2019
Publication #:	US20200217638	Pub Dt:	07/09/2020
Title:	PROBE SYSTEMS AND METHODS FOR CALIBRATING CAPACITIVE HEIGHT SENSING MEASUREMENTS

Assignor

FORMFACTOR BEAVERTON, INC.

Exec Dt:

08/26/2021

Assignee

FORMFACTOR, INC.

7005 SOUTHFRONT ROAD

LIVERMORE, CALIFORNIA 94551

Correspondence name and address
	RON JACOBS
	438 CAMBRIDGE AVE.
	SUITE 225
	PALO ALTO, CA 94306

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